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US6013419A Expired / Lapsed US ⏱️ 0.0 years remaining

Process for using photosensitive, heat-resistant resin composition to form patterns

Assignee: Fujitsu Ltd
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Filing: 1995-04-06
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Granted: 2000-01-11
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Expires: 2015-04-06
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Abstract

Abstract A method for forming a photosensitive, heat-resistant resin composition film including the step of coating a base material with a varnish made up of a polyimide precursor having no photosensitivity, a photopolymerizable monomer or oligomer capable of providing a high-heat-resistant polymer upon being polymerized, and a polymerization initiator for the monomer or oligomer. The coating is exposed to a light pattern to polymerize the monomer or oligomer in a pattern. The remaining coating is selectively removed from the non-patterned areas. The patterned coating is heat treated to cure the polyimide precursor, thereby forming the film.

Inventors

  • 👤 Motoaki Tani
  • 👤 Eiji Horikoshi
  • 👤 Isao Watanabe
  • 👤 Shoichi Miyahara
  • 👤 Takashi Ito
  • 👤 Makoto Sasaki

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-03 10:22
CPC Classifications
H; H05; H05K; H05K3/00; H05K3/0011; H05K3/0017; H05K3/0023; G; G03; G03F; G03F7/00; G03F7/004; G03F7/027; G03F7/032; G03F7/037; H05K3/46; H05K3/4644; H05K3/4673; H05K3/4676; H05K2201/00; H05K2201/01; H05K2201/0137; H05K2201/0154; H05K2201/02; H05K2201/0203; H05K2201/0206; H05K2201/0212; H05K2203/00; H05K2203/07; H05K2203/0756; H05K2203/0773; H05K3/38; H05K3/381; H05K3/467; Y; Y10; Y10S; Y10S430/00; Y10S430/1053; Y10S430/1055; Y10S430/106; Y10S430/107; Y10S430/114; Y10S430/12; Y10S430/121; Y10S430/126

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 290 words
A process for formation of a pattern of a heat-resistant insulating polyimide resin film on a base material, said process consisting of: (a) coating a surface of the base material with a resin composition including (1) a non-photosensitive polyimide precursor varnish capable of undergoing a cyclodehydration reaction to provide a polyimide, (2) a photopolymerizable acrylic or methacrylic monomer or oligomer compatible with said non-photosensitive polyimide precursor and capable of undergoing photopolymerization to provide a high-heat-resistant polymer, wherein said oligomer or monomer is represented by the following formula: ##STR10## wherein A is an acrylic or methacrylic acid; B is a polyhydric alcohol; C is a polybasic acid; and n denotes an integer having a value of one or more; and (3) a photopolymerization initiator for said monomer or oligomer, (b) exposing the resultant coating to a light pattern to photopolymerize said monomer or oligomer in a predetermined pattern through the action of a radical generated from said photopolymerization initiator, thereby selectively causing said monomer or oligomer to form a high-heat-resistant polymer in said composition at preselected regions of the coating without causing photopolymerization of said non-photosensitive polyimide precursor in said composition at said preselected regions of the coating; (c) selectively removing said coating from said base material at regions other than said preselected regions where said high-heat-resistant polymer of said monomer or oligomer has been formed by said photopolymerization thereof; and (d) heat-treating the coating remaining at said preselected regions to thereby cause said non-photosensitive polyimide precursor contained in the coating at said preselected regions to undergo the cyclodehydration reaction to thereby cure said polyimide precursor to form polyimide, and present said heat-resistant insulating resin film at said preselected regions; and (e) retaining the photopolymerized monomer or oligomer in said film.
Claim 2
Dependent Claim 290 words
A process for formation of a pattern of a heat-resistant insulating polyimide resin film on a base material, said process consisting of: (a) coating a surface of the base material with a resin composition including (1) a non-photosensitive polyimide precursor varnish capable of undergoing a cyclodehydration reaction to provide a polyimide, (2) a photopolymerizable acrylic or methacrylic monomer or oligomer compatible with said non-photosensitive polyimide precursor and capable of undergoing photopolymerization to provide a high-heat-resistant polymer, wherein said oligomer or monomer is represented by the following formula: ##STR10## wherein A is an acrylic or methacrylic acid; B is a polyhydric alcohol; C is a polybasic acid; and n denotes an integer having a value of one or more; and (3) a photopolymerization initiator for said monomer or oligomer, (b) exposing the resultant coating to a light pattern to photopolymerize said monomer or oligomer in a predetermined pattern through the action of a radical generated from said photopolymerization initiator, thereby selectively causing said monomer or oligomer to form a high-heat-resistant polymer in said composition at preselected regions of the coating without causing photopolymerization of said non-photosensitive polyimide precursor in said composition at said preselected regions of the coating; (c) selectively removing said coating from said base material at regions other than said preselected regions where said high-heat-resistant polymer of said monomer or oligomer has been formed by said photopolymerization thereof; and (d) heat-treating the coating remaining at said preselected regions to thereby cause said non-photosensitive polyimide precursor contained in the coating at said preselected regions to undergo the cyclodehydration reaction to thereby cure said polyimide precursor to form polyimide, and present said heat-resistant insulating resin film at said preselected regions; and (e) retaining the photopolymerized monomer or oligomer in said film.
Claim 3
Dependent Claim 30 words
A process for formation of a pattern according to claim 1, in which said photopolymerization initiator is selected from the group consisting of 2-(o-chlorophenyl)-4,5-bis(m-methoxyphenyl)-imidazole dimer, 2,2'bis(o-chlorophenyl)-4,4',5,5'-tetraphenyl-1,2'-biimidazole, 1H-imidazole dimer, and 2,5-bis(o-chlorophenyl)-4-(3,4-dimethoxyphenyl)-dimer.
Claim 4
Dependent Claim 36 words
A process for formation of a pattern according to claim 1, which is used for production of a circuit substrate for high-density mounting of a printed circuit, a printed board, a wiring board or electronic component.

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Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2003-01-10 2003-07-12 2004-01-11 $2000.00 Window Closed / Lapsed
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