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USH1423H Expired / Lapsed US ⏱️ 0.0 years remaining

Method for fabricating a silicon-on-insulator voltage multiplier

Assignee: United States Department of the Navy
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Filing: 1992-12-10
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Granted: 1995-04-04
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Expires: 2012-12-10
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Abstract

Abstract The present invention provides a method for fabricating a silicon-on-insulator voltage multiplier. The method comprises the steps of: forming a first silicon layer having a first concentration of a first dopant with a first polarity on a silicon wafer having a second concentration of a second dopant with a second polarity opposite the first polarity to create a diode junction; forming a second silicon layer on the first silicon layer, the second silicon layer having a third concentration of a third dopant having the first polarity, where the third concentration is greater than the first concentration of the first dopant; forming a silicon dioxide layer on the second silicon layer by thermal oxidation; bonding an insulating substrate to the silicon dioxide layer to create a bonded wafer, where the insulating substrate is selected from the group consisting of quartz, glass, sapphire, and silicon dioxide on silicon; thinning the silicon wafer to form a thinned silicon layer; etching the bonded wafer to form a plurality of separate diodes having sloped sidewalls and to expose selected regions of the insulating substrate; forming an insulating silicon layer on the selected regions of the insulating substrate and on the separate diodes; exposing selected regions of the thinned silicon layer and regions of the second silicon layer of each of the diodes; and forming metal interconnects between the exposed selected regions of the thinned silicon layer of one of the diodes with the silicon layer of another of the diodes.

Inventors

  • 👤 Larry D. Flesner
  • 👤 Graham A. Garcia
  • 👤 George P. Imthurn

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-05 02:17
CPC Classifications
H; H10; H10D; H10D8/00; H10D8/01; H10D86/00; H10D86/01; H10D86/03

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 53 words
A bonded silicon-on-insulator diode circuit, comprising: a bulk insulating substrate; and multiple diodes, each diode including: a silicon dioxide layer bonded to said insulating substrate; a silicon layer conjoined with said silicon dioxide layer; and a p-n diode junction formed in said silicon layer, said silicon layer being differential thermal expansion defect free.
Claim 2
Dependent Claim 53 words
A bonded silicon-on-insulator diode circuit, comprising: a bulk insulating substrate; and multiple diodes, each diode including: a silicon dioxide layer bonded to said insulating substrate; a silicon layer conjoined with said silicon dioxide layer; and a p-n diode junction formed in said silicon layer, said silicon layer being differential thermal expansion defect free.
Claim 3
Dependent Claim 28 words
The bonded silicon-on-insulator diode circuit of claim 1 wherein said insulating substrate includes a material selected from the group of sapphire, quartz, glass, and silicon dioxide on silicon.
Claim 4
Dependent Claim 78 words
A voltage multiplier diode circuit, comprising: a bulk insulating substrate; and an electrical circuit formed on said bulk insulating substrate, said electrical circuit having a multiplicity of diodes and capacitors interconnected to form a voltage multiplier, each of said diodes including: a silicon dioxide layer bonded to said insulating substrate; a silicon layer conjoined with said silicon dioxide layer; and a p-n diode junction formed in said silicon layer, said silicon layer being differential thermal expansion defect free.
Claim 5
Dependent Claim 78 words
A voltage multiplier diode circuit, comprising: a bulk insulating substrate; and an electrical circuit formed on said bulk insulating substrate, said electrical circuit having a multiplicity of diodes and capacitors interconnected to form a voltage multiplier, each of said diodes including: a silicon dioxide layer bonded to said insulating substrate; a silicon layer conjoined with said silicon dioxide layer; and a p-n diode junction formed in said silicon layer, said silicon layer being differential thermal expansion defect free.
Claim 6
Dependent Claim 28 words
The voltage multiplier diode circuit of claim 3 wherein said insulating substrate includes a material selected from the group of sapphire, quartz, glass, and silicon dioxide on silicon.

References Cited (Backward Citations)

US4241360A Cited
US4520461A Cited
JPS56105677A Cited
JPS5731177A Cited
US4501060A Cited
US4575746A Cited
JPS61232655A Cited
US4922403A Cited
US5014097A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1998-04-03 1998-10-03 1999-04-04 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2002-04-03 2002-10-03 2003-04-04 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2006-04-03 2006-10-03 2007-04-04 $7700.00 Window Closed / Lapsed

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