Semiconductor device having an arrangement for preventing operational errors

Claim 2

A semiconductor device formed on a semiconductor chip comprising: a plurality of circuits formed on the semiconductor chip; a voltage transformation means formed on the chip including means for transforming an external power supply voltage supplied from an external power supply into a predetermined internal power supply voltage; means for coupling said predetermined internal power supply voltage generated by said voltage transformation means to predetermined ones of said circuits; and means for delaying a starting time for an increase of said internal power supply voltage at a moment when said external power supply is switched on to start later than the starting time of an increase of said external power supply voltage, and/or for increasing a time necessary for said internal power supply voltage to rise to a predetermined internal voltage operational value to be longer than a time necessary for said external power supply voltage to rise to a predetermined external voltage operational value.

Claim 3

A semiconductor device according to claim 1, wherein the predetermined operational levels of said internal power supply voltage and said external power supply voltage are substantially equal to one another.

Claim 4

A semiconductor device according to claim 1, wherein said coupling means couple said predetermined internal power supply voltage to predetermined ones of said circuits which would generate spike currents if they were supplied with said external power supply voltage when said external power supply is turned on.

Claim 5

A semicohductor device according to claim 1, wherein said voltage transformation means includes at least a charge pumping circuit and a circuit for generating signals for the charge pumping.

Claim 6

A semiconductor device according to claim 4, wherein said circuit for generating signals for the charge pumping includes a self-starting oscillation circuit.

Claim 7

A semiconductor device according to claim 5, further comprising a back bias generator formed on said semiconductor chip including means for applying a predetermined back bias to a semiconductor substrate of said semiconductor chip, wherein said self-starting oscillation circuit is commonly used both by said voltage transformation means and by said back bias generator means.

Claim 8

A semiconductor device according to claim 1, wherein said semiconductor device is an information memory dvice composed by a group of memory cells, each of which includes an information storage capacitor and a switching MOS transistor, said device further comprising a first electrode group being comprised of one of the terminals of every capacitor in said group of memory cells and being connected with an output terminal of said voltage transformation means which supplies said internal power supply voltage.

Claim 9

A semiconductor device according to claim 1, wherein the supply of said internal voltage to said first electrode group is effected through a switching means which is controlled to have an on-off operation in synchronism with the operation of said semiconductor device.

Claim 10

A semiconductor device according to claim 8, wherein said first electrode group is divided into a plurality of groups, at least two of which use said switching means in common, and at least one of said at least two is in a non-active state, when said information memory device is in the active state.

Claim 11

A semiconductor device according to claim 1, wherein said semiconductor device is an information memory device composed by a group of memory cells, each of which includes an information storage capacitor and a switching MOS transistor, in which one of source and drain electrodes is connected with one of the electrodes of said capacitor; the other of the drain and source electrodes is connected with a first signal line; and the gate electrode is connected with a second signal line, said first signal line being precharged by said internal power supply voltage, which is the output of said voltage transformation means.

Claim 12

A semiconductor device according to claim 10, wherein said voltage transformation means has a driving capability I DP represented by ##EQU3## where n: number of memory cells which are to be taken into account at the moment of variations in power supply voltage C S : storage capacity per memory cell, ΔV INT : amount of variation in V INT , and Δt: duration of the variation.

Claim 13

A semiconductor device according to claim 11, wherein Δt is equal to a period t P necesary for the precharge of the memory.

Claim 14

A semiconductor device formed on a semiconductor chip comprising: a plurality of circuits formed on the semiconductor chip; a voltage transformation means formed on the chip including means for transforming an external power supply voltage supplied from said an external power supply into a predetermined internal power supply voltage; means for coupling said predetermined internal power supply voltage generated by said voltage transformation means to predetermined ones of said circuits; means for delaying a starting time for an increase of said internal power supply voltage at a moment when said external power supply is switched on to start later than the starting time of an increase of said external power supply voltage, and/or for increasing a time necesary for said internal power supply voltage to rise to a predetermined internal voltage operational value to be longer than a time necessary for said external power supply voltage to rise to a predetermined external voltage operational value; a back bias generator means formed on said semiconductor chip for applying a predetermined back bias to a semiconductor substrate of said semiconductor chip; and means for delaying a starting time of an increase of said back bias at a moment when said external power supply is switched on to start later than the starting time of an increase of external power supply voltage, and/or for increasing a time necessary for said back bias to rise to a predetermined back bias operational value to be longer than a time necessary for said external power supply voltage to rise to a predetermined external voltage operational value.

Claim 15

A semiconductor device formed on a semiconductor chip comprising: a plurality of circuits formed on the semiconductor chip; a voltage transformation means formed on the chip including means for transforming an external power supply voltage supplied from said an external power supply into a predetermined internal power supply voltage; means for coupling said predetermined internal power supply voltage generated by said voltage transformation means to predetermined ones of said circuits; means for delaying a starting time for an increase of said internal power supply voltage at a moment when said external power supply is switched on to start later than the starting time of an increase of said external power supply voltage, and/or for increasing a time necesary for said internal power supply voltage to rise to a predetermined internal voltage operational value to be longer than a time necessary for said external power supply voltage to rise to a predetermined external voltage operational value; a back bias generator means formed on said semiconductor chip for applying a predetermined back bias to a semiconductor substrate of said semiconductor chip; and means for delaying a starting time of an increase of said back bias at a moment when said external power supply is switched on to start later than the starting time of an increase of external power supply voltage, and/or for increasing a time necessary for said back bias to rise to a predetermined back bias operational value to be longer than a time necessary for said external power supply voltage to rise to a predetermined external voltage operational value.

Claim 16

A semiconductor device according to claim 13, wherein a starting time of an increase of said internal power supply voltage at the moment of the switch-on of the external power supply is almost equal to or later than the starting time of an increase of said back bias and/or the time necessary for the increase of said internal power supply voltage at said moment to a predetermined internal voltage operational value is almost equal to or longer than the time necessary for said back bias to increase to said predetermined back bias operational value.

Claim 17

A semiconductor device according to claim 13, wherein said back bias generator means includes a charge pumping circuit and a circuit for generating signals for the charge pumping.

Claim 18

A semiconductor device according to claim 15, wherein said circuit for generating signals for the charge pumping includes of a self-starting oscillation circuit.

Claim 19

A semiconductor device according to claim 16, wherein said self-starting oscillation circuit is commonly used both by said voltage transformation means and by said back bias generator means.

Claim 20

A semiconductor device according to claim 13, wherein said coupling means couple said predetermined internal power supply voltage to predetermined ones of said circuits which would generate spike currents if they were supplied with said external power supply voltage when said external power supply is turned on.