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US3798080A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of producing a semiconductor component

Assignee: Siemens AG
•
Filing: 1971-04-22
•
Granted: 1974-03-19
•
Expires: 1991-04-22
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Abstract

Abstract In producing a semiconductor component, the use of a silicon nitride layer as an etching stencil, provides an exact positioning of various windows, relative one another, in a silicon dioxide layer, arranged on a semiconductor body. The method is particularly suitable for producing high-frequency transistors of comb structure in planar technology.

Inventors

  • 👤 W Henning
  • 👤 H Weidlich
  • 👤 Hoerschelmann K Von
  • 👤 I Kruger

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 11:36
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10D; H10D99/00; H10P; H10P95/00; H10W74/00; H10W74/40; Y; Y10; Y10S; Y10S148/00; Y10S148/113; Y10S148/114

Claims Analysis

Total Claims: 1
Claim 1
Independent Claim 26 words
The method of claim 1 wherein the silicon nitride layer is about 0.1 Mu thick and the silicon dioxide layer is at least 0.2 Mu thick.

References Cited (Backward Citations)

US3477886A Cited
US3597667A Cited
US3475234A Cited
US3615940A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1977-03-18 1977-09-17 1978-03-19 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1981-03-18 1981-09-17 1982-03-19 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1985-03-18 1985-09-17 1986-03-19 $7700.00 Window Closed / Lapsed

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