Patent US6098030A successfully refreshed from Google Patents.
US6098030A
Expired / Lapsed
US
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Method and apparatus for tracking power of an integrated circuit
Assignee: Advanced Micro Devices Inc
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Filing: 1998-10-07
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Granted: 2000-08-01
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Expires: 2018-10-07
Abstract
Abstract An integrated circuit which includes a temperature modeling circuit for reducing operational activity of the integrated circuit when its operating temperature exceeds a predefined threshold. The temperature modeling circuit includes several multiplexers each of which corresponds to a particular sub-circuit within the integrated circuit. The multiplexers select one of at least two heat generation values inputted thereto in accordance with the operating mode of the corresponding sub-circuit. A multi-input adder adds the selected heat generation values along with values representing the rate at which heat is being dissipated by the integrated circuit, the rate at which heat is being generated by background operations of the integrated circuit, and a previous temperature of the integrated circuit. The added values relate to the current operating temperature of the integrated circuit which is compared to a predefined temperature using a comparator. When the current operating temperature of the integrated circuit exceeds the predefined value, the comparator dispatches a command instructing the integrated circuit to halt or slow its operational activity and thereby reduce its current temperature.
Inventors
- 👤 Brian S. McMinn
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-08 14:34
CPC Classifications
G; G06; G06F; G06F1/00; G06F1/16; G06F1/20; G06F1/206
Claims Analysis
Total Claims: 39
Claim 1
Independent Claim
83 words
A method for estimating the temperature of an integrated circuit embodying at least one sub-circuit, comprising: providing said at least one sub-circuit configured to produce a plurality of heat generation values; selecting a heat generation value from the plurality of heat generation values, wherein said selecting is performed based on operation of said at least one sub-circuit; and combining said heat generation value with a pre-determined heat dissipation value to determine a temperature value corresponding to a current temperature of said integrated circuit.
Claim 2
Independent Claim
83 words
A method for estimating the temperature of an integrated circuit embodying at least one sub-circuit, comprising: providing said at least one sub-circuit configured to produce a plurality of heat generation values; selecting a heat generation value from the plurality of heat generation values, wherein said selecting is performed based on operation of said at least one sub-circuit; and combining said heat generation value with a pre-determined heat dissipation value to determine a temperature value corresponding to a current temperature of said integrated circuit.
Claim 3
Dependent Claim
23 words
The method as recited in claim 1, further comprises providing a previous temperature of said integrated circuit immediately prior to said current temperature.
Claim 4
Dependent Claim
31 words
The method as recited in claim 2, wherein said combining comprises adding said previous temperature with said heat generation value and said heat dissipation value to produce an accumulated temperature value.
Claim 5
Dependent Claim
20 words
The method as recited in claim 3, further comprising comparing said accumulated temperature value with a pre-determined threshold temperature value.
Claim 6
Dependent Claim
26 words
The method as recited in claim 4, further comprising deactivating said at least one sub-circuit if said accumulated temperature value exceeds said pre-determined threshold temperature value.
Claim 7
Independent Claim
114 words
A method of deriving an accumulated temperature produced by an operating integrated circuit having at least two sub-circuits each capable of operating in distinct modes, the method comprising: providing at least two sub-circuit heat generation values associated with each of the sub-circuits, wherein each of the heat generation values correspond to heat generated during an operating mode of one sub-circuit; selecting one of the two heat generation values associated with each sub-circuit, wherein said selecting is based on which of the sub-circuits is currently operating in the integrated circuit; and deriving an accumulated temperature value which relates to the temperature of the operating integrated circuit as a function of the selected heat generation value.
Claim 8
Independent Claim
114 words
A method of deriving an accumulated temperature produced by an operating integrated circuit having at least two sub-circuits each capable of operating in distinct modes, the method comprising: providing at least two sub-circuit heat generation values associated with each of the sub-circuits, wherein each of the heat generation values correspond to heat generated during an operating mode of one sub-circuit; selecting one of the two heat generation values associated with each sub-circuit, wherein said selecting is based on which of the sub-circuits is currently operating in the integrated circuit; and deriving an accumulated temperature value which relates to the temperature of the operating integrated circuit as a function of the selected heat generation value.
Claim 9
Dependent Claim
12 words
The method of claim 6, wherein each heat generation value is predetermined.
Claim 10
Dependent Claim
44 words
The method of claim 6, further comprising the step of providing a background heat generation value relating to heat generated during a quiescent operation of the integrated circuit, wherein the accumulated temperature value is derived as a function of the background heat generation value.
Claim 11
Dependent Claim
40 words
The method of claim 6, further comprising the step of providing a heat dissipation value relating to heat dissipated during integrated circuit operation, wherein the accumulated temperature value is derived as a function of the integrated circuit heat dissipation value.
Claim 12
Dependent Claim
49 words
The method of claim 6, further comprising the step of providing a previous temperature value during a time interval prior to derivation of said accumulated temperature value, and wherein said previous temperature value is configured for addition to said selected heat generation values for deriving said accumulated temperature value.
Claim 13
Dependent Claim
102 words
The method of claim 6, further comprising the steps of: providing a background heat generation value relating to heat generated during a quiescent operation of the integrated circuit; providing an integrated circuit heat dissipation value relating to heat dissipated by the integrated circuit; and providing a previous temperature value during a time interval prior to said providing a background heat generation value and said an integrated circuit heat dissipation value, wherein the accumulated temperature value is derived as a function of the selected heat generation values, the background heat generation value, the previous temperature value, and the integrated circuit heat dissipation value.
Claim 14
Dependent Claim
38 words
The method of claim 11, wherein the step of deriving the accumulated temperature value further includes adding the selected heat generation values, the background heat generation value, the previous temperature value, and the integrated circuit heat dissipation value.
Claim 15
Dependent Claim
19 words
The method of claim 11, wherein the integrated circuit heat dissipation value is dependent on the previous temperature value..
Claim 16
Dependent Claim
23 words
The method of claim 12, wherein each heat generation value is selected in accordance with the mode of operation of the corresponding sub-circuit.
Claim 17
Independent Claim
152 words
A method of limiting an operating temperature of an integrated circuit having at least two sub-circuits each of which is capable of operating in separate modes, the method comprising: providing at least two heat generation values corresponding to each sub-circuit, each heat generation value being related to an amount of heat generated by the corresponding sub-circuit during an operational mode; selecting one of the at least two heat generation values corresponding to each of the sub-circuits, wherein said selecting is based on which of the sub-circuits is currently operating in the integrated circuit; generating a current temperature value relating to the operating temperature of the integrated circuit as a function of the selected heat generation value; comparing the current temperature value with a threshold value relating to a predefined integrated circuit temperature; and reducing a rate at which the integrated circuit generates heat when the current temperature value exceeds the threshold value.
Claim 18
Independent Claim
152 words
A method of limiting an operating temperature of an integrated circuit having at least two sub-circuits each of which is capable of operating in separate modes, the method comprising: providing at least two heat generation values corresponding to each sub-circuit, each heat generation value being related to an amount of heat generated by the corresponding sub-circuit during an operational mode; selecting one of the at least two heat generation values corresponding to each of the sub-circuits, wherein said selecting is based on which of the sub-circuits is currently operating in the integrated circuit; generating a current temperature value relating to the operating temperature of the integrated circuit as a function of the selected heat generation value; comparing the current temperature value with a threshold value relating to a predefined integrated circuit temperature; and reducing a rate at which the integrated circuit generates heat when the current temperature value exceeds the threshold value.
Claim 19
Dependent Claim
21 words
The method of claim 15, wherein the predefined integrated circuit represents a maximum temperature at which the integrated circuit can operate.
Claim 20
Dependent Claim
22 words
The method of claim 15, wherein the heat generation rate of the integrated circuit is reduced by slowing an activity level thereof.
Claim 21
Dependent Claim
25 words
The method of claim 15, wherein the heat generation rate of the integrated circuit is reduced by slowing a system clock of the integrated circuit.
Claim 22
Dependent Claim
28 words
The method of claim 15, wherein the heat generation of the integrated circuit is reduced by slowing a rate at which instructions are executed by the integrated circuit.
Claim 23
Dependent Claim
98 words
The method of claim 15, further comprising the steps of: providing a background generation value relating to heat generated by the integrated circuit outside of the sub-circuits; providing an integrated circuit heat dissipation value relating to heat dissipated by the integrated circuit; providing a prior temperature value relating to an operating temperature of the integrated circuit during a time period prior to the current temperature value generation; wherein the current temperature value is generated as a function of the selected heat generation values, the background heat generation value, the prior temperature, and the integrated circuit heat dissipation value.
Claim 24
Dependent Claim
38 words
The method of claim 15 wherein the step of generating the current temperature value further includes adding the selected heat generation values, the background heat generation value, the prior temperature value, and the integrated circuit heat dissipation value.
Claim 25
Independent Claim
120 words
A method of deriving an accumulated temperature produced by an operating integrated circuit having at least two sub-circuits each capable of operating in distinct modes, the method comprising: providing at least two sub-circuit heat generation values associated with each of the sub-circuits, wherein each of the heat generation values correspond to heat generated during an operating mode of one sub-circuit; selecting one of the two heat generation values associated with each sub-circuit; providing a background heat generation value relating to heat generated during a quiescent operation of the integrated circuit deriving an accumulated temperature value which relates to the temperature of the operating integrated circuit as a function of the selected heat generation value and the background heat generation value.
Claim 26
Independent Claim
120 words
A method of deriving an accumulated temperature produced by an operating integrated circuit having at least two sub-circuits each capable of operating in distinct modes, the method comprising: providing at least two sub-circuit heat generation values associated with each of the sub-circuits, wherein each of the heat generation values correspond to heat generated during an operating mode of one sub-circuit; selecting one of the two heat generation values associated with each sub-circuit; providing a background heat generation value relating to heat generated during a quiescent operation of the integrated circuit deriving an accumulated temperature value which relates to the temperature of the operating integrated circuit as a function of the selected heat generation value and the background heat generation value.
Claim 27
Dependent Claim
12 words
The method of claim 22, wherein each heat generation value is predetermined.
Claim 28
Dependent Claim
41 words
The method of claim 22, further comprising the step of providing a heat dissipation value relating to heat dissipated during integrated circuit operation, wherein the accumulated temperature value is also derived as a function of the integrated circuit heat dissipation value.
Claim 29
Dependent Claim
49 words
The method of claim 22, further comprising the step of providing a previous temperature value during a time interval prior to derivation of said accumulated temperature value, and wherein said previous temperature value is configured for addition to said selected heat generation values for deriving said accumulated temperature value.
Claim 30
Independent Claim
208 words
A method of limiting an operating temperature of an integrated circuit having at least two sub-circuits each of which is capable of operating in separate modes, the method comprising: providing at least two heat generation values corresponding to each sub-circuit, each heat generation value being related to an amount of heat generated by the corresponding sub-circuit during an operational mode; selecting one of the at least two heat generation values corresponding to each of the sub-circuits; providing a background generation value relating to heat generated by the integrated circuit outside of the sub-circuits; providing an integrated circuit heat dissipation value relating to heat dissipated by the integrated circuit; providing a prior temperature value relating to an operating temperature of the integrated circuit during a time period prior to the current temperature value generation; generating a current temperature value relating to the operating temperature of the integrated circuit as a function of the selected heat generation value, the background heat generation value, the prior temperature value, and the integrated circuit heat dissipation value; comparing the current temperature value with a threshold value relating to a predefined integrated circuit temperature; and reducing a rate at which the integrated circuit generates heat when the current temperature value exceeds the threshold value.
Claim 31
Independent Claim
208 words
A method of limiting an operating temperature of an integrated circuit having at least two sub-circuits each of which is capable of operating in separate modes, the method comprising: providing at least two heat generation values corresponding to each sub-circuit, each heat generation value being related to an amount of heat generated by the corresponding sub-circuit during an operational mode; selecting one of the at least two heat generation values corresponding to each of the sub-circuits; providing a background generation value relating to heat generated by the integrated circuit outside of the sub-circuits; providing an integrated circuit heat dissipation value relating to heat dissipated by the integrated circuit; providing a prior temperature value relating to an operating temperature of the integrated circuit during a time period prior to the current temperature value generation; generating a current temperature value relating to the operating temperature of the integrated circuit as a function of the selected heat generation value, the background heat generation value, the prior temperature value, and the integrated circuit heat dissipation value; comparing the current temperature value with a threshold value relating to a predefined integrated circuit temperature; and reducing a rate at which the integrated circuit generates heat when the current temperature value exceeds the threshold value.
Claim 32
Independent Claim
193 words
A method for calculating a temperature of an integrated circuit, the integrated circuit comprising a first sub-circuit, wherein the first sub-circuit is configured to operate in one of a first plurality of modes, wherein the first sub-circuit is configured to generate heat at one of a first plurality of heat generation rates, wherein each one of the first plurality of heat generation rates corresponds to a respective one of the first plurality of modes, the method comprising: storing a first plurality of heat generation values, wherein each of the first plurality of heat generation values corresponds to a respective one of the first plurality of heat generation rates; the integrated circuit operating, wherein the integrated circuit operating includes the first sub-circuit operating in a first mode, wherein the first mode corresponds to a first heat generation rate, wherein the first heat generation rate corresponds to a first heat generation value, selecting the first heat generation value from the first plurality of heat generation values in response to the first sub-circuit operating in the first mode; and calculating the temperature of the integrated circuit as a function of the selected first heat generation value.
Claim 33
Independent Claim
193 words
A method for calculating a temperature of an integrated circuit, the integrated circuit comprising a first sub-circuit, wherein the first sub-circuit is configured to operate in one of a first plurality of modes, wherein the first sub-circuit is configured to generate heat at one of a first plurality of heat generation rates, wherein each one of the first plurality of heat generation rates corresponds to a respective one of the first plurality of modes, the method comprising: storing a first plurality of heat generation values, wherein each of the first plurality of heat generation values corresponds to a respective one of the first plurality of heat generation rates; the integrated circuit operating, wherein the integrated circuit operating includes the first sub-circuit operating in a first mode, wherein the first mode corresponds to a first heat generation rate, wherein the first heat generation rate corresponds to a first heat generation value, selecting the first heat generation value from the first plurality of heat generation values in response to the first sub-circuit operating in the first mode; and calculating the temperature of the integrated circuit as a function of the selected first heat generation value.
Claim 34
Dependent Claim
31 words
The method as recited in claim 27, wherein the integrated circuit temperature is calculated as a function of the first heat generation value and a prior temperature of the integrated circuit.
Claim 35
Dependent Claim
31 words
The method as recited in claim 27, further comprising: comparing said calculated integrated circuit temperature with a pre-determined temperature; deactivating the first sub-circuit if said calculated temperature exceeds said pre-determined temperature.
Claim 36
Dependent Claim
13 words
The method of claim 27, wherein each first heat generation values is predetermined.
Claim 37
Dependent Claim
47 words
The method of claim 27, wherein the temperature of the integrated circuit is calculated as a function of the first heat generation value and a background heat generation value, wherein the background heat generation value relates to heat generated during a quiescent operation of the integrated circuit.
Claim 38
Dependent Claim
41 words
The method of claim 27, wherein the temperature of the integrated circuit is calculated as a function of the first heat generation value and a heat dissipation value, wherein the heat dissipation value relates to heat dissipated during integrated circuit operation.
Claim 39
Dependent Claim
129 words
The method as recited in claim 27, wherein integrated circuit further comprises a second sub-circuit, wherein the second sub-circuit is configured to operate in one of a second plurality of heat generation rates, the method further comprising: wherein the integrated circuit operating includes the second sub-circuit operating in a second mode of the second plurality of modes, wherein the second mode corresponds to a second heat generation rate, wherein the second heat generation rate corresponds to a second heat generation value; selecting the second heat generation value from the second plurality of heat generation values in response to the second sub-circuit operating in the second mode; and calculating the temperature of the integrated circuit as a function of the first heat generation value and the second heat generation value.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-08-01 | 2004-01-31 | 2004-08-01 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-08-01 | 2008-01-31 | 2008-08-01 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-08-01 | 2012-01-31 | 2012-08-01 | $7700.00 | Window Closed / Lapsed |