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US3629016A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of making an insulated gate field effect device

Assignee: United States Department of the Army
•
Filing: 1970-03-05
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Granted: 1971-12-21
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Expires: 1990-03-05
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Abstract

Abstract An insulated gate field effect device is made by a vapor etch and epitaxial refill technique. The vapor etch into a first-type conductivity silicon substrate results in an undercutting between windows such that a cavity is developed completely beneath the insulator separating the window regions. The cavity is then refilled epitaxially with silicon of a second conductivity type; a shallow layer of heavily doped silicon of said first-type conductivity epitaxially regrown in the window area; the gate insulator oxide thinned by etching; and gate, source, and drain contacts made.

Inventors

  • 👤 William B Glendinning
  • 👤 Albert Mark

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 14:47
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/24; H10P50/242; H10D; H10D99/00

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 63 words
Method according to claim 1 wherein: in step (A) the thermal oxide layer is about 8,000 angstroms in thickness, in step (C) the temperature is about 1,190* C. and the time is about 3 minutes, in step (D) the temperature is about 1,190 * C. and the time is about 1 1/2 minutes, and in step (E) the temperature is about 1,190* C.
Claim 2
Dependent Claim 19 words
Method according to claim 1 wherein said first-type conductivity silicon is N-type and said second-type conductivity silicon is P-type.
Claim 3
Dependent Claim 19 words
Method according to claim 2 wherein said first-type conductivity silicon is N-type and said second-type conductivity silicon is P-type
Claim 4
Dependent Claim 19 words
Method according to claim 1 wherein said first-type conductivity silicon is P-type and said second-type conductivity silicon is N-type.
Claim 5
Dependent Claim 19 words
Method according to claim 2 wherein said first-type conductivity silicon is P-type and said second-type conductivity silicon is N-type.
Claim 6
Dependent Claim 21 words
Method according to claim 1 wherein said windows are 100 microns by 100 microns and are spaced apart by 8 microns.
Claim 7
Dependent Claim 21 words
Method according to claim 2 wherein said windows are 100 microns by 100 mIcrons and are spaced apart by 8 microns.

References Cited (Backward Citations)

US3370995A Cited
US3514845A Cited
US3566220A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1974-12-20 1975-06-21 1975-12-21 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1978-12-20 1979-06-21 1979-12-21 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1982-12-20 1983-06-21 1983-12-21 $7700.00 Window Closed / Lapsed

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