US6507185B1
Expired / Lapsed
US
⏱️ 0.0 years remaining
Device, assembly and method for testing electronic components, and calibrating method therefor
Assignee: Fico BV
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Filing: 1999-03-24
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Granted: 2003-01-14
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Expires: 2019-03-24
Abstract
Abstract The invention relates to a test device for testing electronic components mounted on a carrier such as a lead frame, comprising: a transport path for supplying a carrier for testing; a manipulator for engaging and displacing a supplied carrier; a test contact with which a carrier and/or at least one component mounted on the carrier can be placed in contact by the manipulator; and a transport path for discharging a tested carrier. The invention also embraces a test assembly which includes at least one described test device. The invention furthermore provides a method for testing electronic components mounted on a carrier and method for calibrating a test device.
Inventors
- 👤 Willem Antonie Hennekes
- 👤 Antoon Willem Pothoven
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 14:42
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2893; G01R31/01; G01R31/2832; G01R31/2834; G01R31/2886; G01R31/2887; H; H10; H10P; H10P72/00; H10P72/30; H10P72/32; H10P72/3222
Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
160 words
A test device for testing electronic components, comprising: a lead frame on which a plurality of electronic components may be mounted for testing wherein the lead frame is arranged with index holes; a lead frame supply transport path; a manipulator for engaging and displacing a supplied lead frame; a test contact with which a lead frame and/or at least one component mounted on the lead frame can be placed in contact by the manipulator wherein the test contact is provided with positioning pins which co-act with the index holes arranged in the lead frame; a lead frame discharge transport path; wherein at least one of said transport paths is continuous and leads along the test contact; and wherein the manipulator for engaging and displacing a supplied lead frame is equipped for taking a lead frame from the supply transport path and, after displacing and testing the lead frame, the manipulator places the tested lead frame in said discharge transport path.
Claim 2
Dependent Claim
160 words
A test device for testing electronic components, comprising: a lead frame on which a plurality of electronic components may be mounted for testing wherein the lead frame is arranged with index holes; a lead frame supply transport path; a manipulator for engaging and displacing a supplied lead frame; a test contact with which a lead frame and/or at least one component mounted on the lead frame can be placed in contact by the manipulator wherein the test contact is provided with positioning pins which co-act with the index holes arranged in the lead frame; a lead frame discharge transport path; wherein at least one of said transport paths is continuous and leads along the test contact; and wherein the manipulator for engaging and displacing a supplied lead frame is equipped for taking a lead frame from the supply transport path and, after displacing and testing the lead frame, the manipulator places the tested lead frame in said discharge transport path.
Claim 3
Dependent Claim
29 words
The test device as claimed in claim 1 , wherein the transport path for supplying a lead frame is connected to the transport path for discharging a lead frame.
Claim 4
Dependent Claim
37 words
The test device as claimed in claim 1 , wherein the transport path for supplying a lead frame runs at least partly parallel to at least a part of the transport path for discharging a lead frame.
Claim 5
Dependent Claim
22 words
The test device as claimed in claim 1 , wherein at least one transport path is adapted for transport in two directions.
Claim 6
Dependent Claim
23 words
The test device as claimed in claim 1 , wherein the test device comprises identification means for identification of an individual lead frame.
Claim 7
Dependent Claim
31 words
The test device as claimed in claim 1 , wherein the test device also comprises a computer system for processing test data, which computer system is connected to the test contact.
References Cited (Backward Citations)
WO1992004989A1
Cited
US5151650A
Cited
GB2285139A
Cited
US5686834A
Cited
WO1997029383A1
Cited
US6008636A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2006-01-13 | 2006-07-15 | 2007-01-14 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2010-01-13 | 2010-07-15 | 2011-01-14 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2014-01-13 | 2014-07-15 | 2015-01-14 | $7700.00 | Window Closed / Lapsed |