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US6548898B2 Expired / Lapsed US ⏱️ 0.0 years remaining

External connection terminal and semiconductor device

Assignee: Socionext Inc
•
Filing: 2001-07-02
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Granted: 2003-04-15
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Expires: 2021-07-02
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Abstract

Abstract A structure in which a phosphorus-nickel layer, a rich phosphorus nickel layer that contains phosphorus or boron higher than this phosphorus-nickel layer, a nickel-tin ally layer, a tin-rich tin alloy layer, and a tin alloy solder layer are formed in sequence on an electrode. Accordingly, adhesiveness between a metal pattern used as the electrode, the wiring, or the pad and the solder can be improved.

Inventors

  • 👤 Hirohisa Matsuki
  • 👤 Yutaka Makino
  • 👤 Masamitsu Ikumo
  • 👤 Mitsutaka Sato
  • 👤 Tetsuya Fujisawa
  • 👤 Yoshitaka Aiba

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-01 15:19
CPC Classifications
H; H05; H05K; H05K3/00; H05K3/22; H05K3/24; H05K3/244; H10; H10P; H10P95/00; H10W; H10W72/00; H10W72/01; H10W72/012; H10W72/0198; H10W90/00; H10W90/701; H10W70/00; H10W70/60; H10W72/013; H10W72/01331; H10W72/019; H10W72/01931; H10W72/01933; H10W72/01935; H10W72/071; H10W72/072; H10W72/07251; H10W72/20; H10W72/221; H10W72/222; H10W72/223; H10W72/241; H10W72/242; H10W72/251; H10W72/29; H10W72/50; H10W72/59; H10W72/90; H10W72/931; H10W72/932; H10W72/941; H10W72/9415; H10W72/981; H10W72/983

Claims Analysis

Total Claims: 32
Claim 1
Independent Claim 101 words
An external connection terminal comprising: an electrode formed on a substrate; a first-element containing nickel layer formed as a barrier metal on the electrode to contain a first element consisting of any one of phosphorus and boron; a rich first-element containing nickel layer formed on the first-element containing nickel layer to contain a greater concentration of the first element than that in the first-element containing nickel layer; a nickel-tin alloy layer formed on the rich first-element containing nickel layer; a tin alloy layer formed on the nickel-tin alloy layer; and a tin alloy solder layer formed on the tin alloy layer.
Claim 2
Dependent Claim 101 words
An external connection terminal comprising: an electrode formed on a substrate; a first-element containing nickel layer formed as a barrier metal on the electrode to contain a first element consisting of any one of phosphorus and boron; a rich first-element containing nickel layer formed on the first-element containing nickel layer to contain a greater concentration of the first element than that in the first-element containing nickel layer; a nickel-tin alloy layer formed on the rich first-element containing nickel layer; a tin alloy layer formed on the nickel-tin alloy layer; and a tin alloy solder layer formed on the tin alloy layer.
Claim 3
Dependent Claim 25 words
An external connection terminal according to claim 1 , wherein copper is contained in the nickel-tin alloy layer, and the tin alloy solder layer, respectively.
Claim 4
Dependent Claim 18 words
An external connection terminal according to claim 1 , wherein the tin alloy layer is a tin-palladium layer.
Claim 5
Dependent Claim 25 words
An external connection terminal according to claim 1 , wherein the first-element containing nickel layer contains the first element by 1 to 15 wt %.
Claim 6
Dependent Claim 25 words
An external connection terminal according to claim 1 , wherein the tin alloy layer contains tin at a concentration of less than 52 wt %.
Claim 7
Dependent Claim 26 words
An external connection terminal, according to claim 1 , wherein the tin alloy solder layer contains tin at a concentration of more than 5 wt %.
Claim 8
Dependent Claim 16 words
An external connection terminal according to claim 1 , wherein the substrate is a semiconductor substrate.
Claim 9
Dependent Claim 37 words
An external connection terminal according to claim 7 , wherein a coating film made of organic insulating material or metal is formed on at least one of side surfaces and a back surface of the semiconductor substrate.
Claim 10
Dependent Claim 29 words
An external connection terminal according to claim 1 , wherein the electrode is formed of a conductor containing copper or aluminum as a principal component, or aluminum, or copper.
Claim 11
Dependent Claim 29 words
An external connection terminal according to claim 1 , wherein the electrodes are projection-like electrodes that are electrically connected to metal patterns on the substrate or the insulating film.
Claim 12
Dependent Claim 22 words
An external connection terminal according to claim 1 , wherein a thickness of the tin alloy layer is 10 to 200 nm.
Claim 13
Dependent Claim 24 words
An external connection terminal according to claim 1 , wherein a thickness of the rich first-element containing nickel layer is 50 to 500 nm.
Claim 14
Dependent Claim 27 words
An external connection terminal according to claim 1 , wherein the tin alloy solder layer has a substantially spherical or substantially cylindrical or substantially needle-like outer shape.
Claim 15
Dependent Claim 91 words
An external connection terminal comprising: an electrode formed on a substrate; a first-element containing nickel-copper layer formed as a barrier metal on the electrode to contain a first element consisting of any one of phosphorus and boron; a rich first-element containing nickel-copper layer formed on the first-element containing nickel-copper layer to contain a greater concentration of the first element than that in the first-element containing nickel-copper layer; a nickel-copper-tin alloy layer formed on the rich first-element containing nickel-copper layer; and a tin alloy solder layer formed on the nickel-copper-tin alloy layer.
Claim 16
Dependent Claim 91 words
An external connection terminal comprising: an electrode formed on a substrate; a first-element containing nickel-copper layer formed as a barrier metal on the electrode to contain a first element consisting of any one of phosphorus and boron; a rich first-element containing nickel-copper layer formed on the first-element containing nickel-copper layer to contain a greater concentration of the first element than that in the first-element containing nickel-copper layer; a nickel-copper-tin alloy layer formed on the rich first-element containing nickel-copper layer; and a tin alloy solder layer formed on the nickel-copper-tin alloy layer.
Claim 17
Dependent Claim 17 words
An external connection terminal according to claim 14 , wherein the tin alloy solder layer contains copper.
Claim 18
Dependent Claim 25 words
An external connection terminal according to claim 14 , wherein the first-element containing nickel-copper layer contains the first element by 1 to 15 wt %.
Claim 19
Dependent Claim 25 words
An external connection terminal according to claim 14 , wherein the nickel-copper-tin alloy layer contains tin at a concentration of less than 52 wt %.
Claim 20
Dependent Claim 26 words
An external connection terminal according to claim 14 , wherein the tin alloy solder layer contains tin at a concentration of more than 5 wt %.
Claim 21
Dependent Claim 16 words
An external connection terminal according to claim 14 , wherein the substrate is a semiconductor substrate.
Claim 22
Dependent Claim 35 words
An external connection terminal according to claim 19 , wherein a coating film made of organic insulating material is formed on at least one of side surfaces and a back surface of the semiconductor substrate.
Claim 23
Dependent Claim 29 words
An external connection terminal according to claim 14 , wherein the electrode is formed of a conductor containing copper or aluminum as a principal component, or aluminum, or copper.
Claim 24
Dependent Claim 103 words
An external connection terminal comprising: an insulating film formed on a substrate; a first-element containing nickel layer formed as a barrier metal on the insulating film to contain a first element consisting of any one of phosphorus and boron; a rich first-element containing nickel layer formed on the first-element containing nickel layer to contain a greater concentration of the first element than that in the first-element containing nickel layer; a nickel-tin alloy layer formed on the rich first-element containing nickel layer; a tin alloy layer formed on the nickel-tin alloy layer; and a tin alloy solder layer formed on the tin alloy layer.
Claim 25
Dependent Claim 103 words
An external connection terminal comprising: an insulating film formed on a substrate; a first-element containing nickel layer formed as a barrier metal on the insulating film to contain a first element consisting of any one of phosphorus and boron; a rich first-element containing nickel layer formed on the first-element containing nickel layer to contain a greater concentration of the first element than that in the first-element containing nickel layer; a nickel-tin alloy layer formed on the rich first-element containing nickel layer; a tin alloy layer formed on the nickel-tin alloy layer; and a tin alloy solder layer formed on the tin alloy layer.
Claim 26
Dependent Claim 16 words
An external connection terminal according to claim 1 , wherein the substrate is an insulating substrate.
Claim 27
Dependent Claim 16 words
An external connection terminal according to claim 22 , wherein the substrate is an insulating substrate.
Claim 28
Dependent Claim 93 words
An external connection terminal comprising: an insulating film formed on a substrate; a first-element containing nickel-copper layer formed as a barrier metal on the insulating film to contain a first element consisting of any one of phosphorus and boron; a rich first-element containing nickel-copper layer formed on the first-element containing nickel-copper layer to contain a greater concentration of the first element than that in the first-element containing nickel-copper layer; a nickel-copper-tin alloy layer formed on the rich first-element containing nickel-copper layer; and a tin alloy solder layer formed on the nickel-copper-tin alloy layer.
Claim 29
Dependent Claim 93 words
An external connection terminal comprising: an insulating film formed on a substrate; a first-element containing nickel-copper layer formed as a barrier metal on the insulating film to contain a first element consisting of any one of phosphorus and boron; a rich first-element containing nickel-copper layer formed on the first-element containing nickel-copper layer to contain a greater concentration of the first element than that in the first-element containing nickel-copper layer; a nickel-copper-tin alloy layer formed on the rich first-element containing nickel-copper layer; and a tin alloy solder layer formed on the nickel-copper-tin alloy layer.
Claim 30
Dependent Claim 16 words
An external connection terminal according to claim 14 , wherein the substrate is an insulating substrate.
Claim 31
Dependent Claim 16 words
An external connection terminal according to claim 25 , wherein the substrate is an insulating substrate.
Claim 32
Dependent Claim 33 words
An external connection terminal according to claim 19 , wherein a coating film made of metal is formed on at least one of side surfaces and a back surface of the semiconductor substrate.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2006-04-14 2006-10-14 2007-04-15 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2010-04-14 2010-10-14 2011-04-15 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2014-04-14 2014-10-14 2015-04-15 $7700.00 Window Closed / Lapsed

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