Intensity measuring and/or recording devices for corpuscular radiation apparatus, particularly electron microscopes

Claim 1

AN ELECTRON MICROSCOPE HAVING A SOURCE OF ELECTRONS, AN ELECTRON-OPTICAL LENS SYSTEM CONSISTING OF AN OBJECTIVE LENS AND AT LEAST A PROJECTION LENS, A PROJECTION SCREEN AND MEANS FOR DIRECTING A BEAM OF ELECTRONS FROM SAID SOURCE TO AN OBJECT AND THROUGH SAID LENS SYSTEM, SAID BEAM PRODUCING A MAGNIFIED IMAGE OF SAID OBJECT ON SAID PROJECTION SCREEN, A FIRST DEFLECTING ELECTRODE BEING DISPOSED IN THE DIRECTION OF SAID BEAM BEHIND SAID OBJECTIVE LENS AND ELECTRICALLY CONNECTED TO SAID PROJECTION SCREEN TO DEFLECT SAID BEAM CORRESPONDING TO THE CHARGE OF SAID PROJECTION SCREEN, A SECOND DEFLECTING ELECTRODE BEING CONNECTED TO AN ADJUSTABLE COMPENSATING CIRCUIT AND WORKING AGAINST THE DEFLECTION OF SAID BEAM BY SAID FIRST DEFLECTING ELECTRODE, THE ADJUSTMENT OF SAID COMPENSATING CIRCUIT BY WHICH THE DEFLECTION OF SAID BEAM BY SAID FIRST DEFLECTING ELECTRODE IS CANCELLED BEING A MEASURE OF THE IMAGE BRIGHTNESS ON SAID PROJECTION SCREEN.