US6066957A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Floating spring probe wireless test fixture
Assignee: Delaware Capital Formation Inc
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Filing: 1998-03-20
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Granted: 2000-05-23
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Expires: 2018-03-20
Abstract
Abstract A test fixture for a printed circuit board having a pattern of test probes and a fixed probe plate and a top plate adapted for movement toward and away from the probe plate. The probe plate and the top plate have selected patterns of holes for passage of the test probes through the probe plate and the top plate for contacting test points on the printed circuit board which is supported at one end of the test fixture. A probe retention plate is positioned below the top plate in an area of the test probes to prevent the test probes from walking out of the probe plate. The fixture further includes a spacer plate including interface probes to convert the fixture between a wired and a wireless text fixture.
Inventors
- 👤 David R. Van Loan
- 👤 Gary F. St. Onge
- 👤 Mark A. Swart
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 20:18
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/073; G01R1/07307; G01R1/07314; G01R1/07328; G01R1/07357
Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
156 words
A test fixture adapted for alignment of test probes with test sites on a printed circuit board under test to translate test signals from the test sites to external test electronics comprising: a stationary probe place having a plurality of holes extending therethrough; an array of receptacleless probes having contoured tips extending through the holes in the probe plate and individually movable in an axial direction through the probe plate; a top plate for moveably supporting the printed circuit board under test generally parallel to the probe plate so that the test probes can contact the test sites; the top plate having contoured guide holes for preventing the test probes from walking out of the probe plate; and an interface located below the probe plate and in contact with the test probes to translate the test signals to the external test electronics when the board under test and the probe plate are moved toward each other.
Claim 2
Dependent Claim
156 words
A test fixture adapted for alignment of test probes with test sites on a printed circuit board under test to translate test signals from the test sites to external test electronics comprising: a stationary probe place having a plurality of holes extending therethrough; an array of receptacleless probes having contoured tips extending through the holes in the probe plate and individually movable in an axial direction through the probe plate; a top plate for moveably supporting the printed circuit board under test generally parallel to the probe plate so that the test probes can contact the test sites; the top plate having contoured guide holes for preventing the test probes from walking out of the probe plate; and an interface located below the probe plate and in contact with the test probes to translate the test signals to the external test electronics when the board under test and the probe plate are moved toward each other.
Claim 3
Dependent Claim
14 words
The test fixture of claim 1 wherein the interface is a printed circuit board.
Claim 4
Dependent Claim
15 words
The test fixture of claim 1 wherein the interface is a plurality of wired pins.
Claim 5
Dependent Claim
24 words
The test fixture of claim 1 wherein the holes in the probe plate have a diameter greater than a diameter of the test probes.
Claim 6
Dependent Claim
146 words
A test fixture adapted for alignment of test probes with test sites on a printed circuit board under test to translate test signals from the test sites to external test electronics comprising: a stationary probe plate having a plurality of holes extending therethrough; an array of test probes extending through the holes in the probe plate; a retention plate positioned over the probe plate and having a plurality of holes extending therethrough sized to retain the test probes in the fixture; means for moveably supporting the printed circuit board under test generally parallel to the probe plate so that the test probes can contact the test sites; and an interface located below the probe plate and in contact with the test probes to translate the test signals to the external test electronics when the board under test and the probe plate are moved toward each other.
Claim 7
Dependent Claim
146 words
A test fixture adapted for alignment of test probes with test sites on a printed circuit board under test to translate test signals from the test sites to external test electronics comprising: a stationary probe plate having a plurality of holes extending therethrough; an array of test probes extending through the holes in the probe plate; a retention plate positioned over the probe plate and having a plurality of holes extending therethrough sized to retain the test probes in the fixture; means for moveably supporting the printed circuit board under test generally parallel to the probe plate so that the test probes can contact the test sites; and an interface located below the probe plate and in contact with the test probes to translate the test signals to the external test electronics when the board under test and the probe plate are moved toward each other.
Claim 8
Dependent Claim
57 words
The test fixture of claim 5 wherein the means for supporting the board under test is a top plate positioned generally parallel to the probe plate and adapted for movement toward and away from the probe plate, the top plate further includes a plurality of holes to guide the test probes extending therethrough towards the test sites.
Claim 9
Dependent Claim
21 words
The test fixture of claim 6 wherein the retention plate includes means for fastening the retention plate to the top plate.
Claim 10
Dependent Claim
36 words
The test fixture of claim 7 wherein the fastening means is at least one guide pin rigidly secured to the top plate and at least one spring positioned around the guide pin above the retention plate.
Claim 11
Dependent Claim
17 words
A test fixture of claim 5 wherein the retention plate is removably attached to the probe plate.
Claim 12
Dependent Claim
175 words
A test fixture adapted for alignment of test probes with test sites on a printed circuit board under test to translate test signals from the test sites to external test electronics comprising: a stationary probe plate having a plurality of holes extending therethrough; an array of test probes extending through the holes in the probe plate and individually movable in an axial direction through the probe plate; means for movable supporting the printed circuit board under test generally parallel to the probe plate so that the test probes can contact the test sites; a retaining plate having holes sized to retain the test probes in the probe plate; a spacer plate positioned below the probe plate containing an array of interface probes extending through the spacer plate in electrical contact with the array of test probes; and an interface located below the probe plate and in contact with the interface probes to translate the test signals to the external test electronics when the board under test and the probe plate are moved toward each other.
Claim 13
Dependent Claim
175 words
A test fixture adapted for alignment of test probes with test sites on a printed circuit board under test to translate test signals from the test sites to external test electronics comprising: a stationary probe plate having a plurality of holes extending therethrough; an array of test probes extending through the holes in the probe plate and individually movable in an axial direction through the probe plate; means for movable supporting the printed circuit board under test generally parallel to the probe plate so that the test probes can contact the test sites; a retaining plate having holes sized to retain the test probes in the probe plate; a spacer plate positioned below the probe plate containing an array of interface probes extending through the spacer plate in electrical contact with the array of test probes; and an interface located below the probe plate and in contact with the interface probes to translate the test signals to the external test electronics when the board under test and the probe plate are moved toward each other.
Claim 14
Dependent Claim
21 words
The test fixture of claim 10 wherein the interface probes are spacer pins and the interface is a printed circuit board.
Claim 15
Dependent Claim
17 words
The test fixture of claim 10 wherein the interface pins are test probes having wire wrap tails.
Claim 16
Dependent Claim
16 words
The test fixture of claim 10 wherein the retaining plate is attached to a top plate.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-05-23 | 2003-11-22 | 2004-05-23 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-05-23 | 2007-11-22 | 2008-05-23 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-05-23 | 2011-11-22 | 2012-05-23 | $7700.00 | Window Closed / Lapsed |