Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
114 words
A semiconductor device comprising: a semiconductor pellet including a plurality of electrode pads; an insulation layer serving as a sealing layer formed to cover the entire surface of said semiconductor pellet having a via hole portion above each of said electrode pads in association therewith; a plurality of wiring patterns comprising a via hole wiring portion electrically connected to said electrode pad at the bottom of each of the via hole portions of the insulation layer and a land portion connected thereto and located in a position offset from said via hole portion; and an external electrode in the form of a ball provided on the land portion of each of said wiring patterns.
Claim 2
Dependent Claim
114 words
A semiconductor device comprising: a semiconductor pellet including a plurality of electrode pads; an insulation layer serving as a sealing layer formed to cover the entire surface of said semiconductor pellet having a via hole portion above each of said electrode pads in association therewith; a plurality of wiring patterns comprising a via hole wiring portion electrically connected to said electrode pad at the bottom of each of the via hole portions of the insulation layer and a land portion connected thereto and located in a position offset from said via hole portion; and an external electrode in the form of a ball provided on the land portion of each of said wiring patterns.
Claim 3
Dependent Claim
56 words
A semiconductor device according to claim 1, further comprising a barrier metal region which is formed under said insulation layer in association with each of said electrode pads so as to cover a region including the upper surface thereof and to which said wiring pattern is in contact at the bottom of said via hole portion.
Claim 4
Dependent Claim
25 words
A semiconductor device according to claim 1, wherein said wiring patterns are covered by a metal layer having an anti-corrosive effect on their exposed surface.
Claim 5
Dependent Claim
31 words
A semiconductor device according to claim 1, wherein said wiring patterns are routed on said insulation layer such that the land portions are regularly arranged in the form of a matrix.
Claim 6
Dependent Claim
48 words
A semiconductor device according to claim 1, wherein cut-outs are formed on sides of said semiconductor pellet to provide a stepped configuration in which the upper surface of the pellet is smaller in width than the lower surface and wherein the cut-outs are covered by said insulation layer.
Claim 7
Dependent Claim
25 words
A semiconductor device according to claim 2, wherein said wiring patterns are covered by a metal layer having an anti-corrosive effect on their exposed surface.
Claim 8
Dependent Claim
31 words
A semiconductor device according to claim 2, wherein said wiring patterns are routed on said insulation layer such that the land portions are regularly arranged in the form of a matrix.
Claim 9
Dependent Claim
31 words
A semiconductor device according to claim 3, wherein said wiring patterns are routed on said insulation layer such that the land portions are regularly arranged in the form of a matrix.
Claim 10
Dependent Claim
48 words
A semiconductor device according to claim 2, wherein cut-outs are formed on sides of said semiconductor pellet to provide a stepped configuration in which the upper surface of the pellet is smaller in width than the lower surface and wherein the cut-outs are covered by said insulation layer.
Claim 11
Dependent Claim
48 words
A semiconductor device according to claim 3, wherein cut-outs are formed on sides of said semiconductor pellet to provide a stepped configuration in which the upper surface of the pellet is smaller in width than the lower surface and wherein the cut-outs are covered by said insulation layer.
Claim 12
Dependent Claim
48 words
A semiconductor device according to claim 4, wherein cut-outs are formed on sides of said semiconductor pellet to provide a stepped configuration in which the upper surface of the pellet is smaller in width than the lower surface and wherein the cut-outs are covered by said insulation layer.