US6083793A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method to manufacture nonvolatile memories with a trench-pillar cell structure for high capacitive coupling ratio
Assignee: Taiwan Semiconductor Manufacturing Co TSMC Ltd
•
Filing: 1998-02-27
•
Granted: 2000-07-04
•
Expires: 2018-02-27
Abstract
Abstract A method to fabricate nonvolatile memories with a trench-pillar cell structure is disclosed. A pad oxide is formed on a substrate. A pad nitride is then formed on the pad oxide. An ion implantation is performed to form a lightly doping drain (LDD) in the substrate. The pad nitride, the pad oxide and the substrate are etched to form a trench. A nitride layer is then formed on the pad nitride to fill into the trench. The nitride layer is etched back to form spacers on the sidewalls of the trench. The substrate is etched back to form a subtrench in the trench. Afterward, a polysilicon layer is deposited to refill the trench region and covers a surface of the nitride. The polysilicon is etched back to remove the polysilicon layer on a surface of the nitride. The pad nitride, the nitride and the pad oxide are removed. A tunnel oxide is formed on the pillar, the trench region and the substrate. A floating gate is then formed. The floating is in the trench region and is extended to the top of the trench. An inter-poly oxide is formed on the floating gate. A control gate is formed on the inter-poly oxide. Spacers of the floating gate, the inter-poly oxide and the control gate are formed. Source/drain regions are formed in the substrate. A thick oxide is deposited on the surface of the substrate. A metal contact is formed on the source/drain region.
Inventors
- 👤 Shye-Lin Wu
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 02:53
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/68; H10D30/6891; H10D30/6894; H10D64/00; H10D64/01; H10D64/031; H10D64/035
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
222 words
A method to fabricate nonvolatile memory, the method comprising the steps of: forming a pad oxide on a substrate; forming a pad nitride on said pad oxide; forming a lightly doping drain (LDD) in said substrate; etching back said pad nitride, said pad oxide and said substrate to form a trench; forming a nitride layer on said pad nitride to fill into the trench; etching back said nitride layer to form spacers on sidewalls of the trench; etching back said substrate to form a subtrench in the trench; depositing a polysilicon layer to refill said trench region and cover on a surface of said nitride layer; etching back said polysilicon to remove said polysilicon layer on a surface of said nitride to form a pillar; removing said pad nitride and said nitride; removing said pad oxide; forming a tunnel oxide to cover said pillar, said trench region and said substrate; forming a floating gate that is in the trench region and is extended to the top of the trench; forming an inter-poly oxide on said floating gate; forming a control gate on said inter-poly oxide; forming spacers of said floating gate said inter-poly oxide and said control gate; forming source/drain regions in said substrate; depositing an oxide on the surface of the substrate; and forming a metal contact on said source/drain region.
Claim 2
Independent Claim
222 words
A method to fabricate nonvolatile memory, the method comprising the steps of: forming a pad oxide on a substrate; forming a pad nitride on said pad oxide; forming a lightly doping drain (LDD) in said substrate; etching back said pad nitride, said pad oxide and said substrate to form a trench; forming a nitride layer on said pad nitride to fill into the trench; etching back said nitride layer to form spacers on sidewalls of the trench; etching back said substrate to form a subtrench in the trench; depositing a polysilicon layer to refill said trench region and cover on a surface of said nitride layer; etching back said polysilicon to remove said polysilicon layer on a surface of said nitride to form a pillar; removing said pad nitride and said nitride; removing said pad oxide; forming a tunnel oxide to cover said pillar, said trench region and said substrate; forming a floating gate that is in the trench region and is extended to the top of the trench; forming an inter-poly oxide on said floating gate; forming a control gate on said inter-poly oxide; forming spacers of said floating gate said inter-poly oxide and said control gate; forming source/drain regions in said substrate; depositing an oxide on the surface of the substrate; and forming a metal contact on said source/drain region.
Claim 3
Dependent Claim
40 words
The method of claim 1, wherein said forming a lightly doping drain (LDD) in said substrate is to perform an ion implantation, using Phosphorus ion or Arsenic ion, at a dosage about 5×10 12 to 5×10 14 ions/cm 2 .
Claim 4
Dependent Claim
22 words
The method of claim 1, wherein the step of etching back said polysilicon is dry etching or chemical mechanical polishing (CMP) process.
Claim 5
Dependent Claim
26 words
The method of claim 1, wherein the step of remove said pad oxide is done using a BOE (buffer oxide etching) solution or a HF solution.
Claim 6
Dependent Claim
23 words
The method of claim 1, further comprises following step to form said tunnel oxide: depositing an oxynitride layer; and performing a thermal annealing.
Claim 7
Dependent Claim
12 words
The method of claim 1, wherein said tunnel oxide comprises silicon oxide.
Claim 8
Dependent Claim
30 words
The method of claim 1, wherein said forming source/drain regions in said substrate is an ion implantation, at a dosage of about 2×10 14 to 5×10 16 ions/cm 2 .
Claim 9
Independent Claim
133 words
A method to fabricate a pillar in a trench region, the method comprises the steps of: forming a pad oxide on a substrate; forming a pad nitride on said pad oxide; forming a lightly doping drain (LDD) in said substrate; etching back said pad nitride, said pad oxide and said substrate to form a trench; forming a nitride layer on said pad nitride to fill into the trench; etching back said nitride layer to form spacers on sidewalls of the trench; etching back said substrate to form a subtrench in the trench; depositing a polysilicon layer to refill said trench region and cover on a surface of said nitride layer; etching back said polysilicon to form a pillar of the trench region; removing said pad nitride and said nitride; removing said pad oxide.
Claim 10
Independent Claim
133 words
A method to fabricate a pillar in a trench region, the method comprises the steps of: forming a pad oxide on a substrate; forming a pad nitride on said pad oxide; forming a lightly doping drain (LDD) in said substrate; etching back said pad nitride, said pad oxide and said substrate to form a trench; forming a nitride layer on said pad nitride to fill into the trench; etching back said nitride layer to form spacers on sidewalls of the trench; etching back said substrate to form a subtrench in the trench; depositing a polysilicon layer to refill said trench region and cover on a surface of said nitride layer; etching back said polysilicon to form a pillar of the trench region; removing said pad nitride and said nitride; removing said pad oxide.
Claim 11
Dependent Claim
40 words
The method of claim 8, wherein said forming a lightly doping drain (LDD) in said substrate is to perform an ion implantation, using Phosphorus ion or Arsenic ion, at a dosage about 5×10 12 to 5×10 14 ions/cm 2 .
Claim 12
Dependent Claim
22 words
The method of claim 8, wherein the step of etching back said polysilicon is dry etching or chemical mechanical polishing (CMP) process.
Claim 13
Dependent Claim
26 words
The method of claim 8, wherein the step of remove said pad oxide is done using a BOE (buffer oxide etching) solution or a HF solution.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-07-04 | 2004-01-03 | 2004-07-04 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-07-04 | 2008-01-03 | 2008-07-04 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-07-04 | 2012-01-03 | 2012-07-04 | $7700.00 | Window Closed / Lapsed |