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US3256433A Expired / Lapsed US ⏱️ 0.0 years remaining

Energy-selecting electron microscope using electron optics

Assignee: Hitachi Ltd
•
Filing: 1963-03-26
•
Granted: 1966-06-14
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Expires: 1983-03-26
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Abstract

No abstract record available.

Inventors

  • 👤 Watanabe Hiroshi
  • 👤 Uyeda Ryozi

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-31 20:01
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/04; H01J37/05

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 123 words
AN ENERGY-SELECTING ELECTRON MICROSCOPE HAVING ELECTRON BEAM GENERATING MEANS, A SPECIMEN AND AN OBJECTIVE LENS COMPRISING COMPONENTS ARRANGED BETWEEN SAID OBJECTIVE LENS AND THE IMAGING PLANE OF THE MICROSCOPE INCLUDING A FIRST AUXILIARY LENS, A FIRST SELECTING MEANS FOR SELECTING AN ELECTRON RAY FORMING ONE OF THE ELECTRON DIFFRACTION SPOTS OF SAID SPECIMEN UNDER EXAMINATION ON THE BACK FOCAL PLANE OF THE OBJECTIVE LENS, MEANS FOR ENERGY-ANALYZING THE ELECTRON RAY SELECTED BY SAID FIRST SELECTING MEANS INTO MONOENERGETIC ELECTRON RAYS, A SECOND SELECTING MEANS FOR SELECTING ONE OF SAID MONOENERGETIC ELECTRON RAYS FORMED BY SAID ANALYZING MEANS, AND AN AUXILIARY LENS MEANS FOR MAGNIFYING SAID MONOENERGETIC ELECTRON RAY SELECTED BY SAID SECOND SELECTING MEANS TO FORM A FINAL IMAGE ON THE IMAGING PLANE.
Claim 2
Dependent Claim 123 words
AN ENERGY-SELECTING ELECTRON MICROSCOPE HAVING ELECTRON BEAM GENERATING MEANS, A SPECIMEN AND AN OBJECTIVE LENS COMPRISING COMPONENTS ARRANGED BETWEEN SAID OBJECTIVE LENS AND THE IMAGING PLANE OF THE MICROSCOPE INCLUDING A FIRST AUXILIARY LENS, A FIRST SELECTING MEANS FOR SELECTING AN ELECTRON RAY FORMING ONE OF THE ELECTRON DIFFRACTION SPOTS OF SAID SPECIMEN UNDER EXAMINATION ON THE BACK FOCAL PLANE OF THE OBJECTIVE LENS, MEANS FOR ENERGY-ANALYZING THE ELECTRON RAY SELECTED BY SAID FIRST SELECTING MEANS INTO MONOENERGETIC ELECTRON RAYS, A SECOND SELECTING MEANS FOR SELECTING ONE OF SAID MONOENERGETIC ELECTRON RAYS FORMED BY SAID ANALYZING MEANS, AND AN AUXILIARY LENS MEANS FOR MAGNIFYING SAID MONOENERGETIC ELECTRON RAY SELECTED BY SAID SECOND SELECTING MEANS TO FORM A FINAL IMAGE ON THE IMAGING PLANE.

References Cited (Backward Citations)

DE760135C Cited
US2396624A Cited
US2392243A Cited
US2429558A Cited
US2494442A Cited
US2894160A Cited
US3134899A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1969-06-13 1969-12-13 1970-06-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1973-06-13 1973-12-13 1974-06-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1977-06-13 1977-12-13 1978-06-14 $7700.00 Window Closed / Lapsed

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