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US6329282B1 Expired / Lapsed US ⏱️ 0.0 years remaining

Method of improving the texture of aluminum metallization for tungsten etch back processing

Assignee: Texas Instruments Inc
•
Filing: 1999-07-08
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Granted: 2001-12-11
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Expires: 2019-07-08
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Abstract

Abstract A method of making connection between an aluminum or aluminum based material and tungsten. The method includes providing an underlying region containing a layer of tungsten thereover. The underlying region is preferably a layer of titanium over which is a layer of titanium nitride. The layer of tungsten is etched back to the underlying region while exposed tungsten is retained over a portion of the underlying region. The underlying region also may contain a via therein which contains the exposed tungsten. An nitrogen-containing plasma, preferably elemental nitrogen, is then applied to the exposed tungsten and exposed underlying region and a layer of a barrier material is formed by reaction of the nitrogen in the plasma and the tungsten over the exposed tungsten. A further barrier layer, preferably titanium nitride, is optionally then applied followed by a layer of aluminum over the exposed surface, the barrier layer isolating the layer of aluminum from the tungsten. Plasma is preferably an argon/nitrogen plasma.

Inventors

  • 👤 Wei-Yung Hsu
  • 👤 Qi-Zhong Hong

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 11:03
CPC Classifications
H; H10; H10P; H10P95/00; H10P95/04; H10W; H10W20/00; H10W20/01; H10W20/031; H10W20/032; H10W20/033; H10W20/037; H10W20/055; H10W20/056

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 71 words
A method of aluminum crystal orientation control, comprising: (a) providing a surface including a first portion consisting essentially of tungsten and a second portion consisting essentially of titanium nitride; (b) exposing said surface to a nitrogen-containing plasma; (c) forming an aluminum layer over the surface; (d) whereby the exposing of step (b) removes contaminants and thereby controls the crystal orientation of the aluminum over both the tungsten and the titanium nitride.
Claim 2
Independent Claim 71 words
A method of aluminum crystal orientation control, comprising: (a) providing a surface including a first portion consisting essentially of tungsten and a second portion consisting essentially of titanium nitride; (b) exposing said surface to a nitrogen-containing plasma; (c) forming an aluminum layer over the surface; (d) whereby the exposing of step (b) removes contaminants and thereby controls the crystal orientation of the aluminum over both the tungsten and the titanium nitride.
Claim 3
Dependent Claim 46 words
The method of claim 1 , further comprising: (a) forming a barrier layer on the surface after the exposing of step (b) of claim 1 ; and (b) the forming an aluminum layer of step (c) of claim 1 is depositing aluminum on the barrier layer.
Claim 4
Dependent Claim 14 words
The method of claim 2 , wherein: (a) the barrier layer is titanium nitride.

References Cited (Backward Citations)

US5318924A Cited
US5780908A Cited
US6069072A Cited
US6159851A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2004-12-10 2005-06-11 2005-12-11 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2008-12-10 2009-06-11 2009-12-11 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2012-12-10 2013-06-11 2013-12-11 $7700.00 Window Closed / Lapsed

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