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EP0354860A1 Expired / Lapsed EP ⏱️ 0.0 years remaining

Highly integrated EPROM device laid out in a grid and having an altered coupling factor and a redundancy capability

Assignee: STMicroelectronics SA
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Filing: 1989-07-31
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Granted: —
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Expires: 2009-07-31
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Abstract

Abstract Translated from French La présente invention concerne une mémoire non-volatile électriquement programmable composée d'un réseau de lignes de mot (LM2) s'étendant suivant une première direction dite de rangée, et de lignes de bit (LB2 à LB4) s'étendant suivant une deuxième direction dite de colonne. Une zone conductrice (25) réalisée par un deuxième niveau de silicium polycristallin contacte et recouvre la grille flottante (23) de chaque transistor en débordant dans la direction des rangées. La zone conductrice (25) dans chaque transistor est en regard de la ligne de mot connectée au transistor, cette ligne de mot correspondant, à l'emplacement des zones conductrices, à la grille de commande (28). The present invention relates to an electrically programmable non-volatile memory composed of a network of word lines (LM2) extending in a first direction called row, and bit lines (LB2 to LB4) extending in a second so-called column direction. A conductive zone (25) produced by a second level of polycrystalline silicon contacts and covers the floating gate (23) of each transistor by projecting in the direction of the rows. The conductive area (25) in each transistor is opposite the word line connected to the transistor, this word line corresponding, at the location of the conductive areas, to the control gate (28).

Inventors

  • 👤 Albert Bergemont

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-04 14:23
CPC Classifications
G; G11; G11C; G11C29/00; G11C29/70; G11C16/00; G11C16/02; G11C16/04; G11C16/0491; H; H10; H10B; H10B69/00; H10D; H10D30/00; H10D30/60; H10D30/68; H10D30/681; H10D30/684; H10D30/685; H10D64/00; H10D64/20; H10D64/27; H10D64/311; H10D64/411; H10D64/511; H10D64/517; H10D64/518

Claims Analysis

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References Cited (Backward Citations)

US4258466A Cited
EP0087155A2 Cited
DE3426306A1 Cited
EP0197284A2 Cited

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