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US6348376B2
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Method of forming metal nitride film by chemical vapor deposition and method of forming metal contact and capacitor of semiconductor device using the same
Assignee: Samsung Electronics Co Ltd
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Filing: 2001-01-19
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Granted: 2002-02-19
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Expires: 2021-01-19
Abstract
Abstract A method of forming a metal nitride film using chemical vapor deposition (CVD), and a method of forming a metal contact and a semiconductor capacitor of a semiconductor device using the same, are provided. The method of forming a metal nitride film using chemical vapor deposition (CVD) in which a metal source and a nitrogen source are used as a precursor, includes the steps of inserting a semiconductor substrate into a deposition chamber, flowing the metal source into the deposition chamber, removing the metal source remaining in the deposition chamber by cutting off the inflow of the metal source and flowing a purge gas into the deposition chamber, cutting off the purge gas and flowing the nitrogen source into the deposition chamber to react with the metal source adsorbed on the semiconductor substrate, and removing the nitrogen source remaining in the deposition chamber by cutting off the inflow of the nitrogen source and flowing the purge gas into the deposition chamber. Accordingly, the metal nitride film having low resistivity and a low content of Cl even with excellent step coverage can be formed at a temperature of 500° C. or lower, and a semiconductor capacitor having excellent leakage current characteristics can be manufactured. Also, a deposition speed, approximately 20 A/cycle, is suitable for mass production.
Inventors
- 👤 Hyun-Seok Lim
- 👤 Sang-Bom Kang
- 👤 In-Sang Jeon
- 👤 Gil-heyun Choi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 01:24
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/032; H10W20/033; C; C23; C23C; C23C16/00; C23C16/22; C23C16/30; C23C16/34; C23C16/44; C23C16/455; C23C16/45523; C23C16/45525; C23C16/45553; H10P; H10P14/00; H10P14/40; H10P14/42; H10P14/43; H10P14/432; H10W20/071; H10W20/081; H10W20/082; H10D; H10D1/00; H10D1/01; H10D1/041; H10D1/042; H10D1/60; H10D1/68; H10D1/692; H10D1/711; H10D1/716
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
175 words
A method of forming a semiconductor capacitor by sequentially forming a lower conductive layer, a dielectric film and an upper conductive layer on the underlayer of a semiconductor substrate, wherein the process for forming a lower conductive layer and/or an upper conductive layer comprises the steps of: (a) inserting a semiconductor substrate on which the underlayer on the dielectric film is formed, into a deposition chamber; (b) admitting a metal source into the deposition chamber (c) chemisorbing a first portion of the metal source onto the substrate, and physisorbing a second portion of the metal source onto the substrate; (d) purging the metal source from the deposition chamber; (e) admitting a nitrogen source into the deposition chamber; (f) chemisorbing a first portion of the nitrogen source onto the substrate, and physisorbing a second portion of the nitrogen source onto the substrate; (g) reacting the chemisorbed and physisorbed metal source with the chemisorbed and physisorbed nitrogen source to form a metal nitride film on the substrate; and (h) purging the nitrogen source from the deposition chamber.
Claim 2
Independent Claim
175 words
A method of forming a semiconductor capacitor by sequentially forming a lower conductive layer, a dielectric film and an upper conductive layer on the underlayer of a semiconductor substrate, wherein the process for forming a lower conductive layer and/or an upper conductive layer comprises the steps of: (a) inserting a semiconductor substrate on which the underlayer on the dielectric film is formed, into a deposition chamber; (b) admitting a metal source into the deposition chamber (c) chemisorbing a first portion of the metal source onto the substrate, and physisorbing a second portion of the metal source onto the substrate; (d) purging the metal source from the deposition chamber; (e) admitting a nitrogen source into the deposition chamber; (f) chemisorbing a first portion of the nitrogen source onto the substrate, and physisorbing a second portion of the nitrogen source onto the substrate; (g) reacting the chemisorbed and physisorbed metal source with the chemisorbed and physisorbed nitrogen source to form a metal nitride film on the substrate; and (h) purging the nitrogen source from the deposition chamber.
Claim 3
Dependent Claim
113 words
The method as claimed in claim 1 , wherein the metal source is selected from the group consisting of TiCl 4 , TiCl 3 , TiI 4 , TiBr 2 , TiF 4 , (C 5 H 5 ) 2 TiCl 2 , ((CH 3 ) 5 C 5 ) 2 TiCl 2 , C 5 H 5 TiCl 3 , C 9 H 10 BCl 3 N 6 Ti, C 9 H 7 TiCl 3 , (C 5 (CH 3 ) 5 )TiCl 3 , TiCl 4 (NH 3 ) 2 , and (CH 3 ) 5 C 5 Ti(CH 3 ) 3 , and the nitrogen source is NH 3 .
Claim 4
Dependent Claim
37 words
The method as claimed in claim 2 , wherein the deposition temperature in the steps (b) through (h) is between 400° C. and 500° C., and the pressure in the deposition chamber is 1 to 20 torr.
Claim 5
Dependent Claim
27 words
The method as claimed in claim 1 , wherein TDEAT or TDMAT is used as the metal source, and NH 3 is used as the nitrogen source.
Claim 6
Dependent Claim
37 words
The method as claimed in claim 4 , wherein the deposition temperature in the steps (b) through (h) is between 250° C. and 400° C. and the pressure in the deposition chamber is 0.1 to 10 torr.
Claim 7
Dependent Claim
52 words
The method as claimed in claim 1 , wherein a material selected from the group consisting of TaBr 5 , TaCl 5 , TaF 5 , TaI 5 , and(C 5 (CH 3 ) 5 )TaCl 4 is used as the metal source, and NH 3 is used as the nitrogen source.
Claim 8
Dependent Claim
36 words
The method as claimed in claim 6 , wherein the deposition temperature in the steps (b) through (h) is between 400° C. and 500° C., and the pressure in the deposition chamber is 1 to 20torr.
Claim 9
Dependent Claim
18 words
The method as claimed in claim 1 , wherein the purge gas is Ar or N 2 .
Claim 10
Dependent Claim
52 words
The method as claimed in claim 1 , wherein 1-5 sccm of the metal source flows into the deposition chamber for 1 to 10 seconds, 5-200 sccm of the nitrogen source flows thereinto for 1 to 10 seconds, and 10-200 sccm of the purge gas flows thereinto for 1 to 10 seconds.
Claim 11
Dependent Claim
51 words
The method as claimed in claim 1 , wherein an atmospheric gas, which is at least one selected from the group consisting of Ar, He and N 2 , is continuously flowed into the deposition chamber during the steps (b) through (h), to maintain a constant pressure in the deposition chamber.
Claim 12
Dependent Claim
27 words
The method as claimed in claim 1 , wherein the thickness of the lower and/or upper conductive layer is controlled by repeating the steps (b) through (h).
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2005-02-18 | 2005-08-20 | 2006-02-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2009-02-18 | 2009-08-20 | 2010-02-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2013-02-18 | 2013-08-20 | 2014-02-19 | $7700.00 | Window Closed / Lapsed |