US6054734A
Expired / Lapsed
US
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Non-volatile memory cell having dual gate electrodes
Assignee: Sony Corp
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Filing: 1997-11-05
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Granted: 2000-04-25
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Expires: 2017-11-05
Abstract
Abstract A non-volatile memory device in which gate electrodes are formed on an upper surface and a lower surface of the channel via insulating layers, respectively, one of them is used as a read electrode and the other is used as a write electrode, whereby, at a read operation, the reading is carried out with a reduced influence upon stored charges stored at the time of writing. Particularly, it has a structure in which a source and drain region of the non-volatile semiconductor memory device is formed in the semiconductor layer formed on the insulating layer and, at the same time, one of the read electrode and write electrode is buried in the insulating layer.
Inventors
- 👤 Hiroshi Aozasa
- 👤 Yutaka Hayashi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 18:24
CPC Classifications
H; H10; H10B; H10B20/00; H10B41/00; H10B41/40; H10B41/42; H10B41/43; H10B41/48; H10B69/00; H10D; H10D30/00; H10D30/60; H10D30/67; H10D30/6729; H10D30/673; H10D30/6733; H10D30/6734; H10D30/68; H10D30/6891; H10D30/6894
Claims Analysis
Total Claims: 32
Claim 1
Independent Claim
174 words
A non-volatile semiconductor memory device with reduced read disturb comprising: a semiconductor layer having a first surface and a second surface; a first insulating layer formed on said first surface and a second insulating layer formed on said second surface; and a first gate electrode formed on said first insulating layer and a second gate electrode formed on said second insulating layer; a charge storing means located in said first insulating layer; and a channel region formed in said semiconductor layer between said first gate electrode and said second gate electrode; wherein a thickness of said semiconductor layer at said channel region is such that a first electric field of said first surface of said semiconductor layer exerts an influence on a second electric field of said second surface of said semiconductor layer such that both a first gate threshold voltage measured with respect to said first gate electrode and a second gate threshold voltage measured with respect to said second gate electrode are changed by a charge stored in said charge storing means.
Claim 2
Dependent Claim
174 words
A non-volatile semiconductor memory device with reduced read disturb comprising: a semiconductor layer having a first surface and a second surface; a first insulating layer formed on said first surface and a second insulating layer formed on said second surface; and a first gate electrode formed on said first insulating layer and a second gate electrode formed on said second insulating layer; a charge storing means located in said first insulating layer; and a channel region formed in said semiconductor layer between said first gate electrode and said second gate electrode; wherein a thickness of said semiconductor layer at said channel region is such that a first electric field of said first surface of said semiconductor layer exerts an influence on a second electric field of said second surface of said semiconductor layer such that both a first gate threshold voltage measured with respect to said first gate electrode and a second gate threshold voltage measured with respect to said second gate electrode are changed by a charge stored in said charge storing means.
Claim 3
Dependent Claim
28 words
A non-volatile semiconductor memory as set forth in claim 1, wherein: said first gate electrode is a write electrode; and said second gate electrode is a read electrode.
Claim 4
Dependent Claim
21 words
A non-volatile semiconductor memory device as set forth in claim 1, wherein said charge storing means comprises a multi-layer insulating film.
Claim 5
Dependent Claim
26 words
A non-volatile semiconductor memory device as set forth in claim 1, wherein said charge storing means comprises a floating gate buried in said first insulating layer.
Claim 6
Dependent Claim
26 words
A non-volatile semiconductor memory device as set forth in claim 1, wherein said charge storing means comprises a ferroelectric layer disposed on said first insulating layer.
Claim 7
Dependent Claim
57 words
A non-volatile semiconductor memory device as set forth in claim 1, further comprising: a supporting substrate; a third insulating layer formed on said substrate; and a source region and a drain region formed on said third insulating layer spaced apart from each other, wherein said source and drain regions are each in contact with said channel region.
Claim 8
Dependent Claim
20 words
A non-volatile semiconductor memory device as set forth in claim 1 wherein said semiconductor layer is formed by epitaxial growth.
Claim 9
Dependent Claim
43 words
A non-volatile semiconductor memory device as set forth in claim 6, wherein said supporting substrate is a semiconductor substrate and said semiconductor layer is formed by lateral epitaxial growth from said semiconductor substrate via a connecting opening provided in said third insulating layer.
Claim 10
Dependent Claim
25 words
A non-volatile semiconductor memory device as set forth in claim 1, wherein a plurality of channel regions are connected in series in said semiconductor layer.
Claim 11
Dependent Claim
28 words
A non-volatile semiconductor memory device as set forth in claim 1, wherein an electrode is provided for draining the charges in the channel formed in said semiconductor layer.
Claim 12
Dependent Claim
29 words
A non-volatile semiconductor memory device as set forth in claim 1, wherein the lengths of the first gate electrode and second gate electrode in the channel direction are different.
Claim 13
Dependent Claim
23 words
A non-volatile semiconductor memory device as set forth in claim 6, wherein said third insulating layer is formed directly on said supporting substrate.
Claim 14
Dependent Claim
25 words
A non-volatile semiconductor memory device as set forth in claim 6, wherein said source and drain regions are formed directly on said third insulating layer.
Claim 15
Dependent Claim
23 words
A non-volatile semiconductor memory device as set forth in claim 1, wherein said thickness of said semiconductor layer is 100 nm or less.
Claim 16
Dependent Claim
21 words
A non-volatile semiconductor memory device as set forth in claim 2, wherein said first gate electrode is also an erase electrode.
Claim 17
Dependent Claim
30 words
A non-volatile semiconductor memory device as set forth in claim 2, wherein said first insulating layer is approximately 4 nm thick so as to reduce a required write voltage value.
Claim 18
Dependent Claim
23 words
A non-volatile semiconductor memory device as set forth in claim 2, wherein said second insulating layer is approximately 6 to 8 nm thick.
Claim 19
Dependent Claim
170 words
A non-volatile semiconductor memory device with reduced read disturb comprising: a semiconductor layer having a first surface and a second surface; a first insulating layer formed on said first surface and a second insulating layer formed on said second surface; and a first gate electrode formed on said first insulating layer and a second gate electrode formed on said second insulating layer; a charge storing means located in said first insulating layer; and a channel region formed in said semiconductor layer between said first gate electrode and said second gate electrode; wherein a thickness "d" of said semiconductor layer at said channel region is determined by the following equation: d≦(4εΦ.sub.F /qN.sub.B).sup.1/2 where: Φ F =(kT/q) (1n(N B /n i )); ε is the dielectric constant of said semiconductor layer; q is the amount of the charge of an electron; N B is the concentration of impurities in said channel region; k is Boltzmann's constant; T is absolute temperature; and n i is the intrinsic carrier concentration of said semiconductor layer.
Claim 20
Dependent Claim
170 words
A non-volatile semiconductor memory device with reduced read disturb comprising: a semiconductor layer having a first surface and a second surface; a first insulating layer formed on said first surface and a second insulating layer formed on said second surface; and a first gate electrode formed on said first insulating layer and a second gate electrode formed on said second insulating layer; a charge storing means located in said first insulating layer; and a channel region formed in said semiconductor layer between said first gate electrode and said second gate electrode; wherein a thickness "d" of said semiconductor layer at said channel region is determined by the following equation: d≦(4εΦ.sub.F /qN.sub.B).sup.1/2 where: Φ F =(kT/q) (1n(N B /n i )); ε is the dielectric constant of said semiconductor layer; q is the amount of the charge of an electron; N B is the concentration of impurities in said channel region; k is Boltzmann's constant; T is absolute temperature; and n i is the intrinsic carrier concentration of said semiconductor layer.
Claim 21
Independent Claim
166 words
A method of reducing read disturb in a non-volatile semiconductor memory device comprising: providing a semiconductor layer having a first surface and a second surface; forming a first insulating layer on said first surface and a second insulating layer on said second surface; forming a first gate electrode on said first insulating layer and a second gate electrode on said second insulating layer; forming a charge storing means in said first insulating layer; forming a channel region in said semiconductor layer between said first gate electrode and said second gate electrode; and exerting an influence across said channel region with a first electric field of said first surface of said semiconductor layer on a second electric field of said second surface of said semiconductor layer such that both a first gate threshold voltage measured with respect to said first gate electrode and a second gate threshold voltage measured with respect to said second gate electrode are changed by a charge stored in said charge storing means.
Claim 22
Independent Claim
166 words
A method of reducing read disturb in a non-volatile semiconductor memory device comprising: providing a semiconductor layer having a first surface and a second surface; forming a first insulating layer on said first surface and a second insulating layer on said second surface; forming a first gate electrode on said first insulating layer and a second gate electrode on said second insulating layer; forming a charge storing means in said first insulating layer; forming a channel region in said semiconductor layer between said first gate electrode and said second gate electrode; and exerting an influence across said channel region with a first electric field of said first surface of said semiconductor layer on a second electric field of said second surface of said semiconductor layer such that both a first gate threshold voltage measured with respect to said first gate electrode and a second gate threshold voltage measured with respect to said second gate electrode are changed by a charge stored in said charge storing means.
Claim 23
Dependent Claim
26 words
A method as set forth in claim 19, wherein: said first gate electrode is a write electrode; and said second gate electrode is a read electrode.
Claim 24
Dependent Claim
21 words
A method as set forth in claim 19, wherein said forming a charge storing means comprises forming a multi-layer insulating film.
Claim 25
Dependent Claim
26 words
A method as set forth in claim 19, wherein said forming a charge storing means comprises forming a floating gate buried in said first insulating layer.
Claim 26
Dependent Claim
26 words
A method as set forth in claim 19, wherein said forming a charge storing means comprises forming a ferroelectric layer disposed on said first insulating layer.
Claim 27
Dependent Claim
58 words
A method as set forth in claim 1, further comprising: providing a supporting substrate for said device; forming a third insulating layer on said substrate; and forming a source region and a drain region on said third insulating layer spaced apart from each other, wherein said source and drain regions are each in contact with said channel region.
Claim 28
Dependent Claim
19 words
A method as set forth in claim 19, wherein said forming a semiconductor layer is accomplished by epitaxial growth.
Claim 29
Dependent Claim
51 words
A method non-volatile semiconductor memory device as set forth in claim 24, wherein said supporting substrate is a semiconductor substrate and said forming a semiconductor layer is accomplished by forming said semiconductor layer by lateral epitaxial growth from said semiconductor substrate via a connecting opening provided in said third insulating layer.
Claim 30
Dependent Claim
23 words
A method as set forth in claim 19, further comprising forming a plurality of channel regions connected in series in said semiconductor layer.
Claim 31
Dependent Claim
25 words
A method as set forth in claim 19, further comprising forming an electrode for draining the charges in the channel formed in said semiconductor layer.
Claim 32
Dependent Claim
28 words
A method as set forth in claim 19, further comprising forming the first gate electrode with a different length in the channel direction than the second gate electrode.
References Cited (Backward Citations)
US5675161A
Cited
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| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
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| 3.5 Years (Year 4) | 2003-04-25 | 2003-10-25 | 2004-04-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2007-04-25 | 2007-10-25 | 2008-04-25 | $3760.00 | Window Closed / Lapsed |
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