US6274516B1 — Process for manufacturing interlayer insulating f…

Claim 1

Independent Claim 92 words

A process for forming an interlayer insulating film using an SOG film, said process comprising the steps of: forming a first inorganic SOG film having a thickness in the range between 50 nm and 400 nm, on a substrate; irradiating the first inorganic SOG film with ultraviolet light in an atmosphere containing oxygen components to generate ozone and active oxygen atoms in order to irradiate the SOG film with the atoms; and further forming a second inorganic SOG film, having a thickness in the range between 50 nm and 400 nm, thereon.

Claim 2

Dependent Claim 92 words

A process for forming an interlayer insulating film using an SOG film, said process comprising the steps of: forming a first inorganic SOG film having a thickness in the range between 50 nm and 400 nm, on a substrate; irradiating the first inorganic SOG film with ultraviolet light in an atmosphere containing oxygen components to generate ozone and active oxygen atoms in order to irradiate the SOG film with the atoms; and further forming a second inorganic SOG film, having a thickness in the range between 50 nm and 400 nm, thereon.

Claim 3

Dependent Claim 29 words

A process for forming an interlayer insulating film according to claim 1 , wherein the inorganic SOG film is formed between a first and a second interlayer insulating films.

Claim 4

Dependent Claim 25 words

A process for forming an interlayer insulating film according to claim 1 or 2 , wherein said inorganic SOG film does not contain phosphorous (P).

Claim 5

Dependent Claim 87 words

In a process for forming an interlayer insulating film using an SOG film according to claim 1 , a process for manufacturing the interlayer insulating film comprising the steps of: emitting ultraviolet light in an atmosphere containing oxygen components to generate ozone and active oxygen atoms in order to perform said step of irradiating the first inorganic SOG film with the atoms; and further forming the second inorganic SOG film thereon to reduce or eliminate steps or voids on an element separation and an element formation regions.

Claim 6

Dependent Claim 87 words

In a process for forming an interlayer insulating film using an SOG film according to claim 1 , a process for manufacturing the interlayer insulating film comprising the steps of: emitting ultraviolet light in an atmosphere containing oxygen components to generate ozone and active oxygen atoms in order to perform said step of irradiating the first inorganic SOG film with the atoms, thereby cutting hydrogen radicals off from the top surface layer of the first inorganic SOG film; and further forming the second inorganic SOG film thereon.

Claim 7

Dependent Claim 26 words

A process for forming an interlayer insulating film according to claim 1 , wherein the wavelength of said ultraviolet light is between 100 and 300 nm.

Claim 8

Dependent Claim 70 words

A process for forming an interlayer insulating film using an SOG film, said process comprising the steps of: forming a first inorganic SOG film having a thickness in the range between 50 nm and 400 nm, on a substrate; irradiating the first inorganic SOG film with O 2 plasma; and further forming a second inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon.

Claim 9

Dependent Claim 70 words

A process for forming an interlayer insulating film using an SOG film, said process comprising the steps of: forming a first inorganic SOG film having a thickness in the range between 50 nm and 400 nm, on a substrate; irradiating the first inorganic SOG film with O 2 plasma; and further forming a second inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon.

Claim 10

Dependent Claim 86 words

A process for forming an interlayer insulating film using an SOG film, said process comprising the steps of: forming a first inorganic SOG film having a thickness in the range between 50 nm and 400 nm, on a substrate; irradiating the first inorganic SOG film with O 2 plasma; and further forming a second inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon to reduce or eliminate steps or voids on an element separation and an element formation regions.

Claim 11

Dependent Claim 86 words

A process for forming an interlayer insulating film using an SOG film, said process comprising the steps of: forming a first inorganic SOG film having a thickness in the range between 50 nm and 400 nm, on a substrate; irradiating the first inorganic SOG film with O 2 plasma; and further forming a second inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon to reduce or eliminate steps or voids on an element separation and an element formation regions.

Claim 12

Dependent Claim 43 words

A process for forming an interlayer insulating film according to claim 7 or 8 , wherein the first inorganic SOG film is irradiated with O 2 plasma to cut hydrogen radicals off from the top surface layer of the first inorganic SOG film.

Claim 13

Dependent Claim 51 words

A process for forming an interlayer insulating film according to claim 1 , wherein an interval of metal wirings covered with the interlayer insulating film is between 0.3 and 4.0 μm and wherein an amount of concavity in the insulating film on an element separation region is 1.5 μm or less.

Claim 14

Dependent Claim 34 words

A process for manufacturing an interlayer insulating film according to claim 1 , wherein said step for forming the inorganic SOG film is repeated to form three or more layers of inorganic SOG films.

Claim 15

Dependent Claim 37 words

A method for manufacturing a display apparatus including a semiconductor device having an interlayer insulating film, wherein: said interlayer insulating film is formed by the process for forming an interlayer insulating film according to claim 1 .

Claim 16

Dependent Claim 68 words

A process for forming an interlayer insulating film for a semiconductor device, said process comprising repeating a step of forming an insulating film on a metal wiring and a step of forming an inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon to form an interlayer insulating film consisting of a multilayer structure including the insulating films and inorganic SOG films.

Claim 17

Dependent Claim 68 words

A process for forming an interlayer insulating film for a semiconductor device, said process comprising repeating a step of forming an insulating film on a metal wiring and a step of forming an inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon to form an interlayer insulating film consisting of a multilayer structure including the insulating films and inorganic SOG films.

Claim 18

Dependent Claim 45 words

A process according to claim 13 , wherein the step of forming said inorganic SOG film has the steps of forming the inorganic SOG film, irradiating the inorganic SOG film with a UV light or O 2 plasma, and forming the inorganic SOG film again.

Claim 19

Dependent Claim 83 words

A process for forming an interlayer insulating film for a semiconductor device, said process comprising forming a first insulating film on a metal wiring, forming a first inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon, further forming a second insulating film thereon, forming a second inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon, and further forming a third insulating film thereon to form the interlayer insulating film.

Claim 20

Dependent Claim 83 words

A process for forming an interlayer insulating film for a semiconductor device, said process comprising forming a first insulating film on a metal wiring, forming a first inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon, further forming a second insulating film thereon, forming a second inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon, and further forming a third insulating film thereon to form the interlayer insulating film.

Claim 21

Dependent Claim 110 words

A process for forming an interlayer insulating film for a semiconductor device, said process comprising forming a first insulating film on a metal wiring, forming a first inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon, irradiating the first SOG film with a UV light, further forming a second inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon, forming a second insulating film thereon, further forming a third inorganic SOG film having a thickness in the range between 50 nm and 400 nm, and forming a third insulating film thereon to form the interlayer insulating film.

Claim 22

Dependent Claim 110 words

A process for forming an interlayer insulating film for a semiconductor device, said process comprising forming a first insulating film on a metal wiring, forming a first inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon, irradiating the first SOG film with a UV light, further forming a second inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon, forming a second insulating film thereon, further forming a third inorganic SOG film having a thickness in the range between 50 nm and 400 nm, and forming a third insulating film thereon to form the interlayer insulating film.

Claim 23

Dependent Claim 113 words

A process for forming an interlayer insulating film for a semiconductor device, said process comprising forming a first insulating film on a metal wiring, further forming a first inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon, irradiating the film with SOG film with O 2 plasma, forming a second inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon again, forming a second insulating film thereon, further forming a third inorganic SOG film having a thickness in the range between 50 nm and 400 nm, and further forming a third insulating film thereon to form the interlayer insulating film.

Claim 24

Dependent Claim 113 words

A process for forming an interlayer insulating film for a semiconductor device, said process comprising forming a first insulating film on a metal wiring, further forming a first inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon, irradiating the film with SOG film with O 2 plasma, forming a second inorganic SOG film having a thickness in the range between 50 nm and 400 nm, thereon again, forming a second insulating film thereon, further forming a third inorganic SOG film having a thickness in the range between 50 nm and 400 nm, and further forming a third insulating film thereon to form the interlayer insulating film.

Claim 25

Dependent Claim 43 words

A process for forming a semiconductor device according to any of claims 13 to 17 , wherein a film stress of the insulating film over and/or under the inorganic SOG film acts in a direction opposite to that in the inorganic SOG film.

Claim 26

Dependent Claim 39 words

A process for forming a semiconductor device according to claim 14 or 16 , wherein the UV light is provided in an atmosphere containing O 2 components and wherein its wavelength is either 172 or 185 or 254 nm.

Claim 27

Dependent Claim 52 words

A process for forming a semiconductor device according to claim 13 , wherein the process has the steps of forming a contact opening and forming a wiring section, and wherein: the diameter of the contact opening is between 0.6 and 1.2 μm and a wiring interval is between 0.5 and 1.5 μm.

Annuity Stage	Window Opens	Payment Deadline	Surcharge Period Until	Estimated Fee	Status
3.5 Years (Year 4)	2004-08-13	2005-02-12	2005-08-14	$2000.00	Window Closed / Lapsed
7.5 Years (Year 8)	2008-08-13	2009-02-12	2009-08-14	$3760.00	Window Closed / Lapsed
11.5 Years (Year 12)	2012-08-13	2013-02-12	2013-08-14	$7700.00	Window Closed / Lapsed

Process for manufacturing interlayer insulating film and display apparatus using this film and its manufacturing method

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