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US6078091A Expired / Lapsed US ⏱️ 0.0 years remaining

Inter-conductive layer fuse for integrated circuits

Assignee: Clear Logic Inc
•
Filing: 1998-11-04
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Granted: 2000-06-20
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Expires: 2018-11-04
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Abstract

Abstract A method and structure for customizing or repairing integrated circuits using passivated tungsten fuses and low-power energy beams to select which tungsten fuses are to be removed. The tungsten fuses are formed in an array to connect possible connection points of the device. A low-power energy source then selects undesired connection points, and a conventional etch removes the selected tungsten fuses, thereby customizing or repairing the integrated circuit. Because neither precision custom masks nor high energy laser sources are required, the problems associated with conventional methods are reduced or eliminated.

Inventors

  • 👤 John MacPherson
  • 👤 Alan H. Huggins

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 16:07
CPC Classifications
H; H10; H10W; H10W20/00; H10W20/40; H10W20/49; H10W20/493; H10W20/494; H10W20/01; H10W20/031; H10W20/067

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 77 words
A structure for customizing or repairing an integrated circuit by electrically disconnecting circuit elements, comprising: a fuse body electrically connecting at least two of said circuit elements, wherein said fuse body comprises a conductive metal; and a passivated conductive metal layer formed from the upper surface of said fuse body, wherein a low power energy source impinges on said passivated conductive metal layer to ablate said passivated conductive metal layer to expose said fuse body for etching.
Claim 2
Dependent Claim 77 words
A structure for customizing or repairing an integrated circuit by electrically disconnecting circuit elements, comprising: a fuse body electrically connecting at least two of said circuit elements, wherein said fuse body comprises a conductive metal; and a passivated conductive metal layer formed from the upper surface of said fuse body, wherein a low power energy source impinges on said passivated conductive metal layer to ablate said passivated conductive metal layer to expose said fuse body for etching.
Claim 3
Dependent Claim 11 words
The structure of claim 1, wherein said conductive metal is tungsten.
Claim 4
Dependent Claim 17 words
The structure of claim 1, wherein said passivated layer is an oxidized layer of said conductive metal.
Claim 5
Dependent Claim 17 words
The structure of claim 3, wherein said passivated layer is an oxidized layer of said fuse body.
Claim 6
Dependent Claim 16 words
The structure of claim 2, wherein said passivated conductive metal layer consists of tungsten and oxide.
Claim 7
Dependent Claim 16 words
The structure of claim 5, wherein said tungsten oxide layer is formed from said fuse body.
Claim 8
Dependent Claim 14 words
The structure of claim 1, wherein said passivated layer overlies only said fuse body.

References Cited (Backward Citations)

US4383165A Cited
US4536949A Cited
JPS62119938A Cited
US5329152A Cited
US5918147A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2003-06-20 2003-12-20 2004-06-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2007-06-20 2007-12-20 2008-06-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2011-06-20 2011-12-20 2012-06-20 $7700.00 Window Closed / Lapsed

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