US3490873A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and composition for inspecting semiconductor devices
Assignee: RTX Corp
•
Filing: 1965-08-10
•
Granted: 1970-01-20
•
Expires: 1985-08-10
Abstract
No abstract record available.
Inventors
- 👤 Edwin A Corl
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 20:15
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/84; G01N21/88; G01N21/91
Claims Analysis
Total Claims: 0
No claims parsed yet. Click Sync Now above to re-index claims from Google Patents.
References Cited (Backward Citations)
US2920203A
Cited
US3164494A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1973-01-19 | 1973-07-21 | 1974-01-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1977-01-19 | 1977-07-21 | 1978-01-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1981-01-19 | 1981-07-21 | 1982-01-20 | $7700.00 | Window Closed / Lapsed |