US6414505B1
Expired / Lapsed
US
⏱️ 0.0 years remaining
Multiboard run-in tester for PCI expansions
Assignee: Hewlett Packard Development Co LP
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Filing: 1999-11-03
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Granted: 2002-07-02
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Expires: 2019-11-03
Abstract
Abstract A system for running in, in which multiple PCI bus connections are each bridged to multiple boards-under-test. The presence or absence of power in each of these bus connections is monitored, and the boards-under-test are correspondingly powered up (or not). Multiple test-bed subboards are preferably used, each with multiple sockets for receiving boards-under-test with high-insertion-force connectors, and the independent power control permits the boards-under-test on one subboard to be powered off and swapped while the boards-under-test on the other subboard are still being exercised. Preferable a single movable extractor mechanism is mounted on each subboard, and can be positioned (with respect to any one of the high-insertion-force connectors) for linear extraction of the board-under-test without any torque.
Inventors
- 👤 Titus D. Stauffer
- 👤 Walter J. Belmore
- 👤 Bryan A. Jones
- 👤 Haissam H. Haidar
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 22:49
CPC Classifications
G; G06; G06F; G06F1/00; G06F1/16; G06F1/18; G06F1/183; G06F1/185; G06F1/184; G06F1/186
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
108 words
A system for running in boards-under-test, the system comprising: a board having multiple bus connections thereon, for receiving the boards-under-test; and an extraction mechanism which is mechanically mounted to said board with a constrained motion which permits the mechanism to be oriented to a selected one of said bus connections, and contains one or more movable extractors which selectably apply force to remove the board-under-test from the selected one of said bus connections with a force which is substantially balanced, with respect to the selected bus connection, to not apply torque to the board-under-test; whereby boards-under-test can be swapped into and out of said bus connections for run-in.
Claim 2
Independent Claim
108 words
A system for running in boards-under-test, the system comprising: a board having multiple bus connections thereon, for receiving the boards-under-test; and an extraction mechanism which is mechanically mounted to said board with a constrained motion which permits the mechanism to be oriented to a selected one of said bus connections, and contains one or more movable extractors which selectably apply force to remove the board-under-test from the selected one of said bus connections with a force which is substantially balanced, with respect to the selected bus connection, to not apply torque to the board-under-test; whereby boards-under-test can be swapped into and out of said bus connections for run-in.
Claim 3
Dependent Claim
35 words
The system of claim 1 , further comprising circuitry for selectively powering down some but not all of said computer boards-under-test, whereby boards-under-test can be hot-swapped into and out of said bus connections for run-in.
Claim 4
Dependent Claim
162 words
A run-in tester comprising: a motherboard having multiple bus connector slots; a first bus bridge card inserted in a first bus connector slot on the motherboard; a second bus bridge card inserted in a second bus connector slot on the motherboard, wherein the second bus bridge card is taller than the first bus bridge card; a first add-on board connected to the first bus bridge card, wherein the first add-on board includes a first set of bus connector slots for receiving boards-under-test; a second add-on board connected to the second bus bridge card, wherein the second add-on board includes a second set of bus connector slots for receiving boards-under-test; and a power switch board coupled to the motherboard, the first add-on board, and the second add-on board, wherein upon system power-on, the power switch board is configured to provide power to the first and second add-on boards before power is supplied to the first and second bus connector slots on the motherboard.
Claim 5
Dependent Claim
162 words
A run-in tester comprising: a motherboard having multiple bus connector slots; a first bus bridge card inserted in a first bus connector slot on the motherboard; a second bus bridge card inserted in a second bus connector slot on the motherboard, wherein the second bus bridge card is taller than the first bus bridge card; a first add-on board connected to the first bus bridge card, wherein the first add-on board includes a first set of bus connector slots for receiving boards-under-test; a second add-on board connected to the second bus bridge card, wherein the second add-on board includes a second set of bus connector slots for receiving boards-under-test; and a power switch board coupled to the motherboard, the first add-on board, and the second add-on board, wherein upon system power-on, the power switch board is configured to provide power to the first and second add-on boards before power is supplied to the first and second bus connector slots on the motherboard.
Claim 6
Dependent Claim
36 words
The run-in tester of claim 3 , wherein the first and second bus bridge cards are tall enough to provide sufficient clearance between the motherboard and the add-on boards for use of remaining bus connector slots.
Claim 7
Dependent Claim
29 words
The run-in tester of claim 3 , wherein the first and second add-on boards each have an associated mechanical extractor configured to remove boards-under-test from respective bus connector slots.
Claim 8
Dependent Claim
98 words
The run-in tester of claim 3 , wherein the power switch board is coupled to the first and second bus connector slots on the motherboard to detect a power status for each of the first and second bus connector slots, wherein when the power status for a bus connector slot transitions from ON to OFF, the power switch board is configured to block power to the corresponding add-on board for a time, and to return power to the corresponding add-on board a predetermined time before the power status of the bus connector slot transitions from OFF to ON.
Claim 9
Dependent Claim
15 words
The run-in tester of claim 6 , wherein the predetermined time is approximately 15 seconds.
Claim 10
Dependent Claim
16 words
The run-in tester of claim 6 , wherein the predetermined time is greater than 1 second.
Claim 11
Dependent Claim
22 words
The run-in tester of claim 3 , wherein the first and second set of bus connector slots each consists of six slots.
Claim 12
Dependent Claim
74 words
The run-in tester of claim 5 , wherein each mechanical extractor includes: a pair of rails mounted transversely to the set of bus connector slots; an extractor body slidably mounted between the pair of rails; two mechanical fingers rotatably mounted to the extractor body via a rod, wherein the fingers move between a board-under-test and the add-on board and rotate to separate the board-under-test from the add-on board without applying torque to the board-under-test.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2005-07-01 | 2005-12-31 | 2006-07-02 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2009-07-01 | 2009-12-31 | 2010-07-02 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2013-07-01 | 2013-12-31 | 2014-07-02 | $7700.00 | Window Closed / Lapsed |