Patent US6856154B2 successfully refreshed from Google Patents.
US6856154B2
Expired / Lapsed
US
⏱️ 0.0 years remaining
Test board for testing IC package and tester calibration method using the same
Assignee: Samsung Electronics Co Ltd
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Filing: 2003-12-11
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Granted: 2005-02-15
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Expires: 2023-12-11
Abstract
Abstract A test board is selectively usable as an interface between an integrated circuit device under test (DUT), such as a ball grid array package, and an automatic test equipment (ATE), and as an interface between a calibration apparatus and the ATE. The test board includes a socket, for electrically connecting to the ATE, which includes a plurality of contact terminals which are configured to directly contact terminals of the DUT during a test operation and to directly contact probes of the calibration apparatus during a calibration operation. The test board also includes an alignment mark which is positioned adjacent the socket and which can be sensed by the calibration apparatus during the calibration operation, and a test pad which is positioned adjacent the socket and which is configured to directly contact a test probe of the calibration apparatus for checking an operational state of the calibration apparatus.
Inventors
- 👤 Yoon-Gyu Song
- 👤 Ki-Seok Jeon
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-27 19:05
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2886; G01R31/2889; H; H10; H10P; H10P74/00; G01R31/2896; G01R35/00; G01R35/005
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
151 words
A test board which is selectively usable as an interface between an integrated circuit device under test (DUT) and an automatic test equipment (ATE) and as an interface between a calibration apparatus and the ATE, wherein the calibration apparatus includes contact probes and the DUT includes terminals, said test board comprising: a socket, for electrically connecting to the ATE, which includes a plurality of contact terminals which are configured to directly contact the terminals of the DUT during a test operation and to directly contact the contact probes of the calibration apparatus during a calibration operation; an alignment mark which is positioned adjacent the socket and which can be sensed by the calibration apparatus during the calibration operation; and a test pad which is positioned adjacent the socket and which is configured to directly contact a test probe of the calibration apparatus for checking an operational state of the calibration apparatus.
Claim 2
Dependent Claim
151 words
A test board which is selectively usable as an interface between an integrated circuit device under test (DUT) and an automatic test equipment (ATE) and as an interface between a calibration apparatus and the ATE, wherein the calibration apparatus includes contact probes and the DUT includes terminals, said test board comprising: a socket, for electrically connecting to the ATE, which includes a plurality of contact terminals which are configured to directly contact the terminals of the DUT during a test operation and to directly contact the contact probes of the calibration apparatus during a calibration operation; an alignment mark which is positioned adjacent the socket and which can be sensed by the calibration apparatus during the calibration operation; and a test pad which is positioned adjacent the socket and which is configured to directly contact a test probe of the calibration apparatus for checking an operational state of the calibration apparatus.
Claim 3
Dependent Claim
22 words
The test board of claim 1 , wherein DUT is a ball grid array package or a micro ball grid array package.
Claim 4
Dependent Claim
18 words
The test board of claim 1 , further comprising conductive lines that electrically connect the socket and ATE.
Claim 5
Independent Claim
146 words
A system for testing an integrated circuit device under test (DUT) having terminals, said system comprising: an automatic test equipment (ATE); a calibration apparatus having contact probes for calibrating the ATE and having a test probe for checking an operational state of the calibration apparatus; and a test board comprising (a) a socket, which is electrically connected to the ATE, and which includes a plurality of contact terminals which are configured to directly contact the terminals of the DUT during a test operation and to directly contact the contact probes of the calibration apparatus during a calibration operation, (b) an alignment mark which is positioned adjacent the socket and which can be sensed by the calibration apparatus during the calibration operation, and (c) a test pad which is positioned adjacent the socket and which is configured to directly contact the test probe of the calibration apparatus.
Claim 6
Independent Claim
146 words
A system for testing an integrated circuit device under test (DUT) having terminals, said system comprising: an automatic test equipment (ATE); a calibration apparatus having contact probes for calibrating the ATE and having a test probe for checking an operational state of the calibration apparatus; and a test board comprising (a) a socket, which is electrically connected to the ATE, and which includes a plurality of contact terminals which are configured to directly contact the terminals of the DUT during a test operation and to directly contact the contact probes of the calibration apparatus during a calibration operation, (b) an alignment mark which is positioned adjacent the socket and which can be sensed by the calibration apparatus during the calibration operation, and (c) a test pad which is positioned adjacent the socket and which is configured to directly contact the test probe of the calibration apparatus.
Claim 7
Dependent Claim
28 words
The system of claim 4 , further comprising a main load board electrically connected between the ATE and the contact terminals of the socket of the test board.
Claim 8
Dependent Claim
22 words
The test board of claim 4 , wherein DUT is a ball grid array package or a micro ball grid array package.
Claim 9
Independent Claim
124 words
A method of calibrating an automatic test equipment (ATE) which tests an integrated circuit device under test (DUT) having terminals, said method comprising: electrically connecting the ATE to a socket of a test board, the socket including a plurality of contact terminals which are configured to directly contact the terminals of the DUT during a test operation; using an alignment mark positioned adjacent the socket to align a calibration apparatus with the test board; directly contacting a test pad positioned adjacent the socket with a test probe of the calibration apparatus to determine whether the calibration apparatus is operating correctly; and directly contacting the contact terminals of the socket with calibration probes of the calibration apparatus to detect calibration data for calibrating the ATE.
Claim 10
Independent Claim
124 words
A method of calibrating an automatic test equipment (ATE) which tests an integrated circuit device under test (DUT) having terminals, said method comprising: electrically connecting the ATE to a socket of a test board, the socket including a plurality of contact terminals which are configured to directly contact the terminals of the DUT during a test operation; using an alignment mark positioned adjacent the socket to align a calibration apparatus with the test board; directly contacting a test pad positioned adjacent the socket with a test probe of the calibration apparatus to determine whether the calibration apparatus is operating correctly; and directly contacting the contact terminals of the socket with calibration probes of the calibration apparatus to detect calibration data for calibrating the ATE.
Claim 11
Dependent Claim
22 words
The method of claim 7 , wherein the DUT is a ball grid array package or a micro ball grid array package.
Claim 12
Dependent Claim
75 words
The method of claim 7 , further comprising removing the direct contact between the test pad and the test probe and the direct contact between the contact terminals and the calibration probes, and then conducting the test operation, wherein the test operation includes: directly contacting the contact terminals of the socket with the terminals of the DUT; using the ATE to test the DUT; and compensating test results of the ATE using the calibrating data.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2008-02-15 | 2008-08-16 | 2009-02-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2012-02-15 | 2012-08-16 | 2013-02-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2016-02-15 | 2016-08-16 | 2017-02-15 | $7700.00 | Window Closed / Lapsed |