US6087211A
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Method for forming a semiconductor device having non-volatile memory cells, High-voltage transistors, and low-voltage, deep sub-micron transistors
Assignee: National Semiconductor Corp
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Filing: 1998-08-12
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Granted: 2000-07-11
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Expires: 2018-08-12
Abstract
Abstract A semiconductor device having memory cells, high-voltage CMOS transistors, and low-voltage, deep sub-micron CMOS transistors is formed in a process that allows the same low-voltage device parameters to be used regardless of whether the low-voltage transistors are formed with or without the memory cells and the high-voltage CMOS transistors.
Inventors
- 👤 Alexander Kalnitsky
- 👤 Albert Bergemont
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 21:42
CPC Classifications
H; H10; H10B; H10B41/00; H10B41/40; H10B41/42; H10B41/49; H10D; H10D84/00; H10D84/01; H10D84/0123; H10D84/0126; H10D84/0165; H10D84/0172; H10D84/02; H10D84/03; H10D84/038; H10D84/80; H10D84/82; H10D84/83; H10D84/85; H10D84/856; H10D84/83138; H10D84/8314
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
271 words
A method for forming a semiconductor device on a semiconductor wafer, the wafer having: a substrate; a first well formed in the substrate, the first well having a first area, a second area, and a conductivity type; and a second well formed in the substrate, the second well being spaced apart from the first well, and having a conductivity type which is different from the conductivity type of the first well; the method comprising the steps of: forming a layer of first gate oxide over the first area of the first well, and the second well; forming a layer of tunnel oxide over the second area of the first well after the layer of first gate oxide has been formed; forming a layer of first polysilicon (poly-1) over the layer of tunnel oxide and the layer of first gate oxide; forming a layer of interpoly dielectric over the layer of poly-1; forming a layer of nitride over the layer of interpoly dielectric; forming a third well in the substrate after the layer of nitride has been formed, the third well being spaced apart from the first and second wells, and having a conductivity type; forming a fourth well in the substrate after the layer of nitride has been formed, the fourth well being spaced apart from the first, second, and third wells, and having a conductivity type which is different from the conductivity type of the third well; forming a layer of second gate oxide over the third and fourth wells; and forming a layer of second polysilicon (poly-2) over the layer of nitride and the layer of second gate oxide.
Claim 2
Independent Claim
271 words
A method for forming a semiconductor device on a semiconductor wafer, the wafer having: a substrate; a first well formed in the substrate, the first well having a first area, a second area, and a conductivity type; and a second well formed in the substrate, the second well being spaced apart from the first well, and having a conductivity type which is different from the conductivity type of the first well; the method comprising the steps of: forming a layer of first gate oxide over the first area of the first well, and the second well; forming a layer of tunnel oxide over the second area of the first well after the layer of first gate oxide has been formed; forming a layer of first polysilicon (poly-1) over the layer of tunnel oxide and the layer of first gate oxide; forming a layer of interpoly dielectric over the layer of poly-1; forming a layer of nitride over the layer of interpoly dielectric; forming a third well in the substrate after the layer of nitride has been formed, the third well being spaced apart from the first and second wells, and having a conductivity type; forming a fourth well in the substrate after the layer of nitride has been formed, the fourth well being spaced apart from the first, second, and third wells, and having a conductivity type which is different from the conductivity type of the third well; forming a layer of second gate oxide over the third and fourth wells; and forming a layer of second polysilicon (poly-2) over the layer of nitride and the layer of second gate oxide.
Claim 3
Dependent Claim
19 words
The method of claim 1 wherein the wafer further includes a first substrate region and a second substrate region.
Claim 4
Dependent Claim
31 words
The method of claim 2 wherein the layer of first gate oxide is formed over the second area of the first well, the first substrate region, and the second substrate region.
Claim 5
Dependent Claim
63 words
The method of claim 3 wherein the forming a layer of tunnel oxide step includes: removing the layer of first gate oxide formed over the second area of the first well to expose a top surface of the second area of the first well; and forming the layer of tunnel oxide on the top surface of the first area of the first well.
Claim 6
Dependent Claim
102 words
The method of claim 3 wherein the forming a layer of tunnel oxide step includes: removing the layer of first gate oxide from the second area of the first well to expose a surface of the second area of the first well, the first substrate region to expose a surface of the first substrate region, and the second substrate region to expose a surface of the second substrate region; and forming the layer of tunnel oxide on the surface of the first area of the first well, the surface of the first substrate region, and the surface of the second substrate region.
Claim 7
Dependent Claim
32 words
The method of claim 2 wherein the forming a layer of poly-1 step forms the layer of poly-1 on an oxide layer which is formed on the first and second substrate regions.
Claim 8
Dependent Claim
53 words
The method of claim 6 wherein the forming a layer of interpoly dielectric step includes: removing the layer of poly-1 from over the first and second substrate regions; and forming the layer of interpoly dielectric on the layer of poly-1, and on the oxide layer formed on the first and second substrate regions.
Claim 9
Dependent Claim
40 words
The method of claim 7 wherein the forming a third well step includes: removing the layer of nitride and the layer of interpoly dielectric from the first substrate region; and implanting the first substrate region to form the third well.
Claim 10
Dependent Claim
40 words
The method of claim 7 wherein the forming a fourth well step includes: removing the layer of nitride and the layer of interpoly dielectric from the second substrate region; and implanting the second substrate region to form the fourth well.
Claim 11
Dependent Claim
69 words
The method of claim 1 and further comprising the steps of: removing the layer of poly-2 formed over the first area of the first well, and the second well; and selectively removing the layer of poly-2 formed over the second area of the first well to form a control gate, the first substrate region to form a first gate, and the second substrate region to form a second gate.
Claim 12
Dependent Claim
64 words
The method of claim 10 and further comprising the steps of: selectively removing the layer of nitride, the layer of interpoly dielectric, and the layer of poly-1 formed over the first and second wells to form a gate over the first area of the first well, a stacked-gate structure over the second area of the first well, and a gate over the second well.
Claim 13
Independent Claim
405 words
A method for forming a semiconductor device on a semiconductor wafer, the wafer having: a substrate; a first well formed in the substrate, the first well having a first area, a second area, and a conductivity type; a second well formed in the substrate, the second well being spaced apart from the first well, and having a conductivity type which is different from the conductivity type of the first well; a first substrate region; and a second substrate region, the method comprising the steps of: forming a layer of first gate oxide over the first and second wells, and the first and second substrate regions; removing the layer of first gate oxide formed over the second area of the first well, and the first and second substrate regions; forming a layer of tunnel oxide over the second area of the first well, and the first and second substrate regions; forming a layer of first polysilicon (poly-1) over the layer of first gate oxide and the layer of tunnel oxide; removing the poly-1 layer from the first and second substrate regions; forming a layer of interpoly dielectric over the poly-1 layer and the layer of tunnel oxide in the first and second substrate regions; forming a layer of nitride over the layer of interpoly dielectric; removing the layer of nitride and the layer of interpoly dielectric from the first substrate region; implanting the first substrate region to form a third well, the third well being spaced apart from the first and second wells and having a conductivity type; removing the layer of tunnel oxide from the first substrate region; forming a layer of second gate oxide over the third well after the layer of tunnel oxide has been removed from the first substrate region; removing the layer of nitride and the layer of interpoly dielectric from the second substrate region; implanting the second substrate region to form a fourth well, the fourth well being spaced apart from the first, second, and third wells, and having a conductivity type which is different from the conductivity type of the third well; removing the layer of tunnel oxide from the second substrate region; forming the layer of second gate oxide over the fourth well after the layer of tunnel oxide has been removed from the second substrate region; and forming a layer of second polysilicon (poly-2) over the layer of interpoly dielectric and the layer of second gate oxide.
Claim 14
Independent Claim
405 words
A method for forming a semiconductor device on a semiconductor wafer, the wafer having: a substrate; a first well formed in the substrate, the first well having a first area, a second area, and a conductivity type; a second well formed in the substrate, the second well being spaced apart from the first well, and having a conductivity type which is different from the conductivity type of the first well; a first substrate region; and a second substrate region, the method comprising the steps of: forming a layer of first gate oxide over the first and second wells, and the first and second substrate regions; removing the layer of first gate oxide formed over the second area of the first well, and the first and second substrate regions; forming a layer of tunnel oxide over the second area of the first well, and the first and second substrate regions; forming a layer of first polysilicon (poly-1) over the layer of first gate oxide and the layer of tunnel oxide; removing the poly-1 layer from the first and second substrate regions; forming a layer of interpoly dielectric over the poly-1 layer and the layer of tunnel oxide in the first and second substrate regions; forming a layer of nitride over the layer of interpoly dielectric; removing the layer of nitride and the layer of interpoly dielectric from the first substrate region; implanting the first substrate region to form a third well, the third well being spaced apart from the first and second wells and having a conductivity type; removing the layer of tunnel oxide from the first substrate region; forming a layer of second gate oxide over the third well after the layer of tunnel oxide has been removed from the first substrate region; removing the layer of nitride and the layer of interpoly dielectric from the second substrate region; implanting the second substrate region to form a fourth well, the fourth well being spaced apart from the first, second, and third wells, and having a conductivity type which is different from the conductivity type of the third well; removing the layer of tunnel oxide from the second substrate region; forming the layer of second gate oxide over the fourth well after the layer of tunnel oxide has been removed from the second substrate region; and forming a layer of second polysilicon (poly-2) over the layer of interpoly dielectric and the layer of second gate oxide.
References Cited (Backward Citations)
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