Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
79 words
A silicon-on-insulator (SOI) chip, comprising: a substrate; a buried oxide (BOX) layer disposed on the substrate; and an active layer disposed on the BOX layer, the active layer divided into a first and a second tile, the first tile having a first thickness and a plurality of partially depleted semiconductor devices formed therefrom, and the second tile having a second thickness and a plurality of fully depleted devices formed therefrom, the second thickness being smaller than the first thickness.
Claim 2
Dependent Claim
79 words
A silicon-on-insulator (SOI) chip, comprising: a substrate; a buried oxide (BOX) layer disposed on the substrate; and an active layer disposed on the BOX layer, the active layer divided into a first and a second tile, the first tile having a first thickness and a plurality of partially depleted semiconductor devices formed therefrom, and the second tile having a second thickness and a plurality of fully depleted devices formed therefrom, the second thickness being smaller than the first thickness.
Claim 3
Dependent Claim
24 words
The SOI chip according to claim 1 , wherein the partially depleted devices form digital circuitry and the fully depleted devices form analog circuitry.
Claim 4
Dependent Claim
20 words
The SOI chip according to claim 1 , wherein the first thickness is about 800 Å to about 1500 Å.
Claim 5
Dependent Claim
20 words
The SOI chip according to claim 1 , wherein the second thickness is about 500 Å to about 1000 Å.
Claim 6
Dependent Claim
35 words
The SOI chip according to claim 1 , wherein the active layer has an initially uniform thickness and the thickness of the active layer in the area of the second tile is reduced by etching.
Claim 7
Dependent Claim
36 words
The SOI chip according to claim 1 , wherein the active layer has an initially uniform thickness and the thickness of the active layer in the area of the first tile is increased by silicon deposition.
Claim 8
Dependent Claim
55 words
The SOI chip according to claim 1 , wherein the active layer has an initially uniform thickness and the thickness of the active layer in the area of the second tile is reduced by implanting oxygen to form a layer of silicon dioxide in a lower portion of the active layer adjacent the BOX layer.
Claim 9
Dependent Claim
33 words
The SOI chip according to claim 1 , wherein each partially depleted device has an active region that includes a source, a drain and a body disposed between the source and the drain.
Claim 10
Dependent Claim
27 words
The SOI chip according to claim 8 , wherein the active layer in the area of each body of the partially depleted devices has a uniform thickness.
Claim 11
Dependent Claim
38 words
The SOI chip according to claim 8 , wherein each fully depleted device has an active region that includes a source, a drain and a body disposed between the source and the drain of the fully depleted device.
Claim 12
Dependent Claim
27 words
The SOI chip according to claim 10 , wherein the active layer in the area of each body of the fully depleted devices has a uniform thickness.
Claim 13
Dependent Claim
56 words
The SOI chip according to claim 10 , wherein the active layer in the area of each body of the partially depleted devices has a uniform thickness proportional to the first thickness and the active layer in the area of each body of the fully depleted devices has a uniform thickness proportional to the second thickness.