US6064092A
Expired / Lapsed
US
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Semiconductor-on-insulator substrates containing electrically insulating mesas
Assignee: Samsung Electronics Co Ltd
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Filing: 1999-04-13
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Granted: 2000-05-16
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Expires: 2019-04-13
Abstract
Abstract Methods of forming semiconductor-on-insulator field effect transistors include the steps of forming an insulated trench containing a semiconductor region therein and an insulating region mesa at a bottom of the trench, so that the semiconductor region has relatively thick regions adjacent the sidewalls of the trench and has a relatively thin region above the mesa. Dopants can then be added to the thick regions to form low resistance source and drain regions on opposite sides of the thin region which acts as the channel region. Because the channel region is thin, low junction capacitance can also be achieved. An insulated gate electrode can also be formed on the face of the semiconductor region, above the channel region, and then source and drain contacts can be formed to the source and drain regions to complete the device. Preferably, the step of forming the trench containing a semiconductor region comprises the steps of patterning an oxidation blocking layer having an opening therein, on a face of a semiconductor substrate, and then oxidizing the substrate at the face to form an electrically insulating region in the opening and adjacent a periphery of the oxidation blocking layer. These steps are performed so that a portion of the electrically insulating region in the opening is thinner than a portion of the electrically insulating region extending adjacent the periphery of the oxidation blocking layer. Next, the oxidation blocking layer is removed from the face of the substrate and then the electrically insulating region is planarized. The planarized insulating region is then used as a substrate by planarizing a back face of the semiconductor substrate until the insulating region is reached. At this point a trench filled with a semiconductor material will remain in the insulating region and this remaining semiconductor material can be used as an SOI substrate.
Inventors
- 👤 Kyu-Charn Park
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-30 02:19
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/60; H10D30/67; H10D30/6757; H10D30/01; H10D30/021; H10D30/031; H10D30/0321; H10D30/0323; H10D30/6758; H10P; H10P90/00; H10P90/19; H10P90/1904; H10P90/1906; H10W; H10W10/00; H10W10/01; H10W10/061; H10W10/10; H10W10/181; H10P90/1914; H10W10/011; H10W10/012; H10W10/014; H10W10/13; H10W10/17
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
110 words
A semiconductor-on-insulator substrate, comprising: an electrically insulating layer having a surface thereon and a trench therein having a bottom and opposing sidewalls; a semiconductor region that is free of electrically inactive impurities selected from the group consisting of oxygen and nitrogen, in the trench; and a mesa insulating region on the bottom of the trench and spaced from the sidewalls thereof, so that a first thickness of the semiconductor region as measured between a top of the mesa and a face of the semiconductor region is less than a second thickness of the semiconductor region as measured between the bottom of the trench and the face of the semiconductor region.
Claim 2
Dependent Claim
110 words
A semiconductor-on-insulator substrate, comprising: an electrically insulating layer having a surface thereon and a trench therein having a bottom and opposing sidewalls; a semiconductor region that is free of electrically inactive impurities selected from the group consisting of oxygen and nitrogen, in the trench; and a mesa insulating region on the bottom of the trench and spaced from the sidewalls thereof, so that a first thickness of the semiconductor region as measured between a top of the mesa and a face of the semiconductor region is less than a second thickness of the semiconductor region as measured between the bottom of the trench and the face of the semiconductor region.
Claim 3
Dependent Claim
19 words
The semiconductor-on-insulator substrate of claim 1, wherein said electrically insulating layer and said mesa insulating region comprise silicon dioxide.
Claim 4
Dependent Claim
184 words
A semiconductor-on-insulator field effect transistor, comprising: an electrically insulating layer having a surface thereon and a trench therein having a bottom and opposing sidewalls; a semiconductor region that is free of electrically inactive impurities selected from the group consisting of oxygen and nitrogen, in the trench a mesa insulating region on a bottom of the trench and spaced from the sidewalls thereof, so that a first thickness of the semiconductor region as measured between a top of the mesa and a face of the semiconductor region is less than a second thickness of the semiconductor region as measured between the bottom of the trench and the face of the semiconductor region; an insulated gate electrode on the face of the semiconductor region, said insulated gate electrode extending opposite the top of the mesa insulating region so that a channel region of first conductivity type is defined in a portion of said semiconductor region extending between said insulated gate electrode and said mesa insulating region; and source and drain regions of second conductivity type in the semiconductor region, at opposite ends of the channel region.
Claim 5
Dependent Claim
184 words
A semiconductor-on-insulator field effect transistor, comprising: an electrically insulating layer having a surface thereon and a trench therein having a bottom and opposing sidewalls; a semiconductor region that is free of electrically inactive impurities selected from the group consisting of oxygen and nitrogen, in the trench a mesa insulating region on a bottom of the trench and spaced from the sidewalls thereof, so that a first thickness of the semiconductor region as measured between a top of the mesa and a face of the semiconductor region is less than a second thickness of the semiconductor region as measured between the bottom of the trench and the face of the semiconductor region; an insulated gate electrode on the face of the semiconductor region, said insulated gate electrode extending opposite the top of the mesa insulating region so that a channel region of first conductivity type is defined in a portion of said semiconductor region extending between said insulated gate electrode and said mesa insulating region; and source and drain regions of second conductivity type in the semiconductor region, at opposite ends of the channel region.
Claim 6
Dependent Claim
20 words
The field effect transistor of claim 3, wherein said electrically insulating layer and said mesa insulating region comprise silicon dioxide.
Claim 7
Dependent Claim
121 words
A semiconductor-on-insulator substrate, comprising: a handling substrate having a flat surface thereon; an electrically insulating layer formed on the handling substrate having a flat surface thereon and a trench formed therein having a bottom and opposing sidewalls, wherein the trench has a mesa insulating region on the bottom of the trench and spaced from the sidewalls thereof, so that a first thickness of the insulating region as measured between the top of the mesa and the bottom of the insulating layer is more than a second thickness of the insulating region as measured between the bottom of the trench and the bottom of the insulating layer; and a semiconductor region filled in the trench and planarized together with the insulating layer.
Claim 8
Dependent Claim
121 words
A semiconductor-on-insulator substrate, comprising: a handling substrate having a flat surface thereon; an electrically insulating layer formed on the handling substrate having a flat surface thereon and a trench formed therein having a bottom and opposing sidewalls, wherein the trench has a mesa insulating region on the bottom of the trench and spaced from the sidewalls thereof, so that a first thickness of the insulating region as measured between the top of the mesa and the bottom of the insulating layer is more than a second thickness of the insulating region as measured between the bottom of the trench and the bottom of the insulating layer; and a semiconductor region filled in the trench and planarized together with the insulating layer.
Claim 9
Dependent Claim
13 words
The semiconductor-on-insulator substrate of claim 5, wherein the insulating layer comprises silicon dioxide.
Claim 10
Dependent Claim
171 words
A semiconductor-on-insulator field effect transistor, comprising: a handling substrate having a flat surface thereon; an electrically insulating layer formed on the handling substrate having a flat surface thereon and a trench formed therein having a bottom and opposing sidewalls, wherein the trench has a mesa insulating region on the bottom of the trench and spaced from the sidewalls thereof, so that a first thickness of the insulating region as measured between the top of the mesa and the bottom of the insulating layer is more than a second thickness of the insulating region as measured between the bottom of the trench and the bottom of the insulating layer; a semiconductor region filled in the trench and planarized together with the insulating layer; an insulated gate electrode on the face of the semiconductor region, opposite the top of the mesa to thereby define a channel region of first conductivity type extending therebetween; and source and drain regions of second conductivity type in the semiconductor region, at opposite ends of the channel region.
Claim 11
Dependent Claim
171 words
A semiconductor-on-insulator field effect transistor, comprising: a handling substrate having a flat surface thereon; an electrically insulating layer formed on the handling substrate having a flat surface thereon and a trench formed therein having a bottom and opposing sidewalls, wherein the trench has a mesa insulating region on the bottom of the trench and spaced from the sidewalls thereof, so that a first thickness of the insulating region as measured between the top of the mesa and the bottom of the insulating layer is more than a second thickness of the insulating region as measured between the bottom of the trench and the bottom of the insulating layer; a semiconductor region filled in the trench and planarized together with the insulating layer; an insulated gate electrode on the face of the semiconductor region, opposite the top of the mesa to thereby define a channel region of first conductivity type extending therebetween; and source and drain regions of second conductivity type in the semiconductor region, at opposite ends of the channel region.
Claim 12
Dependent Claim
14 words
The field effect transistor of claim 7, wherein the insulating layer comprises silicon dioxide.
References Cited (Backward Citations)
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-05-16 | 2003-11-15 | 2004-05-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-05-16 | 2007-11-15 | 2008-05-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-05-16 | 2011-11-15 | 2012-05-16 | $7700.00 | Window Closed / Lapsed |