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US3750153A Expired / Lapsed US ⏱️ 0.0 years remaining

Single layer superconducting memory device

Assignee: AT&T Inc
•
Filing: 1972-02-03
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Granted: 1973-07-31
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Expires: 1992-02-03
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Abstract

Abstract The disclosed memory device is composed of an array of bistable units. The operational portion of each bistable unit is a strip of superconductor material which can, when suitably d-c biased, be switched between a stable superconducting state and a stable resistive state by the passage of current pulses. A current pulse in the same sense as the bias current switches the unit to a stable resistive state. A pulse of opposite polarity produces the superconducting state. Arrays can be constructed to perform memory and logic functions.

Inventors

  • 👤 L Testardi

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 15:11
CPC Classifications
H; H03; H03K; H03K3/00; H03K3/02; H03K3/38; G; G06; G06F; G06F7/00; G06F7/38; G06F7/381; G11; G11C; G11C11/00; G11C11/21; G11C11/44; G11C19/00; G11C19/32; Y; Y10; Y10S; Y10S505/00; Y10S505/825; Y10S505/831; Y10S505/833; Y10S505/834

Claims Analysis

Total Claims: 13
Claim 1
Independent Claim 96 words
A device comprising an array of bistable units electrically connected to electrical means CHARACTERIZED IN THAT a. each bistable unit consists essentially of a strip of a sputtered layer of superconductor material between 75 angstroms and 1,000 angstroms in thickness and b. the electrical means comprises 1. current bias means for passing a unidirectional bias current through each of the bistable units, 2. current pulse means for passing current pulses of either polarity through each of the bistable units, and 3. sensing means for sensing the resistive state of at least one of the bistable units.
Claim 2
Independent Claim 96 words
A device comprising an array of bistable units electrically connected to electrical means CHARACTERIZED IN THAT a. each bistable unit consists essentially of a strip of a sputtered layer of superconductor material between 75 angstroms and 1,000 angstroms in thickness and b. the electrical means comprises 1. current bias means for passing a unidirectional bias current through each of the bistable units, 2. current pulse means for passing current pulses of either polarity through each of the bistable units, and 3. sensing means for sensing the resistive state of at least one of the bistable units.
Claim 3
Dependent Claim 17 words
current pulse means for passing current pulses of either polarity through each of the bistable units, and
Claim 4
Dependent Claim 17 words
current pulse means for passing current pulses of either polarity through each of the bistable units, and
Claim 5
Dependent Claim 45 words
A device of claim 1 in which the array includes at least one group of series connected bistable units with the sensing means associated with each group including means for sensing the sum of the voltage outputs of the bistable units contained in that group.
Claim 6
Dependent Claim 15 words
sensing means for sensing the resistive state of at least one of the bistable units.
Claim 7
Dependent Claim 15 words
sensing means for sensing the resistive state of at least one of the bistable units.
Claim 8
Dependent Claim 29 words
A device of claim 1 in which the superconductor material contains at least 50 atom percent of one element selected from the group consisting of niobium, tantalum and vanadium.
Claim 9
Dependent Claim 12 words
A device of claim 3 in which the superconductor material is niobium.
Claim 10
Dependent Claim 29 words
A device of claim 3 in which the sensing means includes means for sensing the derivative of the voltage signal appearing across at least one of the bistable units.
Claim 11
Dependent Claim 18 words
A device of claim 3 in which the sputtered layer is between 100 and 200 angstroms in thickness.
Claim 12
Dependent Claim 22 words
A device of claim 6 in which the substrate is held at a temperature between 500* C and 1,300* C during sputtering
Claim 13
Dependent Claim 25 words
A device of claim 7 in which the bias current is no greater than 30 milliamperes per square micrometer of cross-sectional area of the strip.

References Cited (Backward Citations)

US2866842A Cited
US2962216A Cited
US3242471A Cited
US3021439A Cited
US3226534A Cited
US3308282A Cited
US3253159A Cited
US3466470A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1976-07-30 1977-01-29 1977-07-31 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1980-07-30 1981-01-29 1981-07-31 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1984-07-30 1985-01-29 1985-07-31 $7700.00 Window Closed / Lapsed

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