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US5973567A Expired / Lapsed US ⏱️ 0.0 years remaining

Tunable impedance matching network for a mic power amplifier module

Assignee: The AT&T MVPD Group LLC
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Filing: 1997-06-16
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Granted: 1999-10-26
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Expires: 2017-06-16
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Abstract

Abstract The output impedance matching network of a power amplifier module is improved by the addition of an intermediate set of bonding pads in close proximity to a power transistor in the power amplifier module. A tunable set of bond wires extend from the intermediate bonding pads to a transmission line that is coupled to the output of the power amplifier module. The tunable bond wires allow the inductance of the impedance matching network to be tuned and optimized.

Inventors

  • 👤 Mark D. Heal
  • 👤 John R. Grebliunas
  • 👤 Howard T. Ozaki
  • 👤 Arnold L. Berman

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-08 02:44
CPC Classifications
H; H03; H03F; H03F1/00; H03F1/56; H03F1/565; H03F3/00; H03F3/60; H03F3/602; H03F3/604; H10; H10W; H10W44/00; H10W44/20; H10W44/203; H10W44/206; H10W44/226; H10W72/00; H10W72/50; H10W72/541; H10W72/5445; H10W72/547; H10W72/5475; H10W72/551; H10W72/552; H10W72/5522; H10W90/00; H10W90/701; H10W90/751; H10W90/753; H10W90/754

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 95 words
A method of enhancing an impedance match between integrated-circuit transistors and transmission lines, comprising the steps of: coupling a microstrip power-guidance structure to one of said transmission lines; positioning a dielectric substrate and its bonding pads proximate to a selected one of said transistors; connecting said selected transistor to said bonding pads with bonding wires; installing a plurality of inductive leads between said bonding pads and said microstrip power-guidance structure; and altering at least one of the length, shape and lead proximity of at least one of said inductive leads to enhance said impedance match.
Claim 2
Independent Claim 95 words
A method of enhancing an impedance match between integrated-circuit transistors and transmission lines, comprising the steps of: coupling a microstrip power-guidance structure to one of said transmission lines; positioning a dielectric substrate and its bonding pads proximate to a selected one of said transistors; connecting said selected transistor to said bonding pads with bonding wires; installing a plurality of inductive leads between said bonding pads and said microstrip power-guidance structure; and altering at least one of the length, shape and lead proximity of at least one of said inductive leads to enhance said impedance match.
Claim 3
Dependent Claim 31 words
The method of claim 1, wherein said altering step includes the step of reattaching to their respective bonding pads, any of said inductive leads that have detached during said altering step.
Claim 4
Dependent Claim 38 words
The method of claim 1, wherein said positioning step includes the step of causing said bonding pads to have an area sufficient to facilitate reattachment of any of said inductive leads that have detached during said altering step.
Claim 5
Dependent Claim 15 words
The method of claim 3, wherein said area is on the order of 0.25×0.37 millimeters.
Claim 6
Dependent Claim 31 words
The method of claim 1, wherein said positioning step includes the step of locating said dielectric substrate so that said bonding wires have substantially one-eighth the length of said inductive leads.
Claim 7
Dependent Claim 24 words
The method of claim 1, wherein said positioning step includes the step of placing said dielectric substrate within 0.37 millimeters of said selected transistor.
Claim 8
Dependent Claim 13 words
The method of claim 1, wherein said power-guidance structure is a power combiner.
Claim 9
Dependent Claim 13 words
The method of claim 1, wherein said dielectric substrate is an alumina substrate.

References Cited (Backward Citations)

US5162755A Cited
US5357212A Cited
US5576661A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2002-10-25 2003-04-26 2003-10-26 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2006-10-25 2007-04-26 2007-10-26 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2010-10-25 2011-04-26 2011-10-26 $7700.00 Window Closed / Lapsed

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