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EP0455526A1 Expired / Lapsed EP ⏱️ 0.0 years remaining

Process for adaptation between two crystallized semiconductor materials, and semiconductor device

Assignee: Thales SA
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Filing: 1991-04-03
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Granted: —
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Expires: 2011-04-03
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Abstract

Abstract Translated from French L'invention concerne un procédé de croissance, sur un substrat en un premier matériau (5), d'une couche en un second matériau (7), dont les paramètres de maille cristalline sont désadaptés. The invention relates to a method for growing, on a substrate made of a first material (5), a layer made of a second material (7), the crystal mesh parameters of which are mismatched. Afin d'éviter la courbure du substrat, résultant de la contrainte imposée par la désadaptation entre les paramètres de maille des deux matériaux (5,7), le substrat est d'abord soumis à une contrainte calculée, par introduction dans son réseau cristallin de domaines déformants (6) qui induisent une contrainte inverse de celle imposée ensuite, par la croissance de la couche de second matériau. Selon les coefficients de dilatation linéaire des deux matériaux, la couche est épitaxiée sur la même face ou sur la face opposée du substrat contrainte par les domaines déformants. In order to avoid the curvature of the substrate, resulting from the stress imposed by the mismatch between the mesh parameters of the two materials (5,7), the substrate is first subjected to a calculated stress, by introduction into its crystal lattice of deforming domains (6) which induce a stress opposite to that imposed thereafter, by the growth of the layer of second material. According to the coefficients of linear expansion of the two materials, the layer is epitaxied on the same face or on the opposite face of the substrate constrained by the deforming domains. Application aux dispositifs semiconducteurs GaAs/Si. Application to GaAs / Si semiconductor devices.

Inventors

  • 👤 Claude Weisbuch
  • 👤 Jean-Pierre Hirtz
  • 👤 René Bisaro

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-10-31 04:36
CPC Classifications
H; H10; H10P; H10P14/00; H10P14/20; H10P14/36; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/34; H10P14/3402; H10P14/3414; H10P14/3421

Claims Analysis

Total Claims: 0
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References Cited (Backward Citations)

US4159214A Cited
US4766092A Cited

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