DE760135C
Expired / Lapsed
DE
⏱️ 0.0 years remaining
Electron microscope with two-stage imaging, in particular an electron microscope with high resolution (over microscope), and with an overview image of low magnification (intermediate image)
Assignee: AEG AG
•
Filing: 1939-03-30
•
Granted: 1953-11-16
•
Expires: 1959-03-30
Abstract
No abstract record available.
Inventors
- 👤 Hans Dr Phil Boersch
- 👤 Hans Dr-Ing Mahl
Bibliographic Details
Application Number
—
Jurisdiction
DE
Data Source
google_patents
Last Synchronized
2026-11-01 13:15
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/04
Claims Analysis
Total Claims: 0
No claims parsed yet. Click Sync Now above to re-index claims from Google Patents.
References Cited (Backward Citations)
DE679857C
Cited
USPTO Annuity & Maintenance Windows
Maintenance schedule is calculated for granted US utility patents.