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US6397160B1 Expired / Lapsed US ⏱️ 0.0 years remaining

Power sensor module for microwave test systems

Assignee: Teradyne Inc
•
Filing: 1999-06-04
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Granted: 2002-05-28
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Expires: 2019-06-04
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Abstract

Abstract A module for use in automatic test equipment is disclosed. The module is especially useful for performing power measurements on high frequency devices. The module includes a power sensor and a plurality of EEPROM's that store reflection coefficient data for the power sensor. Computerized control circuitry in the automatic test equipment uses the stored data to reduce impedance mismatch uncertainties in the power measurements.

Inventors

  • 👤 Thomas Michael Craig
  • 👤 Matthew Thomas Begg

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-08 14:57
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/282; G01R31/2822; G01R31/316; G01R31/3161; G01R31/3167; G01R35/00; G01R35/005

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 156 words
A method of constructing an automatic test system for compensating for errors in the testing of microwave components, comprising: (A) measuring a reflection coefficient Γ PS of a modular microwave power sensor; (B) storing the reflection coefficient Γ PS in a non-volatile memory provided with the modular microwave power sensor; (C) installing the modular microwave power sensor into the automatic test system; (D) measuring a plurality of S-parameters of the automatic test system; and (E) storing the plurality of S-parameters in the automatic test system so that they can be accessed in connection with the reflection coefficient Γ PS from the modular microwave power sensor to correct power measurements of devices under test, wherein the modular microwave power sensor is interchangeable with other substantially identical power sensors having different reflection coefficients Γ PS , for providing substantially the same accuracy as the modular microwave power sensor initially installed, without requiring re-calibration of the automatic test system.
Claim 2
Independent Claim 156 words
A method of constructing an automatic test system for compensating for errors in the testing of microwave components, comprising: (A) measuring a reflection coefficient Γ PS of a modular microwave power sensor; (B) storing the reflection coefficient Γ PS in a non-volatile memory provided with the modular microwave power sensor; (C) installing the modular microwave power sensor into the automatic test system; (D) measuring a plurality of S-parameters of the automatic test system; and (E) storing the plurality of S-parameters in the automatic test system so that they can be accessed in connection with the reflection coefficient Γ PS from the modular microwave power sensor to correct power measurements of devices under test, wherein the modular microwave power sensor is interchangeable with other substantially identical power sensors having different reflection coefficients Γ PS , for providing substantially the same accuracy as the modular microwave power sensor initially installed, without requiring re-calibration of the automatic test system.
Claim 3
Dependent Claim 72 words
A method as recited in claim 1 , further comprising: correcting power measurements made by the modular microwave power sensor by applying a correction factor, Γ PS, CORRECTED , which substantially equals S 22 +(S 21 S 12 Γ PS )/(1−Γ PS S 11 ), wherein S 11 , S 12 , S 21 , and S 22 are at least some of the plurality of S-parameters of the automatic test system.
Claim 4
Dependent Claim 76 words
A method as recited in claim 1 , further comprising: applying a test signal to a device under test; detecting a signal from the device under test, the detected signal being produced by the device under test in response to the applied test signal; and measuring a characteristic of the detected signal, comprising the substeps of (1) accessing data from the non-volatile memory, and (2) using the data accessed for reducing uncertainties in the characteristic measured.
Claim 5
Independent Claim 176 words
A method of constructing an automatic test system for compensating for errors in the testing of microwave components, comprising: (A) measuring a reflection coefficient Γ PS of a modular microwave power sensor; (B) storing the reflection coefficient Γ PS in a non-volatile memory provided with the modular microwave power sensor; (C) installing the modular microwave power sensor into the automatic test system; (D) measuring a plurality of S-parameters of the automatic test system; (E) storing the plurality of S-parameters in the automatic test system so that they can be accessed in connection with the reflection coefficient Γ PS from the modular microwave power sensor to correct power measurements of devices under test; and (F) correcting power measurements made by the modular microwave power sensor by applying a correction factor, Γ PS, CORRECTED , which substantially equals S 22 +(S 21 S 12 Γ PS )/(1−Γ PS S 11 ), wherein S 11 , S 12 , S 21 , and S 22 are at least some of the plurality of S-parameters of the automatic test system.
Claim 6
Independent Claim 176 words
A method of constructing an automatic test system for compensating for errors in the testing of microwave components, comprising: (A) measuring a reflection coefficient Γ PS of a modular microwave power sensor; (B) storing the reflection coefficient Γ PS in a non-volatile memory provided with the modular microwave power sensor; (C) installing the modular microwave power sensor into the automatic test system; (D) measuring a plurality of S-parameters of the automatic test system; (E) storing the plurality of S-parameters in the automatic test system so that they can be accessed in connection with the reflection coefficient Γ PS from the modular microwave power sensor to correct power measurements of devices under test; and (F) correcting power measurements made by the modular microwave power sensor by applying a correction factor, Γ PS, CORRECTED , which substantially equals S 22 +(S 21 S 12 Γ PS )/(1−Γ PS S 11 ), wherein S 11 , S 12 , S 21 , and S 22 are at least some of the plurality of S-parameters of the automatic test system.
Claim 7
Independent Claim 104 words
A method of constructing an automatic test system for compensating for errors in the testing of microwave components, comprising: (A) measuring a reflection coefficient Γ PS of a modular microwave power sensor; (B) storing the reflection coefficient Γ PS in a non-volatile memory provided with the modular microwave power sensor; and (C) installing the modular microwave power sensor into the automatic test system, wherein the modular microwave power sensor is interchangeable with other substantially identical power sensors having different reflection coefficients Γ PS , for providing substantially the same accuracy as the power sensor initially installed, without requiring re-calibration of the automatic test system.
Claim 8
Independent Claim 104 words
A method of constructing an automatic test system for compensating for errors in the testing of microwave components, comprising: (A) measuring a reflection coefficient Γ PS of a modular microwave power sensor; (B) storing the reflection coefficient Γ PS in a non-volatile memory provided with the modular microwave power sensor; and (C) installing the modular microwave power sensor into the automatic test system, wherein the modular microwave power sensor is interchangeable with other substantially identical power sensors having different reflection coefficients Γ PS , for providing substantially the same accuracy as the power sensor initially installed, without requiring re-calibration of the automatic test system.

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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2005-05-27 2005-11-26 2006-05-28 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2009-05-27 2009-11-26 2010-05-28 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2013-05-27 2013-11-26 2014-05-28 $7700.00 Window Closed / Lapsed

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