Hardware-assisted firmware tracing method and apparatus

Claim 2

A test and diagnosis system for testing an embedded microprocessor of a product under test, comprising: an ASIC, wherein the ASIC includes both the embedded microprocessor of the product under test and a debug assist logic means, the debug assist logic means for monitoring information from the embedded microprocessor of the product under test, the debug assist logic means electrically coupled to the embedded microprocessor of the product under test and including a plurality of storage means, the plurality of storage means including at least a first storage set means for storing a control set of match conditions, wherein responsive to a match of monitored information and the conditions set in the control set, the debug assist logic means generates an interrupt to the embedded microprocessor of the product under test; and debug software stored on a first memory means, the first memory means electrically coupled to the embedded processor of the product under test.

Claim 3

The test and diagnosis system recited in claim 1, wherein the test and diagnosis system is further comprised of an instruction overlay harness means including an instruction overlay memory means, the instruction overlay harness means being electrically coupled to the ASIC.

Claim 4

The test and diagnosis system recited in claim 2, wherein the instruction overlay harness means further includes an overlay harness address decoding means and an instruction overlay enablement means.

Claim 5

The test and diagnosis system recited in claim 1 wherein the debug assist logic means is electrically coupled to and monitors information from an address bus and a data bus, the address bus and data bus being electrically coupled to the embedded microprocessor.

Claim 6

The test and diagnosis system recited in claim 1 wherein responsive to interrupt generated by the debug assist logic means, control is transferred from execution code running on the embedded microprocessor of the product under test to the debug software.

Claim 7

The test and diagnosis system recited in claim 1 wherein the ASIC further includes a REMA port electrically coupled to a monitoring means.

Claim 8

A test and diagnosis system for testing an embedded microprocessor comprising: an ASIC including the embedded microprocessor and a debug assist logic means, the debug assist logic means for monitoring information from the embedded microprocessor, the debug assist logic means electrically coupled to the embedded microprocessor and including a plurality of storage means, the plurality of storage means including at least a first storage set means for storing a control set of match conditions, wherein responsive to a match of monitored information and the conditions set in the control set, the debug assist logic means generates an interrupt to embedded microprocessor; and debug software stored on a first memory means, the first memory means electrically coupled to the embedded processor, wherein the test and diagnosis system is further comprised of an instruction overlay harness means including an instruction overlay memory means, the instruction overlay harness means being electrically coupled to the ASIC, wherein the instruction overlay harness means further includes an overlay harness address decoding means and an instruction overlay enablement means, wherein one of the plurality of storage means in the debug assist logic means is an interrupt control storage means, the interrupt control storage means including a REMAP bit for mapping portions of the first memory means to an address that does not conflict with the instruction overlay memory means.

Claim 9

A test and diagnosis system for testing an embedded microprocessor comprising: an ASIC including the embedded microprocessor and a debug assist logic means, the debug assist logic means for monitoring information from the embedded microprocessor, the debug assist logic means electrically coupled to the embedded microprocessor and including a plurality of storage means, the plurality of storage means including at least a first storage set means for storing a control set of match conditions, wherein responsive to a match of monitored information and the conditions set in the control set, the debug assist logic means generates an interrupt to embedded microprocessor; and debug software stored on a first memory means, the first memory means electrically coupled to the embedded processor, wherein the test and diagnosis system is further comprised of an instruction overlay harness means including an instruction overlay memory means, the instruction overlay harness means being electrically coupled to the ASIC, wherein the instruction overlay harness means further includes an overlay harness address decoding means and an instruction overlay enablement means, wherein one of the plurality of storage means in the debug assist logic means is an interrupt control storage means, the interrupt control storage means including a REMAP bit for mapping portions of the first memory means to an address that does not conflict with the instruction overlay memory means.

Claim 10

A test and diagnosis system for testing an embedded microprocessor comprising: an ASIC including the embedded microprocessor and a debug assist logic means, the debug assist logic means for monitoring information from the embedded microprocessor, the debug assist logic means electrically coupled to the embedded microprocessor and including a plurality of storage means, the plurality of storage means including at least a first storage set means for storing a control set of match conditions, wherein responsive to a match of monitored information and the conditions set in the control set, the debug assist logic means generates an interrupt to embedded microprocessor; and debug software stored on a first memory means, the first memory means electrically coupled to the embedded processor, wherein the debug assist logic means is electrically coupled to and monitors information from an address bus and a data bus, the address bus and data bus being electrically coupled to the embedded microprocessor, wherein a match of a condition stored in the control set occurs when an address stored in the at least one register set of the debug assist logic means matches the address on the address bus.

Claim 11

A test and diagnosis system for testing an embedded microprocessor comprising: an ASIC including the embedded microprocessor and a debug assist logic means, the debug assist logic means for monitoring information from the embedded microprocessor, the debug assist logic means electrically coupled to the embedded microprocessor and including a plurality of storage means, the plurality of storage means including at least a first storage set means for storing a control set of match conditions, wherein responsive to a match of monitored information and the conditions set in the control set, the debug assist logic means generates an interrupt to embedded microprocessor; and debug software stored on a first memory means, the first memory means electrically coupled to the embedded processor, wherein the debug assist logic means is electrically coupled to and monitors information from an address bus and a data bus, the address bus and data bus being electrically coupled to the embedded microprocessor, wherein a match of a condition stored in the control set occurs when an address stored in the at least one register set of the debug assist logic means matches the address on the address bus.

Claim 12

A test and diagnosis system for testing an embedded microprocessor comprising: an ASIC including the embedded microprocessor and a debug assist logic means, the debug assist logic means for monitoring information from the embedded microprocessor, the debug assist logic means electrically coupled to the embedded microprocessor and including a plurality of storage means, the plurality of storage means including at least a first storage set means for storing a control set of match conditions, wherein responsive to a match of monitored information and the conditions set in the control set, the debug assist logic means generates an interrupt to embedded microprocessor; and debug software stored on a first memory means, the first memory means electrically coupled to the embedded processor wherein a match of a condition stored in the control set occurs when the data stored in the debug assist logic means matches the data on the data bus.

Claim 13

A test and diagnosis system for testing an embedded microprocessor comprising: an ASIC including the embedded microprocessor and a debug assist logic means, the debug assist logic means for monitoring information from the embedded microprocessor, the debug assist logic means electrically coupled to the embedded microprocessor and including a plurality of storage means, the plurality of storage means including at least a first storage set means for storing a control set of match conditions, wherein responsive to a match of monitored information and the conditions set in the control set, the debug assist logic means generates an interrupt to embedded microprocessor; and debug software stored on a first memory means, the first memory means electrically coupled to the embedded processor wherein a match of a condition stored in the control set occurs when the data stored in the debug assist logic means matches the data on the data bus.

Claim 14

A test and diagnosis system for testing an embedded microprocessor comprising: an ASIC including the embedded microprocessor and a debug assist logic means, the debug assist logic means for monitoring information from the embedded microprocessor, the debug assist logic means electrically coupled to the embedded microprocessor and including a plurality of storage means, the plurality of storage means including at least a first storage set means for storing a control set of match conditions, wherein responsive to a match of monitored information and the conditions set in the control set, the debug assist logic means generates an interrupt to embedded microprocessor; and debug software stored on a first memory means, the first memory means electrically coupled to the embedded processor wherein a match of a condition stored in the control set occurs when both (1) the address stored in the debug assist logic means matches the address information monitored by the debug assist logic means across the address bus and (2) the data stored in the debug assist logic means matches the data information monitored by the debug assist logic means across the data bus.

Claim 15

A test and diagnosis system for testing an embedded microprocessor comprising: an ASIC including the embedded microprocessor and a debug assist logic means, the debug assist logic means for monitoring information from the embedded microprocessor, the debug assist logic means electrically coupled to the embedded microprocessor and including a plurality of storage means, the plurality of storage means including at least a first storage set means for storing a control set of match conditions, wherein responsive to a match of monitored information and the conditions set in the control set, the debug assist logic means generates an interrupt to embedded microprocessor; and debug software stored on a first memory means, the first memory means electrically coupled to the embedded processor wherein a match of a condition stored in the control set occurs when both (1) the address stored in the debug assist logic means matches the address information monitored by the debug assist logic means across the address bus and (2) the data stored in the debug assist logic means matches the data information monitored by the debug assist logic means across the data bus.

Claim 16

A test and diagnosis system for testing an embedded microprocessor comprising: an ASIC including the embedded microprocessor and a debug assist logic means, the debug assist logic means for monitoring information from the embedded microprocessor, the debug assist logic means electrically coupled to the embedded microprocessor and including a plurality of storage means, the plurality of storage means including at least a first storage set means for storing a control set of match conditions, wherein responsive to a match of monitored information and the conditions set in the control set, the debug assist logic means generates an interrupt to embedded microprocessor; and debug software stored on a first memory means, the first memory means electrically coupled to the embedded processor wherein the plurality of registers of the debug assist logic means includes at least one register set, an interrupt control storage means and an ID storage means.

Claim 17

A test and diagnosis system for testing an embedded microprocessor comprising: an ASIC including the embedded microprocessor and a debug assist logic means, the debug assist logic means for monitoring information from the embedded microprocessor, the debug assist logic means electrically coupled to the embedded microprocessor and including a plurality of storage means, the plurality of storage means including at least a first storage set means for storing a control set of match conditions, wherein responsive to a match of monitored information and the conditions set in the control set, the debug assist logic means generates an interrupt to embedded microprocessor; and debug software stored on a first memory means, the first memory means electrically coupled to the embedded processor wherein the plurality of registers of the debug assist logic means includes at least one register set, an interrupt control storage means and an ID storage means.