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US6012224A Expired / Lapsed US ⏱️ 0.0 years remaining

Method of forming compliant microelectronic mounting device

Assignee: Adeia Semiconductor Solutions LLC
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Filing: 1997-09-25
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Granted: 2000-01-11
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Expires: 2017-09-25
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Abstract

Abstract The present invention provides an interconnection scheme having compliant contacts arranged in an array to connect conductive surfaces on a microelectronic device and a supporting substrate, such as a printed circuit board. This invention accommodates for the difference in thermal coefficients of expansion between the device and the supporting substrate. Typically, an area array of conductive contact pads are connected into rows by conductive leads on a flexible, intermediate substrate. Each of the conductive leads bridges a bonding hole in the intermediate substrate which is situated between successive contact pads. Each of the conductive leads further has a frangible portion within or near each bonding hole. A stand-off between the intermediate substrate and the device is create by compliant dielectric pads, typically composed of an elastomer material, positioned under each contact pad. The frangible portions allow the leads to be cleanly broken, bent and secured into electrical contact with mating contact pads on the device. Each of these connections may be supported by a compliant layer, typically an uncured elastomer which fills the area around the dielectric pads and is then cured.

Inventors

  • 👤 Thomas H. DiStefano
  • 👤 John W. Smith
  • 👤 Zlata Kovac
  • 👤 Konstantine Karavakis

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 12:35
CPC Classifications
H; H05; H05K; H05K3/00; H05K3/40; H05K3/4038; H05K3/4084; H10; H10W; H10W44/00; H10W44/601; H10W70/00; H10W70/01; H10W70/04; H10W70/047; H10W70/60; H10W70/62; H10W70/63; H10W70/635; H10W70/67; H10W70/688; H10W72/00; H10W74/00; H10W74/01; H10W74/012; H10W74/10; H10W74/15; H10W76/00; H10W76/40; H10W76/42; H10W76/45; H10W90/00; H10W90/701; H05K1/00; H05K1/02; H05K1/11; H05K1/118; H05K2201/00; H05K2201/01; H05K2201/0104; H05K2201/0133; H05K2201/03; H05K2201/0332; H05K2201/0388; H05K2201/0394; H05K2201/0397; H05K2201/09; H05K2201/09009; H05K2201/09081; H05K2201/091; H05K2203/00; H05K2203/06; H05K2203/063; H05K3/36; H05K3/361; H10W70/65; H10W70/654; H10W70/655; H10W72/071; H10W72/072; H10W72/07231; H10W72/07236; H10W72/073; H10W72/07321; H10W72/07327; H10W72/851; H10W72/853; H10W72/856; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49117; Y10T29/49124; Y10T29/4913; Y10T29/49144; Y10T29/49147; Y10T29/49149

Claims Analysis

Total Claims: 22
Claim 1
Independent Claim 114 words
A method of providing a compliant interconnection between a chip mounting device and a microelectronic device, comprising the steps of: providing an intermediate substrate having on a first side a conductive lead bridging a bonding hole in the intermediate substrate to electrically connect two successive intermediate contact pads, each lead having a weak point in the conductive lead within or near a perimeter of the bonding holes; coupling a second side of the intermediate substrate to the microelectronic device using a compliant layer adhered to both the substrate and the chip; and breaking the conductive lead at its weak point and coupling it to a juxtaposed chip contact pad located on the semiconductor chip.
Claim 2
Independent Claim 114 words
A method of providing a compliant interconnection between a chip mounting device and a microelectronic device, comprising the steps of: providing an intermediate substrate having on a first side a conductive lead bridging a bonding hole in the intermediate substrate to electrically connect two successive intermediate contact pads, each lead having a weak point in the conductive lead within or near a perimeter of the bonding holes; coupling a second side of the intermediate substrate to the microelectronic device using a compliant layer adhered to both the substrate and the chip; and breaking the conductive lead at its weak point and coupling it to a juxtaposed chip contact pad located on the semiconductor chip.
Claim 3
Dependent Claim 33 words
The method as claimed in claim 1, wherein the coupling the intermediate substrate to the microelectronic device step includes the step of: adhering compliant buttons between the intermediate substrate and the semiconductor chip.
Claim 4
Dependent Claim 32 words
The method as claimed in claim 2, further comprising the steps of: filling an open area between the substrate and the microelectronic device with uncured elastomer material; and curing the elastomer material.
Claim 5
Dependent Claim 28 words
The method as claimed in claim 1, further comprising the step of: coupling a highly conductive layer on a surface of the conductive lead within the bonding hole.
Claim 6
Dependent Claim 54 words
The method as claimed in claim 1 wherein the step of providing a flexible substrate having an array of bonding holes further comprises the step of: situating each bonding hole between four contact pads defining the corners of a square, wherein the conductive lead connects successive, diagonal intermediate contact pads across the bonding hole.
Claim 7
Independent Claim 102 words
A method of fabricating a compliant interconnection component, comprising the steps of: providing a flexible substrate having an array of bonding holes; forming a plurality of conductive leads and base pads on a first side of the flexible substrate such that the conductive leads bridge the bonding holes and electrically couple each of the base pads forming a plurality of conductive lead/base pad rows; using the conductive lead/base pad rows for electroplating a substrate contact pad on an exposed surface of each base pad; and providing a frangible point in the conductive leads within or near a perimeter of each bonding hole.
Claim 8
Independent Claim 102 words
A method of fabricating a compliant interconnection component, comprising the steps of: providing a flexible substrate having an array of bonding holes; forming a plurality of conductive leads and base pads on a first side of the flexible substrate such that the conductive leads bridge the bonding holes and electrically couple each of the base pads forming a plurality of conductive lead/base pad rows; using the conductive lead/base pad rows for electroplating a substrate contact pad on an exposed surface of each base pad; and providing a frangible point in the conductive leads within or near a perimeter of each bonding hole.
Claim 9
Dependent Claim 38 words
The method as claimed in claim 6, wherein using the conductive lead/base pad rows for electro-plating a substrate contact pad further includes the step of: providing a conductive frame electrically connected to each of the lead/base pad rows.
Claim 10
Dependent Claim 34 words
The method as claimed in claim 6, further comprising the step of: coupling a conductive layer on the second side of the flexible substrate to be used as a power, ground or shielding plane.
Claim 11
Dependent Claim 29 words
The method as claimed in claim 6, further comprising the step of: coupling a highly conductive joining layer on a surface of each conductive lead within each bonding hole.
Claim 12
Dependent Claim 51 words
The method as claimed in claim 6 wherein the steps of providing a flexible substrate having an array of bonding holes and forming the plurality of base pads further comprise the step of: creating an interstitial array of base pads and bonding holes on the first de of the flexible substrate.
Claim 13
Dependent Claim 53 words
The method as claimed in claim 6 wherein the step of providing flexible substrate having an array of bonding holes further comprises the step of: situating each bonding hole between four base pads defining the corners of a square, wherein each conductive lead connects successive, diagonal substrate contact pads across the bonding hole.
Claim 14
Independent Claim 82 words
A method of forming a compliant layer between a microelectronic device and a chip carrier having leads in electrical connection therebetween, the method comprising the steps of: placing a plurality of standoffs other than the leads between the chip carrier and the device producing a gap therebetween; introducing a liquid into the gap, such that said liquid is disposed between the chip carrier and the device, and curing the liquid to create a compliant layer between the chip carrier and the device.
Claim 15
Independent Claim 82 words
A method of forming a compliant layer between a microelectronic device and a chip carrier having leads in electrical connection therebetween, the method comprising the steps of: placing a plurality of standoffs other than the leads between the chip carrier and the device producing a gap therebetween; introducing a liquid into the gap, such that said liquid is disposed between the chip carrier and the device, and curing the liquid to create a compliant layer between the chip carrier and the device.
Claim 16
Dependent Claim 14 words
The method as claimed in claim 12 wherein the liquid is a curable elastomer.
Claim 17
Dependent Claim 21 words
The method as claimed in claim 12 wherein the standoffs are compliant buttons adhered between the chip carrier and the device.
Claim 18
Dependent Claim 28 words
The method as claimed in claim 14 wherein each of the compliant buttons is positioned beneath a contact pad located on an opposite side of the chip carrier.
Claim 19
Dependent Claim 13 words
The method as claimed in claim 12 wherein the standoffs are rigid posts.
Claim 20
Dependent Claim 15 words
The method as claimed in claim 12 wherein the standoffs are compliant, substantially parallel ribs.
Claim 21
Dependent Claim 27 words
The method as claimed in claim 12 further comprising: providing support for attaching the leads between the device and the chip carrier with the plurality of standoffs.
Claim 22
Dependent Claim 27 words
The method as claimed in claim 12 wherein the step of introducing a liquid into the gap encapsulates the leads between the device and the chip carrier.

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2003-01-10 2003-07-12 2004-01-11 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2007-01-10 2007-07-12 2008-01-11 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2011-01-10 2011-07-12 2012-01-11 $7700.00 Window Closed / Lapsed

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