US3629016A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of making an insulated gate field effect device
Assignee: United States Department of the Army
•
Filing: 1970-03-05
•
Granted: 1971-12-21
•
Expires: 1990-03-05
Abstract
Abstract An insulated gate field effect device is made by a vapor etch and epitaxial refill technique. The vapor etch into a first-type conductivity silicon substrate results in an undercutting between windows such that a cavity is developed completely beneath the insulator separating the window regions. The cavity is then refilled epitaxially with silicon of a second conductivity type; a shallow layer of heavily doped silicon of said first-type conductivity epitaxially regrown in the window area; the gate insulator oxide thinned by etching; and gate, source, and drain contacts made.
Inventors
- 👤 William B Glendinning
- 👤 Albert Mark
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 14:47
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/24; H10P50/242; H10D; H10D99/00
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
63 words
Method according to claim 1 wherein: in step (A) the thermal oxide layer is about 8,000 angstroms in thickness, in step (C) the temperature is about 1,190* C. and the time is about 3 minutes, in step (D) the temperature is about 1,190 * C. and the time is about 1 1/2 minutes, and in step (E) the temperature is about 1,190* C.
Claim 2
Dependent Claim
19 words
Method according to claim 1 wherein said first-type conductivity silicon is N-type and said second-type conductivity silicon is P-type.
Claim 3
Dependent Claim
19 words
Method according to claim 2 wherein said first-type conductivity silicon is N-type and said second-type conductivity silicon is P-type
Claim 4
Dependent Claim
19 words
Method according to claim 1 wherein said first-type conductivity silicon is P-type and said second-type conductivity silicon is N-type.
Claim 5
Dependent Claim
19 words
Method according to claim 2 wherein said first-type conductivity silicon is P-type and said second-type conductivity silicon is N-type.
Claim 6
Dependent Claim
21 words
Method according to claim 1 wherein said windows are 100 microns by 100 microns and are spaced apart by 8 microns.
Claim 7
Dependent Claim
21 words
Method according to claim 2 wherein said windows are 100 microns by 100 mIcrons and are spaced apart by 8 microns.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1974-12-20 | 1975-06-21 | 1975-12-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1978-12-20 | 1979-06-21 | 1979-12-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1982-12-20 | 1983-06-21 | 1983-12-21 | $7700.00 | Window Closed / Lapsed |