US6063186A
Expired / Lapsed
US
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Growth of very uniform silicon carbide epitaxial layers
Assignee: Wolfspeed Inc
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Filing: 1997-12-17
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Granted: 2000-05-16
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Expires: 2017-12-17
Abstract
Abstract An improved chemical vapor deposition method is disclosed that increases the uniformity of silicon carbide epitaxial layers and that is particularly useful for obtaining thicker epitaxial layers. The method comprises heating a reactor to a temperature at which silicon carbide source gases will form an epitaxial layer of silicon carbide on a substrate in the reactor; and then directing a flow of source and carrier gases through the heated reactor to form an epitaxial layer of silicon carbide on the substrate with the carrier gases comprising a blend of hydrogen and a second gas in which the second gas has a thermal conductivity that is less than the thermal conductivity of hydrogen so that the source gases deplete less as they pass through the reactor than they would if hydrogen is used as the sole carrier gas.
Inventors
- 👤 Kenneth George Irvine
- 👤 Michael James Paisley
- 👤 Olle Claes Erik Kordina
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 09:51
CPC Classifications
C; C23; C23C; C23C16/00; C23C16/22; C23C16/30; C23C16/32; C23C16/325; C30; C30B; C30B25/00; C30B25/02; C30B29/00; C30B29/10; C30B29/36; Y; Y10; Y10S; Y10S148/00; Y10S148/148
Claims Analysis
Total Claims: 30
Claim 1
Independent Claim
189 words
A method of forming epitaxial layers of silicon carbide on an appropriate substrate by chemical vapor deposition, the method comprising: blending silicon carbide source gases are with a first carrier gas; directing the source gases into a reactor that contains a substrate over which the carrier and source gases flow over the substrates in an upstream to downstream orientation parallel to the epitaxial growth surface of the substrate; heating the reactor to a temperature at which the source gases will react to form an epitaxial layer of silicon carbide on the substrates in the reactor; and while blending a second carrier gas with the first carrier gas, and in which the second carrier gas has a thermal conductivity that is less than the thermal conductivity of the first carrier gas, and wherein the second carrier gas is present in an amount that moderates the temperature sufficiently to reduce or eliminate source gas depletion during the growth of an epitaxial layers of silicon carbide on the substrate, but less than an amount that would reduce the temperature sufficiently to prevent the source gases from reacting to form the epitaxial layer.
Claim 2
Independent Claim
189 words
A method of forming epitaxial layers of silicon carbide on an appropriate substrate by chemical vapor deposition, the method comprising: blending silicon carbide source gases are with a first carrier gas; directing the source gases into a reactor that contains a substrate over which the carrier and source gases flow over the substrates in an upstream to downstream orientation parallel to the epitaxial growth surface of the substrate; heating the reactor to a temperature at which the source gases will react to form an epitaxial layer of silicon carbide on the substrates in the reactor; and while blending a second carrier gas with the first carrier gas, and in which the second carrier gas has a thermal conductivity that is less than the thermal conductivity of the first carrier gas, and wherein the second carrier gas is present in an amount that moderates the temperature sufficiently to reduce or eliminate source gas depletion during the growth of an epitaxial layers of silicon carbide on the substrate, but less than an amount that would reduce the temperature sufficiently to prevent the source gases from reacting to form the epitaxial layer.
Claim 3
Dependent Claim
24 words
A chemical vapor deposition method according to claim 1 wherein the second gas is chemically inert with respect to the chemical vapor deposition reaction.
Claim 4
Dependent Claim
16 words
A chemical vapor deposition method according to claim 1 wherein the second carrier gas comprises argon.
Claim 5
Dependent Claim
28 words
A chemical vapor deposition method according to claim 1 wherein the first carrier gas is selected from the group consisting of helium and blends of helium and hydrogen.
Claim 6
Dependent Claim
33 words
A chemical vapor deposition method according to claim 1 wherein the step of blending the carrier gases comprises blending a greater amount of hydrogen with a lesser amount of the second carrier gas.
Claim 7
Dependent Claim
21 words
A chemical vapor deposition method according to claim 1 wherein the source gases comprise a silicon-containing compound and a carbon-containing compound.
Claim 8
Dependent Claim
17 words
A chemical vapor deposition method according to claim 6 wherein the source gases comprise silane and propane.
Claim 9
Dependent Claim
21 words
A chemical vapor deposition method according to claim 7 comprising heating the system to a temperature less than about 1800° C.
Claim 10
Dependent Claim
23 words
A chemical vapor deposition method according to claim 7 comprising heating the system to a temperature of between about 1500° and 1650° C.
Claim 11
Dependent Claim
26 words
A chemical vapor deposition method according to claim 1 comprising directing the gas flow through the reactor in a direction parallel to the epitaxial growth surface.
Claim 12
Dependent Claim
32 words
A chemical vapor deposition method according to claim 1 comprising directing the source and carrier gases over a silicon carbide substrate selected from the group consisting of the 4H and 6H polytypes.
Claim 13
Dependent Claim
29 words
A chemical vapor deposition method according to claim 1 wherein the second carrier gas is chemically inert with respect to the chemical vapor deposition reaction and the silicon carbide.
Claim 14
Dependent Claim
121 words
In a method of forming epitaxial layers of silicon carbide on appropriate substrates by chemical vapor deposition, and in which silane and propane source gases are blended with hydrogen as the carrier gas and directed into a reactor that is heated to a temperature of between about 1500 and 1650° C. at which the silane and propane will react to form an epitaxial layer of silicon carbide on a substrate, the improvement comprising: blending argon with the hydrogen carrier gas, and wherein the argon is present in an amount that moderates the temperature sufficiently to reduce or eliminate source gas depletion during cvd growth, but less than an amount that keeps the source gases from reacting to form the epitaxial layer.
Claim 15
Dependent Claim
121 words
In a method of forming epitaxial layers of silicon carbide on appropriate substrates by chemical vapor deposition, and in which silane and propane source gases are blended with hydrogen as the carrier gas and directed into a reactor that is heated to a temperature of between about 1500 and 1650° C. at which the silane and propane will react to form an epitaxial layer of silicon carbide on a substrate, the improvement comprising: blending argon with the hydrogen carrier gas, and wherein the argon is present in an amount that moderates the temperature sufficiently to reduce or eliminate source gas depletion during cvd growth, but less than an amount that keeps the source gases from reacting to form the epitaxial layer.
Claim 16
Dependent Claim
26 words
A chemical vapor deposition method according to claim 13 wherein the blend of hydrogen and argon comprises more than 75 percent by volume flow of hydrogen.
Claim 17
Dependent Claim
21 words
A chemical vapor deposition method according to claim 14 wherein the blend comprises about 90 percent by volume flow of hydrogen.
Claim 18
Dependent Claim
26 words
A chemical vapor deposition method according to claim 13 comprising directing the gas flow through the reactor in a direction parallel to the epitaxial growth surface.
Claim 19
Dependent Claim
32 words
A chemical vapor deposition method according to claim 13 comprising directing the source and carrier gases over a silicon carbide substrate selected from the group consisting of the 4H and 6H polytypes.
Claim 20
Dependent Claim
201 words
In a method of forming epitaxial layers of silicon carbide on a plurality of appropriate substrates by chemical vapor deposition by: blending silicon carbide source gases are with a first carrier gas; directing the source gases into a reactor that contains a plurality of substrates linearly arranged along the gas flow path in the reactor so that the carrier and source gases flow over the substrates in an upstream to downstream orientation parallel to the epitaxial growth surface; and heating the reactor to a temperature at which the source gases will react to form an epitaxial layer of silicon carbide on the substrates in the reactor; the improvement that comprises: blending a second carrier gas with the first carrier gas, and in which the second carrier gas has a thermal conductivity that is less than the thermal conductivity of the first carrier gas, and wherein the second carrier gas is present in an amount that moderates the temperature sufficiently to reduce or eliminate source gas depletion during the growth of epitaxial layers of silicon carbide on the substrates, but less than an amount that would reduce the temperature sufficiently to prevent the source gases from reacting to form the epitaxial layer.
Claim 21
Dependent Claim
201 words
In a method of forming epitaxial layers of silicon carbide on a plurality of appropriate substrates by chemical vapor deposition by: blending silicon carbide source gases are with a first carrier gas; directing the source gases into a reactor that contains a plurality of substrates linearly arranged along the gas flow path in the reactor so that the carrier and source gases flow over the substrates in an upstream to downstream orientation parallel to the epitaxial growth surface; and heating the reactor to a temperature at which the source gases will react to form an epitaxial layer of silicon carbide on the substrates in the reactor; the improvement that comprises: blending a second carrier gas with the first carrier gas, and in which the second carrier gas has a thermal conductivity that is less than the thermal conductivity of the first carrier gas, and wherein the second carrier gas is present in an amount that moderates the temperature sufficiently to reduce or eliminate source gas depletion during the growth of epitaxial layers of silicon carbide on the substrates, but less than an amount that would reduce the temperature sufficiently to prevent the source gases from reacting to form the epitaxial layer.
Claim 22
Dependent Claim
29 words
A chemical vapor deposition method according to claim 18 wherein the second carrier gas is chemically inert with respect to the chemical vapor deposition reaction and the silicon carbide.
Claim 23
Dependent Claim
23 words
A chemical vapor deposition method according to claim 18 wherein the first carrier gas comprises hydrogen and the second carrier gas comprises argon.
Claim 24
Dependent Claim
36 words
A chemical vapor deposition method according to claim 18 wherein the step of blending the carrier gases comprises blending a greater amount of the first carrier gas with a lesser amount of the second carrier gas.
Claim 25
Dependent Claim
21 words
A chemical vapor deposition method according to claim 18 wherein the source gases comprise a silicon-containing compound and a carbon-containing compound.
Claim 26
Dependent Claim
16 words
A chemical vapor deposition method according to claim 22 wherein source gases comprise silane and propane.
Claim 27
Dependent Claim
21 words
A chemical vapor deposition method according to claim 23 comprising heating the system to a temperature less than about 1800° C.
Claim 28
Dependent Claim
24 words
A chemical vapor deposition method according to claim 23 wherein the reactor is heated to a temperature of between about 1500° and 1650° C.
Claim 29
Dependent Claim
26 words
A chemical vapor deposition method according to claim 18 comprising directing the gas flow through the reactor in a direction parallel to the epitaxial growth surface.
Claim 30
Dependent Claim
32 words
A chemical vapor deposition method according to claim 18 comprising directing the source and carrier gases over a silicon carbide substrate selected from the group consisting of the 4H and 6H polytypes.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2003-05-16 | 2003-11-15 | 2004-05-16 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-05-16 | 2007-11-15 | 2008-05-16 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2011-05-16 | 2011-11-15 | 2012-05-16 | $7700.00 | Window Closed / Lapsed |