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EP0318094A1 Expired / Lapsed EP ⏱️ 0.0 years remaining

Integrated memory circuit with on-chip supply voltage control

Assignee: Koninklijke Philips NV
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Filing: 1988-11-21
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Granted: —
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Expires: 2008-11-21
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Abstract

Abstract The invention relates to an integrated memory circuit which acts on an internal supply voltage which is valued below an externally applied supply voltage. The bit lines and non-bit lines are charged to the internal supply voltage VDI whereto the memory cells are also connected. Before a read mode the bit line and the non-bit line selected by a column selection signal are discharged to a voltage value VDIT which is valued one threshold voltage of an NMOS transistor below the internal supply voltage. As a result, the maximum insusceptibility to noise is maintained for the memory cells and the data bit of high potential on one side of the memory cell can no longer be disturbed during the read cycle. The invention also relates to a circuit for generating the discharge voltage VDIT for the bit line and the non-bit line, which discharge voltage is valued one threshold voltage below the internal supply voltage VDI of the memory. This circuit comprises a charging branch for charging a capacitor to the voltage VDIT and a discharging branch for discharging this capacitor to the voltage VDIT in the situation where the voltage across the capacitor excessively rises beyond the voltage VDIT due to the repeated charge transfer from the bit line pairs to said capacitor.

Inventors

  • 👤 Leonardus Chritien Matheus Giellaumes Pfennings
  • 👤 Peter Hermann Voss
  • 👤 Cormac Michael O'connell
  • 👤 Cathal Gerard Phelan
  • 👤 Thomas James Davies
  • 👤 Hans Ontrop

Bibliographic Details

Application Number —
Jurisdiction EP
Data Source google_patents
Last Synchronized 2026-11-05 15:54
CPC Classifications
G; G11; G11C; G11C11/00; G11C11/21; G11C11/34; G11C11/40; G11C11/41; G11C11/413; G11C11/417; G11C11/419; G11C5/00; G11C5/14; G11C5/145

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 138 words
An integrated memory circuit, comprising an external and an internal power supply junction point and a voltage converter which is connected between said junction points in order to apply a voltage to the internal power supply point which is lower than the voltage applied to the external power supply junction point, the memory circuit comprising a matrix of memory cells which are arranged in rows an columns and which are connected to the internal supply voltage, each of said rows of memory cells being connected to a word line, each memory cell in a column being connected to a bit line via an access transistor, characterized in that before each read cycle the lowest bit line voltage equals the internal supply voltage minus a threshold voltage of the access transistor connecting the memory cell to the bit line.
Claim 2
Dependent Claim 138 words
An integrated memory circuit, comprising an external and an internal power supply junction point and a voltage converter which is connected between said junction points in order to apply a voltage to the internal power supply point which is lower than the voltage applied to the external power supply junction point, the memory circuit comprising a matrix of memory cells which are arranged in rows an columns and which are connected to the internal supply voltage, each of said rows of memory cells being connected to a word line, each memory cell in a column being connected to a bit line via an access transistor, characterized in that before each read cycle the lowest bit line voltage equals the internal supply voltage minus a threshold voltage of the access transistor connecting the memory cell to the bit line.
Claim 3
Dependent Claim 28 words
An integrated memory circuit as claimed in Claim 1, characterized in that the maximum potential of the control signal on the word lines equals the external supply voltage.
Claim 4
Dependent Claim 59 words
An integrated memory circuit as claimed in Claim 1 or 2, characterized in that the transistors which are controlled by a column selection circuit for selectively connecting a bit line and a non-bit line to a local read bus are controlled by means of selection signals whose maximum voltage equals the voltage applied to the external power supply point.
Claim 5
Dependent Claim 146 words
An integrated memory circuit as claimed in Claim 1, 2 or 3, characterized in that the integrated memory circuit comprises a circuit for generating a second internal supply voltage which comprises a control transistor whose gate is connected to the internal supply voltage terminal and whose source is connected to a junction point which carries the second supply voltage and whereto there is also connected a discharge transistor whose gate is connected to a control output of a voltage controller, a first and a second input of which are connected to the internal supply voltage point and the junction point between the control transistor and the discharge transistor, respectively, the voltage controller rendering the discharge transistor conductive if the voltage difference between the internal supply voltage terminal and said junction point is substantially smaller than the threshold voltage of the access transistor of the memory cells.
Claim 6
Dependent Claim 49 words
An integrated memory circuit as claimed in Claim 4, characterized in that a transistor, being connected as a load, and a capacitance are connected parallel to the discharge transistor, the capacitance value of the capacitance being substantially larger than that of the parasitic capacitance of a bit line pair.
Claim 7
Dependent Claim 52 words
An integrated memory circuit as claimed in Claim 5, characterized in that a series connection of a further load transistor and a transistor switch are connected parallel to the discharge transistor, which transistor switch is switched on by a switch enable signal on the chip enable input of the integrated memory circuit.

References Cited (Backward Citations)

EP0063483A2 Cited
US4691304A Cited

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