US6069091A
Expired / Lapsed
US
⏱️ 0.0 years remaining
In-situ sequential silicon containing hard mask layer/silicon layer plasma etch method
Assignee: Taiwan Semiconductor Manufacturing Co TSMC Ltd
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Filing: 1997-12-29
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Granted: 2000-05-30
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Expires: 2017-12-29
Abstract
Abstract A method for etching a silicon layer within a microelectronics fabrication. There is first provided a substrate employed within a microelectronics fabrication. There is then formed over the substrate a blanket silicon layer. There is then formed upon the blanket silicon layer a blanket silicon containing hard mask layer, where the blanket silicon containing hard mask layer is formed from a silicon containing material chosen from the group of silicon containing materials consisting of silicon oxide materials, silicon nitride materials, silicon oxynitride materials and composites of silicon oxide materials, silicon nitride materials and silicon oxynitride materials. There is then formed upon the blanket silicon containing hard mask layer a patterned photoresist layer. There is then etched through a first plasma etch method the blanket silicon containing hard mask layer to form a patterned silicon containing hard mask layer while employing the patterned photoresist layer as a first etch mask layer. The first plasma etch method employs a first etchant gas composition comprising a first fluorine and carbon containing etchant source gas and a first bromine containing etchant source gas. Finally, there is then etched in-situ through a second plasma etch method the blanket silicon layer to form an at least partially etched silicon layer while employing the patterned photoresist layer and the patterned silicon containing hard mask layer as a second etch mask. The second plasma etch method employs a second etchant gas composition comprising a second fluorine and carbon containing etchant source gas, a second bromine containing etchant source gas and a chlorine containing etchant source gas.
Inventors
- 👤 Fa-Yuan Chang
- 👤 Ming-Yeon Hung
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 22:48
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/24; H10P50/242; H10P50/28; H10P50/282; H10P50/283; H10P50/69; H10P50/691; H10W; H10W10/00; H10W10/01; H10W10/011; H10W10/014; H10W10/10; H10W10/17
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
278 words
A method for etching a silicon layer within a microelectronics fabrication comprising: providing a substrate employed within a microelectronics fabrication; forming over the substrate a blanket silicon layer; forming upon the blanket silicon layer a blanket silicon containing hard mask layer, the blanket silicon containing hard mask layer being formed from a silicon containing material chosen from the group of silicon containing materials consisting of silicon oxide materials, silicon nitride materials, silicon oxynitride materials and composites of silicon oxide materials, silicon nitride materials and silicon oxynitride materials; forming upon the blanket silicon containing hard mask layer a patterned photoresist layer; etching, through use of a first plasma etch method, the blanket silicon containing hard mask layer to form a patterned silicon containing hard mask layer while employing the patterned photoresist layer as a first etch mask layer, the first plasma etch method employing a first etchant gas composition comprising a first fluorine and carbon containing etchant source gas and a first bromine containing etchant source gas; and etching in-situ, through use of a second plasma etch method, the blanket silicon layer to form an at least partially etched silicon layer while employing the patterned photoresist layer and the patterned silicon containing hard mask layer as a second etch mask layer, the second plasma etch method employing a second etchant gas composition comprising a second fluorine and carbon containing etchant source gas, a second bromine containing etchant source gas and a chlorine containing etchant source gas, wherein by employing the first plasma etch method and the second plasma etch method in-situ rather than not in-situ the at least partially etched silicon layer is formed with an enhanced sidewall smoothness.
Claim 2
Independent Claim
278 words
A method for etching a silicon layer within a microelectronics fabrication comprising: providing a substrate employed within a microelectronics fabrication; forming over the substrate a blanket silicon layer; forming upon the blanket silicon layer a blanket silicon containing hard mask layer, the blanket silicon containing hard mask layer being formed from a silicon containing material chosen from the group of silicon containing materials consisting of silicon oxide materials, silicon nitride materials, silicon oxynitride materials and composites of silicon oxide materials, silicon nitride materials and silicon oxynitride materials; forming upon the blanket silicon containing hard mask layer a patterned photoresist layer; etching, through use of a first plasma etch method, the blanket silicon containing hard mask layer to form a patterned silicon containing hard mask layer while employing the patterned photoresist layer as a first etch mask layer, the first plasma etch method employing a first etchant gas composition comprising a first fluorine and carbon containing etchant source gas and a first bromine containing etchant source gas; and etching in-situ, through use of a second plasma etch method, the blanket silicon layer to form an at least partially etched silicon layer while employing the patterned photoresist layer and the patterned silicon containing hard mask layer as a second etch mask layer, the second plasma etch method employing a second etchant gas composition comprising a second fluorine and carbon containing etchant source gas, a second bromine containing etchant source gas and a chlorine containing etchant source gas, wherein by employing the first plasma etch method and the second plasma etch method in-situ rather than not in-situ the at least partially etched silicon layer is formed with an enhanced sidewall smoothness.
Claim 3
Dependent Claim
37 words
The method of claim 1 wherein the microelectronics fabrication is chosen from the group of microelectronics fabrications consisting of integrated circuit microelectronics fabrications, solar cell microelectronics fabrications, ceramic substrate microelectronics fabrications and flat panel display microelectronics fabrications.
Claim 4
Dependent Claim
35 words
The method of claim 1 wherein the blanket silicon layer is formed of a silicon material chosen from the group of silicon materials consisting of amorphous silicon materials, monocrystalline silicon materials and polycrystalline silicon materials.
Claim 5
Dependent Claim
113 words
The method of claim 1 wherein: the first fluorine and carbon containing etchant source gas and the second fluorine and carbon containing etchant source gas are selected from the group of fluorine and carbon containing etchant source gases consisting of perfluorocarbons of no greater than three carbon atoms and hydrofluorocarbons of no greater than three carbon atoms; the first bromine containing etchant source gas and the second bromine containing etchant source gas are selected from the group of bromine containing etchant source gases consisting of hydrogen bromide and bromine; and the chlorine containing etchant source gas is selected from the group of chlorine containing etchant source gases consisting of chlorine and hydrogen chloride.
Claim 6
Dependent Claim
30 words
The method of claim 1 wherein: the first etchant gas composition comprises carbon tetrafluoride and hydrogen bromide; and the second etchant gas composition comprises carbon tetrafluoride, hydrogen bromide and chlorine.
Claim 7
Independent Claim
262 words
A method for forming a trench within a silicon semiconductor substrate comprising: providing a silicon semiconductor substrate; forming upon the silicon semiconductor substrate a blanket silicon containing hard mask layer, the blanket silicon containing hard mask layer being formed from a silicon containing material chosen from the group of silicon containing materials consisting of silicon oxide materials, silicon nitride materials, silicon oxynitride materials and composites of silicon oxide materials, silicon nitride materials and silicon oxynitride materials; forming upon the blanket silicon containing hard mask layer a patterned photoresist layer; etching, through use of a first plasma etch method, the blanket silicon containing hard mask layer to form a patterned silicon containing hard mask layer while employing the patterned photoresist layer as a first etch mask layer, the first plasma etch method employing a first etchant gas composition comprising a first fluorine and carbon containing etchant source gas and a first bromine containing etchant source gas; and etching in-situ, through use of a second plasma etch method, the silicon semiconductor substrate to form a trench within the silicon semiconductor substrate while employing the patterned photoresist layer and the patterned silicon containing hard mask layer as a second etch mask layer, the second plasma etch method employing a second etchant gas composition comprising a second fluorine and carbon containing etchant source gas, a second bromine containing etchant source gas and a chlorine containing etchant source gas, wherein by employing the first plasma etch method and the second plasma etch method in-situ rather than not in-situ the trench is formed with an enhanced sidewall smoothness.
Claim 8
Independent Claim
262 words
A method for forming a trench within a silicon semiconductor substrate comprising: providing a silicon semiconductor substrate; forming upon the silicon semiconductor substrate a blanket silicon containing hard mask layer, the blanket silicon containing hard mask layer being formed from a silicon containing material chosen from the group of silicon containing materials consisting of silicon oxide materials, silicon nitride materials, silicon oxynitride materials and composites of silicon oxide materials, silicon nitride materials and silicon oxynitride materials; forming upon the blanket silicon containing hard mask layer a patterned photoresist layer; etching, through use of a first plasma etch method, the blanket silicon containing hard mask layer to form a patterned silicon containing hard mask layer while employing the patterned photoresist layer as a first etch mask layer, the first plasma etch method employing a first etchant gas composition comprising a first fluorine and carbon containing etchant source gas and a first bromine containing etchant source gas; and etching in-situ, through use of a second plasma etch method, the silicon semiconductor substrate to form a trench within the silicon semiconductor substrate while employing the patterned photoresist layer and the patterned silicon containing hard mask layer as a second etch mask layer, the second plasma etch method employing a second etchant gas composition comprising a second fluorine and carbon containing etchant source gas, a second bromine containing etchant source gas and a chlorine containing etchant source gas, wherein by employing the first plasma etch method and the second plasma etch method in-situ rather than not in-situ the trench is formed with an enhanced sidewall smoothness.
Claim 9
Dependent Claim
113 words
The method of claim 6 wherein: the first fluorine and carbon containing etchant source gas and the second fluorine and carbon containing etchant source gas are selected from the group of fluorine and carbon containing etchant source gases consisting of perfluorocarbons having no greater than three carbon atoms and hydrofluorocarbons having no greater than three carbon atoms; the first bromine containing etchant source gas and the second bromine containing etchant source gas are selected from the group of bromine containing etchant source gases consisting of hydrogen bromide and bromine; and the chlorine containing etchant source gas is selected from the group of chlorine containing etchant source gases consisting of chlorine and hydrogen chloride.
Claim 10
Dependent Claim
30 words
The method of claim 6 wherein: the first etchant gas composition comprises carbon tetrafluoride and hydrogen bromide; and the second etchant gas composition comprises carbon tetrafluoride, hydrogen bromide and chlorine.
References Cited (Backward Citations)
US5830807A
Cited
US5817579A
Cited
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