US5151650A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Packaged semiconductor device handler
Assignee: Motorola Solutions Inc
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Filing: 1991-09-03
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Granted: 1992-09-29
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Expires: 2011-09-03
Abstract
Abstract A handler (11) which transports a number of packaged semiconductor devices (12) in a boat (23) to a test head (14) and tests the devices (12) is provided. The handler (11) has an input staging section (29), a testing section (31) which is adjacent to the test head (14), and an output staging section (36). A boat transport (27a, 27b) moves the boat (23) from the input staging section (29) to the testing section (31) and from the testing section (31) to the output staging section (36). The boat transport (27a, 27b) operates during the device testing to provide substantially parallel operation of the testing and handling steps. A boat lift (39) moves the boat (23) to the test head (14) to allow the packaged semiconductor devices (12) to remain in the boat (23) during testing.
Inventors
- 👤 Milo W. Frisbie
- 👤 Larry A. Nickerson
- 👤 Mavin C. Swapp
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 18:48
CPC Classifications
H; H10; H10P; H10P72/00; H10P72/10; H10P72/16; B; B07; B07C; B07C5/00; B07C5/02; B07C5/34; B07C5/344; G; G01; G01R; G01R31/00; G01R31/01; H10P72/06
Claims Analysis
Total Claims: 21
Claim 1
Independent Claim
180 words
A handler for testing a number of packaged semiconductor devices having a plurality of leads extending from each package, the handler comprising: a test head having a plurality of contact strips extending therefrom, wherein each contact strip is for coupling to one of the plurality of leads, and the test head has a number of test pockets for holding the packaged semiconductor devices during testing; a means for ejecting the packaged semiconductor devices from the test pockets, wherein the means for ejecting is spring mounted to the test head and has a surface which contacts the packaged semiconductor devices and serves to push semiconductor devices out of the test pockets; a boat having the same number of compartments as the number of packaged semiconductor devices; a means for transporting the boat under the test head; and a means for lifting the boat so that the packaged semiconductor devices are pressed into the test pockets against the means for ejecting and the leads are pressed against the contact strips while the packaged semiconductor devices remain in the compartments of the boat.
Claim 2
Dependent Claim
180 words
A handler for testing a number of packaged semiconductor devices having a plurality of leads extending from each package, the handler comprising: a test head having a plurality of contact strips extending therefrom, wherein each contact strip is for coupling to one of the plurality of leads, and the test head has a number of test pockets for holding the packaged semiconductor devices during testing; a means for ejecting the packaged semiconductor devices from the test pockets, wherein the means for ejecting is spring mounted to the test head and has a surface which contacts the packaged semiconductor devices and serves to push semiconductor devices out of the test pockets; a boat having the same number of compartments as the number of packaged semiconductor devices; a means for transporting the boat under the test head; and a means for lifting the boat so that the packaged semiconductor devices are pressed into the test pockets against the means for ejecting and the leads are pressed against the contact strips while the packaged semiconductor devices remain in the compartments of the boat.
Claim 3
Dependent Claim
140 words
The handler of claim 1 wherein the means for transporting further comprises: an input staging section; a testing section; a motor; a first means for grasping the boat; a means for coupling the first means for grasping to the motor so that the first means for grasping moves a first direction when the motor turns clockwise and moves a second direction when the motor turns counterclockwise, wherein when the first means for grasping moves in the first direction it carries the boat from the input staging section to the testing section; an output staging section; a second means for grasping the boat; and a means for coupling the second means for grasping to the motor, wherein when the second means for grasping moves in the first direction it carries the boat from the testing section to the output staging section.
Claim 4
Dependent Claim
25 words
The handler of claim 2 wherein the boat is released from the first means for grasping when the means for lifting the boat is activated.
Claim 5
Dependent Claim
44 words
The handler of claim 2 wherein the first means for grasping returns to the input staging section while the boat remains in the testing section, and the second means for grasping returns to the testing section while the boat remains in the testing section.
Claim 6
Dependent Claim
151 words
A handler for testing a number of packaged semiconductor devices having a plurality of leads extending from each package, the handler comprising: a test head having a plurality of contacts extending therefrom, wherein each contact is for coupling to one of the leads and said test head having a number of test pockets for holding the packaged semiconductor devices during testing; a boat for carrying devices, wherein the boat has the same number of compartments as the number of packaged semiconductor devices; a boat travel path having an input staging section, a testing section which is underneath the test head (14), and an output staging section; a means for transporting the boat in the travel path rom the input staging section, to the testing section and from the testing section to the output staging section; and a means for moving the boat vertically from the travel path to the test head.
Claim 7
Dependent Claim
151 words
A handler for testing a number of packaged semiconductor devices having a plurality of leads extending from each package, the handler comprising: a test head having a plurality of contacts extending therefrom, wherein each contact is for coupling to one of the leads and said test head having a number of test pockets for holding the packaged semiconductor devices during testing; a boat for carrying devices, wherein the boat has the same number of compartments as the number of packaged semiconductor devices; a boat travel path having an input staging section, a testing section which is underneath the test head (14), and an output staging section; a means for transporting the boat in the travel path rom the input staging section, to the testing section and from the testing section to the output staging section; and a means for moving the boat vertically from the travel path to the test head.
Claim 8
Dependent Claim
37 words
The handler of claim 5 wherein the means for transporting the boat further comprises a means for grasping the boat which fully constrains the boat in two dimensions and partially constrains the boat in a third dimension.
Claim 9
Dependent Claim
52 words
The handler of claim 5 wherein the means for transporting the boat further comprises a motor, a means for grasping the boat which is coupled to the motor such that when the motor moves in a first direction the means for grasping moves from the input staging section to the testing section.
Claim 10
Independent Claim
128 words
A method for testing a number of packaged semiconductor devices having a plurality of leads extending from each package, the method comprising: providing a test head having a plurality of contacts extending therefrom and said test head having a number of test pockets for holding the packaged semiconductor devices during testing; providing a boat having the same number of compartments as the number of packaged semiconductor devices; placing the number of packaged semiconductor devices in the number of compartments; aligning the boat to the test head; moving the boat towards the test head to couple the contacts to the plurality of leads; testing the plurality of packaged semiconductor devices; moving the boat away from the test head while forcing the packaged semiconductor devices to remain in the compartments.
Claim 11
Independent Claim
128 words
A method for testing a number of packaged semiconductor devices having a plurality of leads extending from each package, the method comprising: providing a test head having a plurality of contacts extending therefrom and said test head having a number of test pockets for holding the packaged semiconductor devices during testing; providing a boat having the same number of compartments as the number of packaged semiconductor devices; placing the number of packaged semiconductor devices in the number of compartments; aligning the boat to the test head; moving the boat towards the test head to couple the contacts to the plurality of leads; testing the plurality of packaged semiconductor devices; moving the boat away from the test head while forcing the packaged semiconductor devices to remain in the compartments.
Claim 12
Dependent Claim
90 words
The method of claim 8 further comprising: providing a boat travel path having an input staging section, a testing section which is adjacent to the test head, and an output staging section; grasping the boat in the input staging section; and moving the boat to the testing section, wherein the step of moving the boat towards the test head is performed by moving the boat off of the travel path and the step of moving the boat away from the test head comprises replacing the boat in the travel path.
Claim 13
Dependent Claim
113 words
The method of claim 8 further comprising: providing a boat travel path having an input staging section, a testing section which is adjacent to the test head, and an output staging section; providing a means for grasping the boat, wherein the means for grasping moves along the boat travel path; positioning the boat and the means for grasping in the input staging section; activating the means for grasping; moving the means for grasping from the input staging section to the testing section; deactivating the means for grasping after the step of moving the boat towards the test head; and moving the means for grasping from the testing section to the input staging section.
Claim 14
Dependent Claim
35 words
The method of claim 10 wherein the step of deactivating the means for grasping and the step of moving the means for grasping from the testing section to the input staging section are performed simultaneously.
Claim 15
Dependent Claim
22 words
The method of claim 10 wherein the boat is uncoupled from the means for grasping before the means for grasping is deactivated.
Claim 16
Dependent Claim
128 words
The method of claim 8 further comprising: providing the boat travel path having an input staging section, a testing section which is adjacent to the test head, and an output staging section; providing a means for grasping the boat, wherein the means for grasping moves along the boat travel path; positioning the means for grasping in the output staging section; moving the means for grasping from the output staging section to the testing section during the step of testing the plurality of packaged semiconductor devices; positioning the boat in the testing section of the travel path after the step of moving the boat away from the test head; activating the means for grasping; and moving the means for grasping from the testing section to the output staging section.
Claim 17
Independent Claim
234 words
A method for testing a number of semiconductor devices having a plurality of leads extending therefrom, the method comprising: providing a test head having a plurality of contacts extending therefrom and said test head having a number of test pockets for holding the packaged semiconductor devices during testing; providing a first boat having the same number of compartments as the number of semiconductor devices; providing a boat travel path having an input staging section, a testing section which is adjacent to the test head, and an output staging section; placing the number of semiconductor devices in the first boat; positioning the first boat in the input staging section; providing a first transport means moving between the input staging section and the testing section; attaching the first boat to the first transport means; indexing the first boat from the input staging section to the testing section; coupling the plurality of contacts to the plurality of leads; testing the semiconductor devices in the first boat positioning a second boat in the input staging section; returning the first transport means to the input staging section; attaching the second boat to the first transport means; providing a second transport means moving between the testing section and the output staging section; attaching the first boat to the second transport means; and simultaneously indexing the first boat to the output staging section and the second boat to the testing section.
Claim 18
Independent Claim
234 words
A method for testing a number of semiconductor devices having a plurality of leads extending therefrom, the method comprising: providing a test head having a plurality of contacts extending therefrom and said test head having a number of test pockets for holding the packaged semiconductor devices during testing; providing a first boat having the same number of compartments as the number of semiconductor devices; providing a boat travel path having an input staging section, a testing section which is adjacent to the test head, and an output staging section; placing the number of semiconductor devices in the first boat; positioning the first boat in the input staging section; providing a first transport means moving between the input staging section and the testing section; attaching the first boat to the first transport means; indexing the first boat from the input staging section to the testing section; coupling the plurality of contacts to the plurality of leads; testing the semiconductor devices in the first boat positioning a second boat in the input staging section; returning the first transport means to the input staging section; attaching the second boat to the first transport means; providing a second transport means moving between the testing section and the output staging section; attaching the first boat to the second transport means; and simultaneously indexing the first boat to the output staging section and the second boat to the testing section.
Claim 19
Dependent Claim
32 words
The method of claim 14 wherein the step of returning the first transport means to the input staging section occurs during the step of testing the semiconductor devices in the first boat.
Claim 20
Dependent Claim
31 words
The method of claim 14 further comprising the step of moving the second transport means to the testing section during the step of testing the semiconductor devices in the first boat.
Claim 21
Dependent Claim
47 words
The method of claim 14 wherein the step of coupling the plurality of contacts to the plurality of leads further comprises removing the first boat from the travel path and inserting the plurality of leads into the test head while the semiconductor devices remain in the boat.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1995-09-29 | 1996-03-30 | 1996-09-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1999-09-29 | 2000-03-30 | 2000-09-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2003-09-29 | 2004-03-30 | 2004-09-29 | $7700.00 | Window Closed / Lapsed |