Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
265 words
A METHOD FOR THE CONTINUOUS PREPARATION OF THE EPITAXIAL LAYERS OF A III-V TERNARY COMPOUND SEMICONDUCTOR REPRESENTED BY GENERAL FORMULA AB1-XCX ON A III-V BINARY COMPOUND SEMICONDUCTOR FROM A GAS MIXRUE, WHEREIN ABI-XCX STANDS FOR BOTH AIIIBV1-X AND BIII1-XCIIIXAV,AIII AND AV BEING III-B ELEMENT AND A V-B ELEMENT, RESPECTIVELY, AND BIII AND CIIIAND BV AND CV BEING TWO DIFFERENT III-B ELEMENTS AND V-B ELEMENTS, RESPECTIVELY, AND THE VALUE OF X BEING BETWEEN 0 AND 1, WHEREIN SAID III-V TERNARY COMPOUND SEMICONDUCTOR WITH A GRADED COMPOSITION IS GROWN WITHOUT CHANGING TIMEWISE THE COMPOSITION OF SAID GAS MIXTURE ENTERING INTO THE REACTION FURNACE, WHICH IS GIVEN A TEMPERATURE GRADIENT DECREASING WITH DISTANCE IN THE DIRECTION OF THE GAS FLOW, AND BY GRADUALLY CHANGING THE TEMPERATURE OF SAID III-V BINARY COMPOUND SEMICONDUCTOR, AND WHICH IS CHARACTERIZED BY CONTINUOUSLY CHANGING THE VALUE OF X TO RESULT IN THE GRADED COMPOSITION BY CONTINUOUSLY MOVING THE PLURALITY OF SAID III-V BINARY COMPOUND SEMICONDUCTOR SUBSTRATES, UPSTREAM OF SAID GAS FLOW IN THE SITUATION WHEN THE SUBSTRATE HAS A LOWER MELTING POINT, AND DOWNSTREAM OF SAID GAS FLOW IN HE SITUATION WHEN THE SUBSTRATE HAS A HIGHER MELTING POINT THAN SAID TERNARY COMPOUND SEMICONDUCTOR, RESPECTIVELY, THUS EFFECTIVELY ROWING SAID EPITAXIAL LAYERS ON SAID SUBSTRATES THEREBY GRADUALLY DECREASING THE CONSITUENT C AND NCREASING THE CONSITUENT B IN THE GAS MIXTURE IN THE REACTION FURNACE DOWNSTREAM OF SAID GAS FLOW IN THE SITUATION WHEN THE COMPOUND AB HAS A LOWER MELTING POINT THAN THE COMPOUND AC AND VICE VERSA IN THE SITUATION WHEN THE COMPOUND AB HAS A HIGHER MELTING POINT THAM THE COMPOUND AC.
Claim 2
Independent Claim
265 words
A METHOD FOR THE CONTINUOUS PREPARATION OF THE EPITAXIAL LAYERS OF A III-V TERNARY COMPOUND SEMICONDUCTOR REPRESENTED BY GENERAL FORMULA AB1-XCX ON A III-V BINARY COMPOUND SEMICONDUCTOR FROM A GAS MIXRUE, WHEREIN ABI-XCX STANDS FOR BOTH AIIIBV1-X AND BIII1-XCIIIXAV,AIII AND AV BEING III-B ELEMENT AND A V-B ELEMENT, RESPECTIVELY, AND BIII AND CIIIAND BV AND CV BEING TWO DIFFERENT III-B ELEMENTS AND V-B ELEMENTS, RESPECTIVELY, AND THE VALUE OF X BEING BETWEEN 0 AND 1, WHEREIN SAID III-V TERNARY COMPOUND SEMICONDUCTOR WITH A GRADED COMPOSITION IS GROWN WITHOUT CHANGING TIMEWISE THE COMPOSITION OF SAID GAS MIXTURE ENTERING INTO THE REACTION FURNACE, WHICH IS GIVEN A TEMPERATURE GRADIENT DECREASING WITH DISTANCE IN THE DIRECTION OF THE GAS FLOW, AND BY GRADUALLY CHANGING THE TEMPERATURE OF SAID III-V BINARY COMPOUND SEMICONDUCTOR, AND WHICH IS CHARACTERIZED BY CONTINUOUSLY CHANGING THE VALUE OF X TO RESULT IN THE GRADED COMPOSITION BY CONTINUOUSLY MOVING THE PLURALITY OF SAID III-V BINARY COMPOUND SEMICONDUCTOR SUBSTRATES, UPSTREAM OF SAID GAS FLOW IN THE SITUATION WHEN THE SUBSTRATE HAS A LOWER MELTING POINT, AND DOWNSTREAM OF SAID GAS FLOW IN HE SITUATION WHEN THE SUBSTRATE HAS A HIGHER MELTING POINT THAN SAID TERNARY COMPOUND SEMICONDUCTOR, RESPECTIVELY, THUS EFFECTIVELY ROWING SAID EPITAXIAL LAYERS ON SAID SUBSTRATES THEREBY GRADUALLY DECREASING THE CONSITUENT C AND NCREASING THE CONSITUENT B IN THE GAS MIXTURE IN THE REACTION FURNACE DOWNSTREAM OF SAID GAS FLOW IN THE SITUATION WHEN THE COMPOUND AB HAS A LOWER MELTING POINT THAN THE COMPOUND AC AND VICE VERSA IN THE SITUATION WHEN THE COMPOUND AB HAS A HIGHER MELTING POINT THAM THE COMPOUND AC.
Claim 3
Dependent Claim
26 words
A method as claimed in claim 1 wherein said III-V ternary compound semiconductor is GaAs1-xPx and GaP is utilized for said III-V binary compound semiconductor substrate.
Claim 4
Dependent Claim
43 words
A method as claimed in claim 2 which is characterized in that said gas mixture is produced from the reaction products of a hydrogen gas saturated with AsC13 with GaAs and the reaction products of a hydrogen gas saturated with PC13 with GaP.
Claim 5
Dependent Claim
38 words
A method as claimed in claim 1 which is characterized in that dummy wafers are placed in the reaction furnace before the movement of said substrates is started, thereby effectively depositing said ternary compound semiconductor on said wafers.