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US5973767A Expired / Lapsed US ⏱️ 0.0 years remaining

Off-axis illuminator lens mask for photolithographic projection system

Assignee: Bell Semiconductor LLC
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Filing: 1998-06-26
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Granted: 1999-10-26
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Expires: 2018-06-26
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Abstract

Abstract The present invention provides for novel off-axis illuminator lens masks for semiconductor photolithographic projection systems. The masks are rotationally symmetric along axes 60° or 120° apart. Such masks can increase the contrast 30° and 60° with respect to the X and Y axes of an integrated circuit in a semiconductor wafer for the optimum printing of conducting lines along these directions.

Inventors

  • 👤 Nicholas F. Pasch

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-08 14:23
CPC Classifications
G; G03; G03F; G03F7/00; G03F7/70; G03F7/70058; G03F7/70091; G03F7/701

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 125 words
An improved semiconductor wafer photolithographic system for projecting an image pattern onto a semiconductor wafer, said system comprising: an optical source for generating light; a mask defining said image pattern; an illuminator lens disposed between said optical source and said mask for illuminating said image pattern from said optical source light; primary lens disposed between said mask and said semiconductor water for focussing said image pattern from said mask onto said semiconductor wafer; and an off-axis illuminator lens mask mounted between said optical source and said illuminator lens, centered about a central optical axis, said mask having a plurality of discrete transmissive portions and a contiguous opaque portion, said transmissive portions being spaced at 60 degree or 120 degree intervals with respect to each other.
Claim 2
Dependent Claim 125 words
An improved semiconductor wafer photolithographic system for projecting an image pattern onto a semiconductor wafer, said system comprising: an optical source for generating light; a mask defining said image pattern; an illuminator lens disposed between said optical source and said mask for illuminating said image pattern from said optical source light; primary lens disposed between said mask and said semiconductor water for focussing said image pattern from said mask onto said semiconductor wafer; and an off-axis illuminator lens mask mounted between said optical source and said illuminator lens, centered about a central optical axis, said mask having a plurality of discrete transmissive portions and a contiguous opaque portion, said transmissive portions being spaced at 60 degree or 120 degree intervals with respect to each other.
Claim 3
Dependent Claim 24 words
The improved semiconductor wafer photolithographic system of claim 1 wherein said pattern of said off-axis illuminator lens mask has transmissive portions along said axes.
Claim 4
Dependent Claim 56 words
For a semiconductor wafer photolithographic projection device, an off-axis illuminator lens mask centered about a central optical axis, comprising a substantially flat surface having a pattern thereon comprised of a plurality of discrete transmissive portions and an opaque portion, said discrete transmissive portions being spaced at 60 degrees or 120 degrees with respect to each other.
Claim 5
Dependent Claim 56 words
For a semiconductor wafer photolithographic projection device, an off-axis illuminator lens mask centered about a central optical axis, comprising a substantially flat surface having a pattern thereon comprised of a plurality of discrete transmissive portions and an opaque portion, said discrete transmissive portions being spaced at 60 degrees or 120 degrees with respect to each other.
Claim 6
Dependent Claim 23 words
The off-axis illuminator lens mask of claim 3 wherein said pattern of said off-axis illuminator lens mask has transmissive portions along said axes.

References Cited (Backward Citations)

US5114223A Cited
US5117255A Cited
US5757470A Cited
US5473412A Cited
US5502313A Cited
US5629805A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2002-10-25 2003-04-26 2003-10-26 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2006-10-25 2007-04-26 2007-10-26 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2010-10-25 2011-04-26 2011-10-26 $7700.00 Window Closed / Lapsed

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