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Method for fabricating a display device and the device fabricated thereby

Assignee: Hitachi Ltd
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Filing: 1971-02-02
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Granted: 1973-07-03
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Expires: 1991-02-02
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Abstract

Abstract A method for fabricating a display device comprising the steps of forming a plurality of light-emitting diodes in a semiconductor wafer with a lattice pattern, and then dividing a unit of the seven light-emitting diodes which constitutes an 8shaped pattern from the semiconductor wafer.

Inventors

  • 👤 S Nishida

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 17:18
CPC Classifications
H; H10; H10H; H10H29/00; H10H29/10; H10H29/14; H10H29/142; Y; Y10; Y10S; Y10S148/00; Y10S148/049; Y10S148/072; Y10S252/00; Y10S252/95

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 131 words
A method for manufacturing a semiconductor device wherein seven semiconductor elements, each element emitting a light when an electric voltage is applied thereto, are formed in an arrangement of substantially 8-shape in a semiconductor substrate, comprising the steps of forming a plurality of said semiconductor elements in a semiconductor wafer in such order that a first set of seven semiconductor elements constitutes a first 8-shaped pattern and at least one second set of seven semiconductor elements having at least one semiconductor element of said first set of seven semiconductor elements in common, constitutes a second 8-shaped pattern, testing each of said semicoNductor elements to determine which are properly operable, and then dividing a set of seven semiconductor elements comprising properly operable elements which constitute an 8shaped pattern from said semiconductor wafer.
Claim 2
Independent Claim 131 words
A method for manufacturing a semiconductor device wherein seven semiconductor elements, each element emitting a light when an electric voltage is applied thereto, are formed in an arrangement of substantially 8-shape in a semiconductor substrate, comprising the steps of forming a plurality of said semiconductor elements in a semiconductor wafer in such order that a first set of seven semiconductor elements constitutes a first 8-shaped pattern and at least one second set of seven semiconductor elements having at least one semiconductor element of said first set of seven semiconductor elements in common, constitutes a second 8-shaped pattern, testing each of said semicoNductor elements to determine which are properly operable, and then dividing a set of seven semiconductor elements comprising properly operable elements which constitute an 8shaped pattern from said semiconductor wafer.

References Cited (Backward Citations)

US3308452A Cited
US3354342A Cited
US3418509A Cited
US3490873A Cited
US3414441A Cited
US3508111A Cited
US3618202A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1976-07-02 1977-01-01 1977-07-03 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1980-07-02 1981-01-01 1981-07-03 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1984-07-02 1985-01-01 1985-07-03 $7700.00 Window Closed / Lapsed

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