Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
236 words
A method for fabricating a hybrid optical integrated circuit, the method comprising the steps of: a) providing a SOI wafer including a silicon substrate, a buried insulating layer and a single crystal silicon layer; b) selectively etching the single crystal silicon layer, thereby forming a SOI slab; c) forming a silicon nitride layer and an etching mask layer on the resulting structure, wherein the silicon nitride layer is formed by a low pressure chemical vapor deposition process; d) selectively etching the etching mask layer and the silicon nitride layer to expose the single crystal silicon layer in the SOI slab except a rib area and simultaneously forming a V-groove etch window for aligning an optical fiber and marks for aligning an optical device, wherein the a rib region in the SOI slab is covered with the silicon nitride layer and the etching mask layer; e) selectively etching the exposed single crystal silicon layer to form a SOI rib; f) selectively etching the etching mask layer and the silicon nitride layer on the SOI rib; g) forming a cladding layer for an optical waveguide on a surface of the SOI slab and the SOI rib; h) anisotropically etching the silicon substrate exposed through the V-groove etch window to form an optical fiber guiding V-groove; and i) selectively removing the etching mask layer positioned at both end facets of the SOI slab and exposing the silicon nitride layer.
Claim 2
Independent Claim
236 words
A method for fabricating a hybrid optical integrated circuit, the method comprising the steps of: a) providing a SOI wafer including a silicon substrate, a buried insulating layer and a single crystal silicon layer; b) selectively etching the single crystal silicon layer, thereby forming a SOI slab; c) forming a silicon nitride layer and an etching mask layer on the resulting structure, wherein the silicon nitride layer is formed by a low pressure chemical vapor deposition process; d) selectively etching the etching mask layer and the silicon nitride layer to expose the single crystal silicon layer in the SOI slab except a rib area and simultaneously forming a V-groove etch window for aligning an optical fiber and marks for aligning an optical device, wherein the a rib region in the SOI slab is covered with the silicon nitride layer and the etching mask layer; e) selectively etching the exposed single crystal silicon layer to form a SOI rib; f) selectively etching the etching mask layer and the silicon nitride layer on the SOI rib; g) forming a cladding layer for an optical waveguide on a surface of the SOI slab and the SOI rib; h) anisotropically etching the silicon substrate exposed through the V-groove etch window to form an optical fiber guiding V-groove; and i) selectively removing the etching mask layer positioned at both end facets of the SOI slab and exposing the silicon nitride layer.
Claim 3
Dependent Claim
31 words
The method in accordance with claim 1 , wherein the method further comprises the step of forming a trench crossing the optical fiber guiding V-groove, being adjacent to the SOI slab.
Claim 4
Dependent Claim
38 words
The method in accordance with claim 1 , wherein the step g) further comprises the step of forming a metal pad for electrically connecting the optical device to the SOI wafer and a metal pad for solder bumps.
Claim 5
Dependent Claim
20 words
The method in accordance with claim 3 , wherein the method further comprises the step of forming the solder bumps.
Claim 6
Dependent Claim
17 words
The method in accordance with claim 1 , wherein the SOI slab is in a Y-branch type.
Claim 7
Dependent Claim
14 words
The method in accordance with claim 1 , wherein the SOI rib is tapered.
Claim 8
Dependent Claim
43 words
The method in accordance with claim 1 , wherein the silicon nitride layer is formed by a LPCVD (low pressure chemical vapor deposition) method and a thickness (t) of the silicon nitride layer is given by: t=nλ/ 4 (λ: wavelength and n: integer)
Claim 9
Dependent Claim
24 words
The method in accordance with claim 1 , wherein the cladding layer is a silicon oxide layer which is formed by a thermal oxidation.
Claim 10
Dependent Claim
58 words
The method in accordance with claim 1 , wherein a ratio of a height of the SOI rib to a thickness of the single crystal silicon layer and a ratio of the height of the SOI rib to a width of the SOI rib are controlled to transmit only one fundamental mode in a vertical and horizontal direction.
Claim 11
Dependent Claim
18 words
The method in accordance with claim 1 , wherein the single crystal silicon layer has a <100> direction.
Claim 12
Dependent Claim
38 words
The method in accordance with claim 10 , wherein the SOI rib and the V-groove etch window are aligned in the <110> direction so that the V-groove etch window is surrounded with a surface of (111) crystalline plane.