Patent US5956252A successfully refreshed from Google Patents.
US5956252A
Expired / Lapsed
US
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Method and apparatus for an integrated circuit that is reconfigurable based on testing results
Assignee: ATI Technologies ULC
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Filing: 1997-05-09
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Granted: 1999-09-21
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Expires: 2017-05-09
Abstract
Abstract A method and apparatus for reconfiguring an integrated circuit based on testing results is accomplished by an integrated circuit that includes a first circuit, a second circuit, and configuration circuitry deposited on a single die. After testing of the die, the configuration circuitry configures the integrated circuit based on the results of the testing. If both circuits passed the testing, the configuration circuitry couples, where appropriate, the first and second circuits together. If, however, the first circuit failed the testing and the second circuit passed the testing, the configuration circuitry configures the integrated circuit as if only the second circuit were present on the die. If, however, the second circuit failed the testing and the first circuit passed the testing, the configuration circuitry configures the integrated circuit as if only the first circuit were present on the die.
Inventors
- 👤 Lee K. Lau
- 👤 Robert P. Bicevskis
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-09 08:33
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/317; G01R31/3181; G01R31/3185; G01R31/318505; G06; G06F; G06F11/00; G06F11/07; G06F11/16; G06F11/20; G06F15/00; G06F15/76; G06F15/78; G06F15/7867
Claims Analysis
Total Claims: 24
Claim 1
Independent Claim
71 words
An integrated circuit comprising: a first circuit deposited on a die; a second circuit deposited on the die; configuration circuitry deposited on the die, wherein the configuration circuitry is operably coupled to the first circuit and the second circuit, wherein the configuration circuitry allows the first and second circuits to undergo testing and wherein the configuration circuitry configures the integrated circuit based on functional status of the first and second circuit.
Claim 2
Dependent Claim
71 words
An integrated circuit comprising: a first circuit deposited on a die; a second circuit deposited on the die; configuration circuitry deposited on the die, wherein the configuration circuitry is operably coupled to the first circuit and the second circuit, wherein the configuration circuitry allows the first and second circuits to undergo testing and wherein the configuration circuitry configures the integrated circuit based on functional status of the first and second circuit.
Claim 3
Dependent Claim
38 words
The integrated circuit of claim 1 further comprises the configuration circuitry including a multiplexor and configuration pads, wherein the multiplexor provides configuration coupling of the first and second circuits to the configuration pads based on the functional status.
Claim 4
Dependent Claim
28 words
The integrated circuit of claim 1 further comprises the configuration circuit configuring the integrated circuit to use only the first circuit when the second circuit failed the testing.
Claim 5
Dependent Claim
28 words
The integrated circuit of claim 1 further comprises the configuration circuit configuring the integrated circuit to use only the second circuit when the first circuit failed the testing.
Claim 6
Dependent Claim
21 words
The integrated circuit of claim 1 further comprises the first circuit including a graphics processor and the second circuit including memory.
Claim 7
Dependent Claim
28 words
The integrated circuit of claim 1 further comprises the configuration circuit configuring the integrated circuit to use the first and second circuits together when both passed the testing.
Claim 8
Dependent Claim
31 words
The integrated circuit of claim 1 further comprises the configuration circuitry reconfiguring at least one of input access output access to the first circuit when the second circuit failed the testing.
Claim 9
Dependent Claim
31 words
The integrated circuit of claim 1 further comprises the configuration circuitry reconfiguring at least one of input access output access to the second circuit when the first circuit failed the testing.
Claim 10
Dependent Claim
40 words
The integrated circuit of claim 8 further comprises the configuration circuit reconfiguring the second circuit to a memory of X * n K by Y/n bits, when the second circuit is memory originally configured as X K by Y bits.
Claim 11
Independent Claim
61 words
A method for manufacturing an integrated circuit, the method comprising the steps of: a) depositing a first circuit and a second circuit on a die; b) testing the first and second circuits; c) when one of the first and second circuits fails the test, marking the die to indicate either the first circuit or the second circuit that passed the testing.
Claim 12
Independent Claim
61 words
A method for manufacturing an integrated circuit, the method comprising the steps of: a) depositing a first circuit and a second circuit on a die; b) testing the first and second circuits; c) when one of the first and second circuits fails the test, marking the die to indicate either the first circuit or the second circuit that passed the testing.
Claim 13
Dependent Claim
22 words
The method of claim 10 further comprises marking the die to indicate that both the first and second circuits passed the testing.
Claim 14
Dependent Claim
14 words
The method of claim 11 further comprises packaging the die based on the marking.
Claim 15
Dependent Claim
22 words
The method of claim 10 further comprises marking the die to indicate that both the first and second circuits failed the testing.
Claim 16
Dependent Claim
16 words
The method of claim 10 further comprises, within step (a), depositing configuration circuitry on the die.
Claim 17
Dependent Claim
29 words
The method of claim 14 further comprises instructing the configuration circuitry to reconfigure the integrated circuit to use the first circuit or the second circuit that passed the testing.
Claim 18
Dependent Claim
41 words
The method of claim 14 further comprises instructing the configuration circuitry to reconfigure the second circuit to a memory of X * n K by Y/n bits, when the second circuit is memory originally configured as X K by Y bits.
Claim 19
Dependent Claim
75 words
An integrated circuit comprises: a video graphics circuit deposited on a die; memory deposited on the die; and configuration circuitry deposited on the die, wherein the configuration circuitry is operably coupled to the video graphics circuit and the memory, wherein the configuration circuitry allows the video graphics circuit and the memory to undergo testing and wherein the configuration circuitry configures the integrated circuit based on functional status of the video graphics circuit and the memory.
Claim 20
Dependent Claim
75 words
An integrated circuit comprises: a video graphics circuit deposited on a die; memory deposited on the die; and configuration circuitry deposited on the die, wherein the configuration circuitry is operably coupled to the video graphics circuit and the memory, wherein the configuration circuitry allows the video graphics circuit and the memory to undergo testing and wherein the configuration circuitry configures the integrated circuit based on functional status of the video graphics circuit and the memory.
Claim 21
Dependent Claim
71 words
An integrated circuit comprises: a processing circuit deposited on a die; memory deposited on the die; and configuration circuitry deposited on the die, wherein the configuration circuitry is operably coupled to the processing circuit and the memory, wherein the configuration circuitry allows the processing circuit and the memory to undergo testing and wherein the configuration circuitry configures the integrated circuit based on functional status of the processing circuit and the memory.
Claim 22
Dependent Claim
71 words
An integrated circuit comprises: a processing circuit deposited on a die; memory deposited on the die; and configuration circuitry deposited on the die, wherein the configuration circuitry is operably coupled to the processing circuit and the memory, wherein the configuration circuitry allows the processing circuit and the memory to undergo testing and wherein the configuration circuitry configures the integrated circuit based on functional status of the processing circuit and the memory.
Claim 23
Independent Claim
61 words
A method for manufacturing an integrated circuit, the method comprising the steps of a) depositing a first circuit and a second circuit on a die; b) testing the first and second circuits; c) when one of the first and second circuits fails the test, cutting the die to separate either the first circuit or the second circuit that passed the testing.
Claim 24
Independent Claim
61 words
A method for manufacturing an integrated circuit, the method comprising the steps of a) depositing a first circuit and a second circuit on a die; b) testing the first and second circuits; c) when one of the first and second circuits fails the test, cutting the die to separate either the first circuit or the second circuit that passed the testing.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 2002-09-20 | 2003-03-22 | 2003-09-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 2006-09-20 | 2007-03-22 | 2007-09-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 2010-09-20 | 2011-03-22 | 2011-09-21 | $7700.00 | Window Closed / Lapsed |