Abstract A guided-probe test fixture is disclosed for connecting circuit cards having electronic components to a board test system. The test fixture utilizes long, leaning or vertical test probes, guide plates and limited probe tip travel in order to achieve high-accuracy, fine-pitch probing of limited-access, no-clean test targets. The guided-probe test fixture of the present invention also utilizes spring probes, probe-mounting plates, personality pins and an alignment plate in order to couple test targets with multiplexed tester resources. The guided-probe test fixture of the present invention may also utilize a universal interface plate with double-headed spring probes and/or a wireless interface printed circuit board to facilitate the electrical coupling of test targets to tester resources. Accordingly, the guided-probe test fixture of the present invention is capable of sophisticated in-circuit and functional testing of a loaded-printed circuit board containing both standard-access and limited-access, no-clean test targets. The present invention is also capable of improved probing accuracy, improved no-clean testability and improved fine-pitch probing of limited-access test targets, while at the same time capable of probing standard-access test targets.
A guided-probe test fixture for electrically connecting one or more limited-access test targets on a loaded circuit board under test with interface probes of a tester, said guided-probe test fixture comprising: a) one or more long, solid test probes; b) a plurality of substantially parallel guide plates having a first side and a second side, said plurality of substantially parallel guide plates having through holes in predetermined locations, such that each of said one or more long, solid test probes extends through said through holes in said guide plates and line up with a corresponding one of said one or more limited-access test targets on said first side of said guide plates; c) a probe-mounting plate on said second side of said guide plates between said plurality of guide plates and said interface probes of said tester when said guided-probe test fixture is mounted on said tester; d) one or more spring probes mounted in said probe-mounting plate, wherein each of said plurality of spring probes lines-up with a corresponding one of said long, solid test probes on said second side of said guide plates; e) one or more personality pins having wire wrap posts mounted in said probe-mounting plate, each of said personality pins being electrically connected to at least one of said spring probes by means of wire wrap between said spring probes and said wire wrap posts; and f) an alignment plate, said wire wrap posts of said personality pins extending through said alignment plate in such a manner that each of said wire wrap posts lines-up with a corresponding interface probe of said tester when said guided-probe test fixture is mounted on said tester.
Claim 2
Dependent Claim
278 words
A guided-probe test fixture for electrically connecting one or more limited-access test targets on a loaded circuit board under test with interface probes of a tester, said guided-probe test fixture comprising: a) one or more long, solid test probes; b) a plurality of substantially parallel guide plates having a first side and a second side, said plurality of substantially parallel guide plates having through holes in predetermined locations, such that each of said one or more long, solid test probes extends through said through holes in said guide plates and line up with a corresponding one of said one or more limited-access test targets on said first side of said guide plates; c) a probe-mounting plate on said second side of said guide plates between said plurality of guide plates and said interface probes of said tester when said guided-probe test fixture is mounted on said tester; d) one or more spring probes mounted in said probe-mounting plate, wherein each of said plurality of spring probes lines-up with a corresponding one of said long, solid test probes on said second side of said guide plates; e) one or more personality pins having wire wrap posts mounted in said probe-mounting plate, each of said personality pins being electrically connected to at least one of said spring probes by means of wire wrap between said spring probes and said wire wrap posts; and f) an alignment plate, said wire wrap posts of said personality pins extending through said alignment plate in such a manner that each of said wire wrap posts lines-up with a corresponding interface probe of said tester when said guided-probe test fixture is mounted on said tester.