Automated test system and method for device having circuit and ground connections

Claim 2

An automated test system for testing a device, the device having a circuit connection and a ground connection, the automated test system comprising: a processor operable to generate a control signal that includes a set of test parameters, the processor further operable to generate a discharge control signal upon completion of a test; a test apparatus comprising a first connection operable to be connected to the circuit connection of the device and a second connection operable to be connected to receive the control signal including the set of test parameters from the processor, the test apparatus operable to perform a first test based on the set of test parameters; and a discharge circuit external to the test apparatus and coupled to the processor, the discharge circuit operable to be coupled to the ground connection and the circuit connection of the device, the discharge circuit operable to provide a discharge path for charge stored between the ground connection and the circuit connection during said first test upon receipt of the discharge control signal from the processor.

Claim 3

The automated test system of claim 1 wherein the discharge path of the discharge circuit further includes a shunt resistor.

Claim 4

The automated test system of claim 2 wherein the shunt resistor is a 32K ohm resistor.

Claim 5

The automated test system of claim 2 wherein the shunt resistor has a capacity of at least approximately 50 watts.

Claim 6

The automated test system of claim 1 wherein the discharge circuit further includes a relay, and wherein said relay is operable to provide a discharge path between the ground connection and the circuit connection upon receipt of the discharge control signal from the processor.

Claim 7

The automated test system of claim 5 wherein the relay further comprises: a coil operably connected to receive the discharge control signal; and a contact operable to close to provide a discharge path between the ground connection and the circuit connection responsive to the coil receiving the discharge control signal.

Claim 8

The automated test system of claim 5 wherein the discharge path includes a shunt resistor.

Claim 9

The automated test system of claim 1 wherein the test apparatus further includes an internal discharge circuit.

Claim 10

The automated test system of claim 1 wherein: the test apparatus is further operable to stop operations if the test apparatus detects an unsafe condition; the test apparatus is further operable to provide a signal to the processor signifying that the test apparatus has stopped operations; and the processor is further operable to provide the discharge control signal responsive to receiving the signal signifying that the test apparatus has stopped operations.

Claim 11

The automated test system of claim 9 wherein: the test apparatus further includes a third connection for coupling to a chassis connection of the device; and the test apparatus is further operable to stop operations if the test apparatus detects an unsafe condition in the form of a discontinuity between the third connection and the second connection.

Claim 12

The automated test system of claim 1 wherein: the test apparatus is further operable to stop performing the first test if the test apparatus detects an unsafe condition.

Claim 15

The method of claim 12 wherein step b) further comprises providing a signal to a processor responsive to said automatic detection of the discontinuity, and step c) further comprises employing the processor, responsive to the signal, to automatically cause the discharge path external to the test apparatus to be connected between the circuit connection and the ground connection.

Claim 16

The method of claim 12 further comprising a step of coupling a barrier circuit to the test apparatus, the barrier circuit operable to detect movement in the vicinity of the device, the barrier circuit operably connected to cause the test apparatus to detect a discontinuity between the first connection and the second connection upon detection of movement in the vicinity of the device.

Claim 17

An automated test system for testing a device, the device having a circuit connection and a ground connection, the automated test system comprising: a processor operable to generate a control signal that includes a set of test parameters, the processor further operable to generate a discharge control signal; a test apparatus comprising a first connection operable to be connected to the circuit connection of the device and a second connection operable to be connected to the ground connection of the device, the test apparatus further operably connected to receive the control signal including the set of test parameters from the processor, the test apparatus operable to perform a first test based on the set of test parameters; and a discharge circuit external to the test apparatus and coupled to the processor, the discharge circuit operable to be coupled to the ground connection and the circuit connection of the device, the discharge circuit operable to provide a discharge path between the ground connection and the circuit connection upon receipt of the discharge control signal from the processor; a barrier circuit operable to detect movement in the vicinity of the device, the barrier circuit operably connected to cause the test apparatus to stop performing the first test on the device upon detection of movement in the vicinity of the device; and wherein the processor is further operable to generate the discharge control signal when the test apparatus stops performing the first test.

Claim 18

An automated test system for testing a device, the device having a circuit connection and a ground connection, the automated test system comprising: a processor operable to generate a control signal that includes a set of test parameters, the processor further operable to generate a discharge control signal; a test apparatus comprising a first connection operable to be connected to the circuit connection of the device and a second connection operable to be connected to the ground connection of the device, the test apparatus further operably connected to receive the control signal including the set of test parameters from the processor, the test apparatus operable to perform a first test based on the set of test parameters; and a discharge circuit external to the test apparatus and coupled to the processor, the discharge circuit operable to be coupled to the ground connection and the circuit connection of the device, the discharge circuit operable to provide a discharge path between the ground connection and the circuit connection upon receipt of the discharge control signal from the processor; a barrier circuit operable to detect movement in the vicinity of the device, the barrier circuit operably connected to cause the test apparatus to stop performing the first test on the device upon detection of movement in the vicinity of the device; and wherein the processor is further operable to generate the discharge control signal when the test apparatus stops performing the first test.

Claim 19

The automated test system of claim 15 wherein the discharge circuit further includes a relay, and wherein said relay is operable to provide a discharge path between the ground connection and the circuit connection upon receipt of the discharge control signal from the processor.

Claim 20

The automated test system of claim 16 wherein the relay further comprises: a coil operably connected to receive the discharge control signal; a contact operable to close to provide a discharge path between the ground connection and the circuit connection responsive to the coil receiving the discharge control signal.

Claim 21

The automated test system of claim 16 wherein the discharge path includes a shunt resistor.

Claim 22

The automated test system of claim 15 wherein the test apparatus further includes an internal discharge circuit.

Claim 23

The automated test system of claim 15 wherein: the test apparatus further includes a third connection for coupling to a chassis connection of the device; and the test apparatus is further operable to stop performing the first test if the test apparatus detects a discontinuity between the third connection and the second connection.

Claim 24

The automated test system of claim 20 wherein the barrier circuit is operable to cause a discontinuity between the third connection and the second connection upon detection of movement in the vicinity of the device.

Claim 25

The automated test system of claim 21 wherein the barrier circuit comprises: an optical transmitter operable to generate a light beam; an optical receiver operable to receive a light beam and generate a detection signal indicative of whether the optical receiver is receiving the light beam; at least one reflecting device configured to reflect a light beam generated by the optical transmitter to the optical receiver in a path that defines at least a portion of a perimeter around a first location that includes the device; and a control device operably connected to the optical receiver to obtain the reception signal, said control device further operable to cause the test apparatus to stop performing the first test when said detection signal indicates that the optical receiver is not receiving the light beam.

Claim 26

An automated test system for testing a device, the device having a circuit connection and a ground connection, the automated test system comprising a storage device operable to store a plurality of sets of test parameters, the storage device further operable to store a plurality of product model identifiers, each product model identifier associated with one of the plurality of sets of test parameters; an input device for obtaining input from an operator defining a first product model identifier from the plurality of product model identifiers; a processor, coupled to the input device and the storage device, the processor operable to receive the input from the input device and retrieve a set of test parameters associated with the first product model identifier from the storage device based on the input, generate a control signal that includes the retrieved set of test parameters, and generate a discharge control signal upon completion of a test; a test apparatus further comprising a first connection operable to be connected to the circuit connection of the device and a second connection operable to be connected to the ground connection of the device, the test apparatus further operably connected to receive the control signal including the retrieved set of test parameters from the processor, the test apparatus operable to perform a first test based on the retrieved set of test parameters; and a discharge circuit external to the test apparatus and coupled to the processor, the discharge apparatus operable to be coupled to the ground connection and the circuit connection of the device, the discharge circuit operable to provide a discharge path between the ground connection and the circuit connection upon receipt of the discharge control signal from the processor.

Claim 27

An automated test system for testing a device, the device having a circuit connection and a ground connection, the automated test system comprising a storage device operable to store a plurality of sets of test parameters, the storage device further operable to store a plurality of product model identifiers, each product model identifier associated with one of the plurality of sets of test parameters; an input device for obtaining input from an operator defining a first product model identifier from the plurality of product model identifiers; a processor, coupled to the input device and the storage device, the processor operable to receive the input from the input device and retrieve a set of test parameters associated with the first product model identifier from the storage device based on the input, generate a control signal that includes the retrieved set of test parameters, and generate a discharge control signal upon completion of a test; a test apparatus further comprising a first connection operable to be connected to the circuit connection of the device and a second connection operable to be connected to the ground connection of the device, the test apparatus further operably connected to receive the control signal including the retrieved set of test parameters from the processor, the test apparatus operable to perform a first test based on the retrieved set of test parameters; and a discharge circuit external to the test apparatus and coupled to the processor, the discharge apparatus operable to be coupled to the ground connection and the circuit connection of the device, the discharge circuit operable to provide a discharge path between the ground connection and the circuit connection upon receipt of the discharge control signal from the processor.

Claim 28

The system of claim 23 wherein the test apparatus is further operably connected to obtain test measurement data.

Claim 29

The system of claim 24 wherein the test apparatus is further operably connected to provide a test result signal including information representative of the test measurement data to the processor.

Claim 30

The system of claim 25 further comprising a display connected to the processor, the display operable to display information based on said information representative of the test measurement data.

Claim 31

The automated test system of claim 23 wherein the discharge circuit further includes a relay, and wherein said relay is operable to provide a discharge path between the ground connection and the circuit connection upon receipt of the discharge control signal from the processor.

Claim 32

The automated test system of claim 27 wherein the discharge path includes a shunt resistor.

Claim 33

The automated test system of claim 23 wherein the relay further comprises: a coil operably connected to receive the discharge control signal; and a contact operable to close to provide a discharge path between the ground connection and the circuit connection responsive to the coil receiving the discharge control signal.

Claim 34

The automated test system of claim 23 wherein the test apparatus further includes an internal discharge circuit.