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EP0702239A3
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EP0702239A3 - - Google Patents
Assignee: STMicroelectronics Ltd
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Filing: 1995-08-22
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Granted: —
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Expires: 2015-08-22
Abstract
Abstract A test access port controller is provided for implementing scan testing with a chain of scan latches on an integrated circuit. The test access port controller can implement a structural test or a performance test. Selection between the two types of test is achieved through logic circuitry of the test access port controller. An integrated circuit and a test system are also provided. <IMAGE>
Inventors
No inventors recorded.
Bibliographic Details
Application Number
—
Jurisdiction
EP
Data Source
google_patents
Last Synchronized
2026-11-08 16:10
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/3185; G01R31/318533; G01R31/318555; G06; G06F; G06F11/00; G06F11/22; G06F11/2273
Claims Analysis
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References Cited (Backward Citations)
EP0402134A2
Cited
EP0548585A2
Cited
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