US6100104A
Expired / Lapsed
US
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Method for fabricating a plurality of semiconductor bodies
Assignee: Osram GmbH
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Filing: 1998-09-21
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Granted: 2000-08-08
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Expires: 2018-09-21
Abstract
Abstract A plurality of semiconductor bodies are produced by first depositing a mask layer on a main surface of a substrate wafer. A plurality of windows are next formed in the mask layer such that the wafer surface is laid bare in the windows. A semiconductor layer sequence defining the semiconductor bodies functionally is then deposited onto the main surface in the windows. Finally, the wafer is divided and severed into individual semiconductor chips.
Inventors
- 👤 Volker Haerle
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 15:43
CPC Classifications
H; H01; H01S; H01S5/00; H01S5/02; H01S5/0201; H10; H10H; H10H20/00; H10H20/01; H10H20/011; H10H20/013; H10H20/0133; H10H20/01335; H10H20/0137
Claims Analysis
Total Claims: 23
Claim 1
Independent Claim
114 words
A method of fabricating a plurality of radiation-emitting semiconductor chips, which comprises: depositing a mask layer on a main surface of a substrate wafer; forming a plurality of windows in the mask layer such that the main surface of the substrate wafer is uncovered within the windows; depositing a semiconductor layer sequence onto the main surface of the substrate wafer in the windows and forming substantially identical functional semiconductor structures in the windows, the semiconductor layer including an active layer, being at most as thick as the mask layer; and dividing the wafer with the semiconductor layer sequence into a plurality of radiation emitting semiconductor chips by severing the wafer between the semiconductor structures.
Claim 2
Independent Claim
114 words
A method of fabricating a plurality of radiation-emitting semiconductor chips, which comprises: depositing a mask layer on a main surface of a substrate wafer; forming a plurality of windows in the mask layer such that the main surface of the substrate wafer is uncovered within the windows; depositing a semiconductor layer sequence onto the main surface of the substrate wafer in the windows and forming substantially identical functional semiconductor structures in the windows, the semiconductor layer including an active layer, being at most as thick as the mask layer; and dividing the wafer with the semiconductor layer sequence into a plurality of radiation emitting semiconductor chips by severing the wafer between the semiconductor structures.
Claim 3
Dependent Claim
64 words
The method according to claim 1, wherein the depositing step comprises depositing a Ga(In,Al)N semiconductor layer sequence onto the main surface of the substrate wafer in the windows, and producing Ga(In,Al)N light-emitting diode structures in the windows, and wherein the dividing step comprises dividing the wafer into a plurality of Ga(In,Al)N light-emitting diode chips by severing the wafer between the Ga(In,Al)N light-emitting diode structures.
Claim 4
Dependent Claim
63 words
The method according to claim 1, wherein the step of depositing a semiconductor layer structure comprises depositing a VCSEL semiconductor layer sequence onto the main surface of the substrate wafer in the windows and producing VCSEL structures in the windows, and wherein the dividing step comprises dividing the wafer into a plurality of VCSEL chips by severing the wafer between the VCSEL structures.
Claim 5
Dependent Claim
46 words
The method according to claim 1, which comprises producing a plurality of edge-emitting semiconductor laser chips, formed with, on two mutually opposite side surfaces, laser mirror surfaces extending plane-parallel to one another and being defined by two mutually opposite, plane-parallel side surfaces of a respective window.
Claim 6
Dependent Claim
40 words
The method according to claim 1, which comprises providing a substrate wafer with at least one epitaxially applied semiconductor layer, onto which the semiconductor layer sequence is deposited in the windows during the step of depositing the semiconductor layer structure.
Claim 7
Dependent Claim
29 words
The method according to claim 1, wherein the mask layer is formed of a material selected from the group consisting of SiO 2 and Si x N 1-x .
Claim 8
Dependent Claim
34 words
The method according to claim 1, wherein the substrate wafer is formed with a growth substrate composed essentially from a material selected from the group consisting of sapphire, SiC, GaN, AlN, Si, and GaAs.
Claim 9
Dependent Claim
31 words
The method according to claim 1, wherein the step of depositing the semiconductor layer sequence comprises forming the semiconductor structures with at least one semiconductor layer from the material system Ga(In,Al)N.
Claim 10
Dependent Claim
30 words
The method according to claim 1, which comprises providing a substrate wafer with at least one epitaxially applied semiconductor layer essentially composed of Ga x Al x-1 N, whereby 0≦x≦1.
Claim 11
Dependent Claim
21 words
The method according to claim 1, wherein the forming step comprises forming the windows by etching selectively to the substrate wafer.
Claim 12
Dependent Claim
16 words
The method according to claim 1, wherein the forming step comprises anisotropically dry etching the windows.
Claim 13
Dependent Claim
17 words
The method according to claim 1, which comprises removing the mask layer prior to the severing step.
Claim 14
Dependent Claim
29 words
The method according to claim 12, which comprises removing the mask layer after the step of depositing the semiconductor structures by etching selectively with respect to the semiconductor structures.
Claim 15
Dependent Claim
26 words
The method according to claim 12, which comprises removing the mask layer with an isotropic wet-chemical etching process after the step of depositing the semiconductor structures.
Claim 16
Independent Claim
84 words
A method of fabricating a plurality of Ga(In,Al)N light-emitting diode chips, which comprises: depositing a mask layer on a main surface of a substrate wafer; forming a plurality of windows in the mask layer such that the main surface of the substrate wafer is uncovered within the windows; producing Ga(In,Al)N light-emitting diode structures in the windows by depositing a Ga(In,Al)N semiconductor layer sequence onto the main surface of the substrate wafer in the windows; and severing the wafer between the Ga(In,Al)N light-emitting diode structures.
Claim 17
Independent Claim
84 words
A method of fabricating a plurality of Ga(In,Al)N light-emitting diode chips, which comprises: depositing a mask layer on a main surface of a substrate wafer; forming a plurality of windows in the mask layer such that the main surface of the substrate wafer is uncovered within the windows; producing Ga(In,Al)N light-emitting diode structures in the windows by depositing a Ga(In,Al)N semiconductor layer sequence onto the main surface of the substrate wafer in the windows; and severing the wafer between the Ga(In,Al)N light-emitting diode structures.
Claim 18
Independent Claim
78 words
A method of fabricating a plurality of VCSEL chips, which comprises: depositing a mask layer on a main surface of a substrate wafer; forming a plurality of windows in the mask layer such that the main surface of the substrate wafer is uncovered within the windows; producing VCSEL structures in the windows by depositing a VCSEL semiconductor layer sequence onto the main surface of the substrate wafer in the windows; and severing the wafer between the VCSEL structures.
Claim 19
Independent Claim
78 words
A method of fabricating a plurality of VCSEL chips, which comprises: depositing a mask layer on a main surface of a substrate wafer; forming a plurality of windows in the mask layer such that the main surface of the substrate wafer is uncovered within the windows; producing VCSEL structures in the windows by depositing a VCSEL semiconductor layer sequence onto the main surface of the substrate wafer in the windows; and severing the wafer between the VCSEL structures.
Claim 20
Independent Claim
99 words
A method of fabricating a plurality of semiconductor chips, which comprises: depositing a mask layer on a main surface of a substrate wafer; forming a plurality of windows in the mask layer such that the main surface of the substrate wafer is uncovered within the windows; forming substantially identical functional semiconductor structures in the plurality of windows by depositing a semiconductor layer sequence onto the main surface of the substrate wafer in the plurality of windows, at least one layer of the semiconductor layer sequence being from the material system Ga(In,Al)N; and severing the wafer between the semiconductor structures.
Claim 21
Independent Claim
99 words
A method of fabricating a plurality of semiconductor chips, which comprises: depositing a mask layer on a main surface of a substrate wafer; forming a plurality of windows in the mask layer such that the main surface of the substrate wafer is uncovered within the windows; forming substantially identical functional semiconductor structures in the plurality of windows by depositing a semiconductor layer sequence onto the main surface of the substrate wafer in the plurality of windows, at least one layer of the semiconductor layer sequence being from the material system Ga(In,Al)N; and severing the wafer between the semiconductor structures.
Claim 22
Independent Claim
106 words
A method of fabricating a plurality of semiconductor chips, which comprises: depositing a mask layer on a main surface of a substrate wafer; forming a plurality of windows in the mask layer such that the main surface of the substrate wafer is uncovered within the windows; forming substantially identical functional semiconductor structures in the plurality of windows by depositing a semiconductor layer sequence onto the main surface of the substrate wafer in the plurality of windows, the semiconductor layer sequence having at least one epitaxially applied semiconductor layer essentially composed of Ga x Al x-1 N, wherein 0≦x≦1; and severing the wafer between the semiconductor structures.
Claim 23
Independent Claim
106 words
A method of fabricating a plurality of semiconductor chips, which comprises: depositing a mask layer on a main surface of a substrate wafer; forming a plurality of windows in the mask layer such that the main surface of the substrate wafer is uncovered within the windows; forming substantially identical functional semiconductor structures in the plurality of windows by depositing a semiconductor layer sequence onto the main surface of the substrate wafer in the plurality of windows, the semiconductor layer sequence having at least one epitaxially applied semiconductor layer essentially composed of Ga x Al x-1 N, wherein 0≦x≦1; and severing the wafer between the semiconductor structures.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-08-08 | 2004-02-07 | 2004-08-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-08-08 | 2008-02-07 | 2008-08-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-08-08 | 2012-02-07 | 2012-08-08 | $7700.00 | Window Closed / Lapsed |