Patent Explorer
Browse, filter, and analyze 18 patents across global jurisdictions.
| Patent Number | Title | Assignee | Status | Filing Date | Grant Date | Expires | Remaining | Claims | Actions |
|---|---|---|---|---|---|---|---|---|---|
| US5389553A | Methods for fabrication of transistors | National Semiconductor Corp | Expired / Lapsed | 1993-06-30 | 1995-02-14 | 2013-06-30 | 0.0 yrs | 17 | |
| US5117394A | High speed differential sense amplifier for use with single transistor memory cells | National Semiconductor Corp | Expired / Lapsed | 1991-05-06 | 1992-05-26 | 2011-05-06 | 0.0 yrs | 11 | |
| US4754912A | Controlled collapse thermocompression gang bonding | National Semiconductor Corp | Expired / Lapsed | 1987-11-16 | 1988-07-05 | 2007-11-16 | 0.0 yrs | 6 | |
| US4495497A | Circuit arrangement for controlled interconnection of signal sources and signal destinations | National Semiconductor Corp | Expired / Lapsed | 1982-01-07 | 1985-01-22 | 2002-01-07 | 0.0 yrs | 9 | |
| US4493079A | Method and system for selectively loading test data into test data storage means of automatic digital test equipment | National Semiconductor Corp | Expired / Lapsed | 1982-08-18 | 1985-01-08 | 2002-08-18 | 0.0 yrs | 11 | |
| US4476546A | Programmable address buffer for partial products | National Semiconductor Corp | Expired / Lapsed | 1982-03-19 | 1984-10-09 | 2002-03-19 | 0.0 yrs | 21 | |
| US4464591A | Current difference sense amplifier | National Semiconductor Corp | Expired / Lapsed | 1982-06-23 | 1984-08-07 | 2002-06-23 | 0.0 yrs | 11 | |
| US4446534A | Programmable fuse circuit | National Semiconductor Corp | Expired / Lapsed | 1980-12-08 | 1984-05-01 | 2000-12-08 | 0.0 yrs | 8 | |
| US4366555A | Electrically erasable programmable read only memory | National Semiconductor Corp | Expired / Lapsed | 1980-08-01 | 1982-12-28 | 2000-08-01 | 0.0 yrs | 17 | |
| US4355463A | Process for hermetically encapsulating semiconductor devices | National Semiconductor Corp | Expired / Lapsed | 1980-03-24 | 1982-10-26 | 2000-03-24 | 0.0 yrs | 11 | |
| US4335457A | Method for semiconductor memory testing | National Semiconductor Corp | Expired / Lapsed | 1980-08-08 | 1982-06-15 | 2000-08-08 | 0.0 yrs | 9 | |
| US4312926A | Tear strip planarization ring for gang bonded semiconductor device interconnect tape | National Semiconductor Corp | Expired / Lapsed | 1980-04-14 | 1982-01-26 | 2000-04-14 | 0.0 yrs | 6 | |
| US4280220A | Electronic testing system | National Semiconductor Corp | Expired / Lapsed | 1979-09-17 | 1981-07-21 | 1999-09-17 | 0.0 yrs | 11 | |
| US4050030A | Offset adjustment circuit | National Semiconductor Corp | Expired / Lapsed | 1976-06-25 | 1977-09-20 | 1996-06-25 | 0.0 yrs | 6 | |
| US3909924A | Method of fabrication of silicon pressure transducer sensor units | National Semiconductor Corp | Expired / Lapsed | 1974-03-27 | 1975-10-07 | 1994-03-27 | 0.0 yrs | 5 | |
| US3836796A | Semiconductor pressure transducer employing novel temperature compensation means | National Semiconductor Corp | Expired / Lapsed | 1973-09-24 | 1974-09-17 | 1993-09-24 | 0.0 yrs | 4 | |
| US3790817A | Schottky clamped ttl circuit | National Semiconductor Corp | Expired / Lapsed | 1972-02-14 | 1974-02-05 | 1992-02-14 | 0.0 yrs | 13 | |
| US3742377A | Differential amplifier with means for balancing out offset terms | National Semiconductor Corp | Expired / Lapsed | 1971-07-08 | 1973-06-26 | 1991-07-08 | 0.0 yrs | 7 |