US3604108A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for handling, testing and bonding of beam-leaded devices
Assignee: AT&T Inc
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Filing: 1969-10-07
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Granted: 1971-09-14
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Expires: 1989-10-07
Abstract
Abstract Beam-leaded devices are handled at and after a test stage by a precision movement system requiring only a single pickup of each device from its position as received. A pickup tool is brought in contact with the beam leads of successive devices and pulseheated to melt the carrier wax and effect a tack bond of the head and leads. Without disturbing the device alignment, the head transfers the device to a prepositioned test station where full dynamic testing occurs. Thereafter, the head moves the device to a carrier, a substrate for bonding or a discard bin.
Inventors
- 👤 Paul Mallery
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 22:53
CPC Classifications
H; H10; H10W; H10W99/00; G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2886; G01R31/2893; H10P; H10P72/00; H10P72/04; H10P72/0446; H10P72/06; H10P72/0611; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49004
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
133 words
Handling method for the test stage in beam-leaded device manufacture in which the devices as received are arrayed in wax on a substrate with said leads oriented in an X-Z sense, comprising the steps of: positioning successive said devices at a first fixed point in an X-Z plane by suitably orienting in an X-Z sense said substrate and then periodically indexing same, acquiring said device at said first point by pulse-heating a pickup head to effect a light tack bond to said leads and also vacuum-holding said device to said head, moving said head in an X-Y plane from said first point to a test station comprising a compliant pad disposed at a second fixed point and having X-Z oriented test leads, and after testing, moving said head to a selected further point.
Claim 2
Dependent Claim
133 words
Handling method for the test stage in beam-leaded device manufacture in which the devices as received are arrayed in wax on a substrate with said leads oriented in an X-Z sense, comprising the steps of: positioning successive said devices at a first fixed point in an X-Z plane by suitably orienting in an X-Z sense said substrate and then periodically indexing same, acquiring said device at said first point by pulse-heating a pickup head to effect a light tack bond to said leads and also vacuum-holding said device to said head, moving said head in an X-Y plane from said first point to a test station comprising a compliant pad disposed at a second fixed point and having X-Z oriented test leads, and after testing, moving said head to a selected further point.
Claim 3
Dependent Claim
33 words
Handling method as per claim 1, wherein said further point is a discard bin, and comprising the further step of applying a gas blast from said head to aid in disengaging said device.
Claim 4
Dependent Claim
48 words
Handling method as per claim 1, wherein said further point is a storage carrier indexable in an X-Z plane, and comprising the further steps of indexing said carrier to coincide a selected region thereof with said further point, and depositing said device onto said region from said head.
Claim 5
Dependent Claim
22 words
Handling method as per claim 1, wherein said further point is a bonding station for affixing said successive devices to circuit substrates.
Claim 6
Dependent Claim
35 words
Handling method as per claim 1, wherein said acquiring step is effected with a pickup head comprising a chambered block with rectilinear pickup edges and having bulk electrical conductivity with said edges being electrically insulative.
Claim 7
Dependent Claim
22 words
Handling method as per claim 5, wherein said head comprises titanium carbide with said edges comprising an exterior film of titanium dioxide.
References Cited (Backward Citations)
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1974-09-13 | 1975-03-15 | 1975-09-14 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1978-09-13 | 1979-03-15 | 1979-09-14 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1982-09-13 | 1983-03-15 | 1983-09-14 | $7700.00 | Window Closed / Lapsed |