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US3134899A Expired / Lapsed US ⏱️ 0.0 years remaining

Intensity measuring and/or recording devices for corpuscular radiation apparatus, particularly electron microscopes

Assignee: Jenoptik AG
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Filing: 1961-11-13
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Granted: 1964-05-26
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Expires: 1981-11-13
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Abstract

No abstract record available.

Inventors

  • 👤 Guyenot Ernst
  • 👤 Hahn Eberhard

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 07:27
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/22; H01J37/224; G; G01; G01T; G01T1/00; G01T1/29

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 148 words
AN ELECTRON MICROSCOPE HAVING A SOURCE OF ELECTRONS, AN ELECTRON-OPTICAL LENS SYSTEM CONSISTING OF AN OBJECTIVE LENS AND AT LEAST A PROJECTION LENS, A PROJECTION SCREEN AND MEANS FOR DIRECTING A BEAM OF ELECTRONS FROM SAID SOURCE TO AN OBJECT AND THROUGH SAID LENS SYSTEM, SAID BEAM PRODUCING A MAGNIFIED IMAGE OF SAID OBJECT ON SAID PROJECTION SCREEN, A FIRST DEFLECTING ELECTRODE BEING DISPOSED IN THE DIRECTION OF SAID BEAM BEHIND SAID OBJECTIVE LENS AND ELECTRICALLY CONNECTED TO SAID PROJECTION SCREEN TO DEFLECT SAID BEAM CORRESPONDING TO THE CHARGE OF SAID PROJECTION SCREEN, A SECOND DEFLECTING ELECTRODE BEING CONNECTED TO AN ADJUSTABLE COMPENSATING CIRCUIT AND WORKING AGAINST THE DEFLECTION OF SAID BEAM BY SAID FIRST DEFLECTING ELECTRODE, THE ADJUSTMENT OF SAID COMPENSATING CIRCUIT BY WHICH THE DEFLECTION OF SAID BEAM BY SAID FIRST DEFLECTING ELECTRODE IS CANCELLED BEING A MEASURE OF THE IMAGE BRIGHTNESS ON SAID PROJECTION SCREEN.
Claim 2
Dependent Claim 148 words
AN ELECTRON MICROSCOPE HAVING A SOURCE OF ELECTRONS, AN ELECTRON-OPTICAL LENS SYSTEM CONSISTING OF AN OBJECTIVE LENS AND AT LEAST A PROJECTION LENS, A PROJECTION SCREEN AND MEANS FOR DIRECTING A BEAM OF ELECTRONS FROM SAID SOURCE TO AN OBJECT AND THROUGH SAID LENS SYSTEM, SAID BEAM PRODUCING A MAGNIFIED IMAGE OF SAID OBJECT ON SAID PROJECTION SCREEN, A FIRST DEFLECTING ELECTRODE BEING DISPOSED IN THE DIRECTION OF SAID BEAM BEHIND SAID OBJECTIVE LENS AND ELECTRICALLY CONNECTED TO SAID PROJECTION SCREEN TO DEFLECT SAID BEAM CORRESPONDING TO THE CHARGE OF SAID PROJECTION SCREEN, A SECOND DEFLECTING ELECTRODE BEING CONNECTED TO AN ADJUSTABLE COMPENSATING CIRCUIT AND WORKING AGAINST THE DEFLECTION OF SAID BEAM BY SAID FIRST DEFLECTING ELECTRODE, THE ADJUSTMENT OF SAID COMPENSATING CIRCUIT BY WHICH THE DEFLECTION OF SAID BEAM BY SAID FIRST DEFLECTING ELECTRODE IS CANCELLED BEING A MEASURE OF THE IMAGE BRIGHTNESS ON SAID PROJECTION SCREEN.

References Cited (Backward Citations)

US2879394A Cited
US2991361A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1967-05-26 1967-11-25 1968-05-26 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1971-05-26 1971-11-25 1972-05-26 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1975-05-26 1975-11-25 1976-05-26 $7700.00 Window Closed / Lapsed

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