Patent US5914519A successfully refreshed from Google Patents.
← Back to Patent Explorer
US5914519A Expired / Lapsed US ⏱️ 0.0 years remaining

Air-gap spacer of a metal-oxide-semiconductor device

Assignee: United Microelectronics Corp
•
Filing: 1998-01-20
•
Granted: 1999-06-22
•
Expires: 2018-01-20
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract An air-gap spacer of a metal-oxide-semiconductor device comprises a spacer and a cross-sectional L-shaped air-gap. The spacer is adjacent to a sidewall of the gate electrode but not directly contacts to the gate electrode. The cross-sectional L-shaped air-gap is located between the spacer and the gate electrode and between the spacer and the substrate so that the spacer is separated from the gate electrode and the spacer is partially separated from the substrate.

Inventors

  • 👤 Jih-Wen Chou
  • 👤 Tony Lin

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-30 19:24
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/021; H10D30/0223; H10D30/0227; H10D30/0229; H10D30/60; H10D30/601; H10D64/00; H10D64/60; H10D64/66; H10D64/671; H10D64/675; H10D64/679

Claims Analysis

Total Claims: 4
Claim 1
Independent Claim 106 words
An air-gap spacer of a metal-oxide-semiconductor device, wherein the metal-oxide-semiconductor device is formed on a substrate and includes gate electrode on the substrate, at least a lightly doped region adjacent to the gate electrode and in the substrate and a source/drain region in the substrate, the air-gap spacer comprising: a spacer adjacent to a sidewall of the gate electrode but not directly contacting to the gate electrode; and a cross-sectional L-shaped air gap between the spacer and the gate electrode and between the spacer and the substrate so that the spacer is separated from the gate electrode and the spacer is partially separated from the substrate.
Claim 2
Dependent Claim 106 words
An air-gap spacer of a metal-oxide-semiconductor device, wherein the metal-oxide-semiconductor device is formed on a substrate and includes gate electrode on the substrate, at least a lightly doped region adjacent to the gate electrode and in the substrate and a source/drain region in the substrate, the air-gap spacer comprising: a spacer adjacent to a sidewall of the gate electrode but not directly contacting to the gate electrode; and a cross-sectional L-shaped air gap between the spacer and the gate electrode and between the spacer and the substrate so that the spacer is separated from the gate electrode and the spacer is partially separated from the substrate.
Claim 3
Dependent Claim 26 words
A air-gap spacer as claimed in claim 1, further comprising an extended lightly doped region adjacent to the lightly doped region, extending towards the gate electrode.
Claim 4
Dependent Claim 21 words
A air-gap spacer as claimed in claim 2, wherein the extended lightly doped region is shallower than the lightly doped region.

References Cited (Backward Citations)

US5770507A Cited
US5736446A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 2002-06-21 2002-12-21 2003-06-22 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 2006-06-21 2006-12-21 2007-06-22 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 2010-06-21 2010-12-21 2011-06-22 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag