Modular design for an IC testing burn-in oven

Claim 2

A modularly designed burn-in oven, comprising: an oven chamber; an electrical components chamber; an insulated wall separating said oven chamber from said components chamber; at least one DUT board in said oven chamber, said DUT board having first and second ends and an electrical connector at said first end; a slot board in said components chamber, said slot board having first and second ends, a first electrical connection on said first end, and a second electrical connection on said second end, said slot board positioned so that said first electrical connection fits through said insulated wall and couples to said electrical connector of said DUT board; a direct current (DC) to DC power converter on said slot board for receiving DC power from a power supply and lowering a voltage level and providing appropriate amperage for digital circuitry on said DUT board; and a seal positioned between said oven chamber and said components chamber so as to pressure fit said electrical connection of said slot board to said DUT board.

Claim 3

The burn-in oven of claim 1, further comprising: at least one zone board vertical and perpendicular to said slot board and said DUT board, said zone board having: an electrical coupling on a back side of said zone board for coupling to said second electrical connection of said slot board; and a central processing unit coupled to a front side of said zone board, and a plurality of integrated circuits on said front side.

Claim 4

The burn-in oven of claim 2, further comprising: a power bar parallel with said zone board; first and second electrical connections, said first electrical connections receiving power from a power supply and said second electrical connections providing power to said zone board, said first and second electrical connections electrically connected through said power bar.

Claim 5

The burn-in oven of claim 3, further comprising first and second sower supplies.

Claim 6

The burn-in oven of claim 4 wherein: a) said first power supply supplies a first voltage and a first amperage; b) said second power supply supplies a second voltage and a second amperage, said second voltage being lower than said first voltage and said second amperage being higher than said first amperage; c) said DC to DC power converter receives said first voltage and amperage, converts said first voltage and amperage to a third voltage and amperage, said third voltage being lower than said first voltage and said third amperage being higher than said first amperage.

Claim 7

A modular semiconductor component testing apparatus, comprising: a) an environmental chamber; b) a circuitry chamber separated from said environmental chamber by an insulated wall; c) a power supply chamber; d) a direct current (DC) power supply in said power supply chamber for supplying a first voltage, first amperage power signal; e) a power bar connected to said power supply and receiving said power signal therethrough; f) a zone board electrically connected to said DC power supply through said power bar and receiving said power signal from said power bar; g) a slot board housed in said circuitry chamber electrically connected to said zone board, said slot board receiving said power signal from said zone board; h) a DC to DC power converter on said slot board for converting said power signal, said DC to DC power converter lowering said first voltage to a second voltage and raising said first amperage to a second amperage; i) a device under test (DUT) board housed in said environmental chamber and connected through said insulated wall to said slot board and receiving said second voltage and amperage from said slot board.

Claim 8

A modular semiconductor component testing apparatus, comprising: a) an environmental chamber; b) a circuitry chamber separated from said environmental chamber by an insulated wall; c) a power supply chamber; d) a direct current (DC) power supply in said power supply chamber for supplying a first voltage, first amperage power signal; e) a power bar connected to said power supply and receiving said power signal therethrough; f) a zone board electrically connected to said DC power supply through said power bar and receiving said power signal from said power bar; g) a slot board housed in said circuitry chamber electrically connected to said zone board, said slot board receiving said power signal from said zone board; h) a DC to DC power converter on said slot board for converting said power signal, said DC to DC power converter lowering said first voltage to a second voltage and raising said first amperage to a second amperage; i) a device under test (DUT) board housed in said environmental chamber and connected through said insulated wall to said slot board and receiving said second voltage and amperage from said slot board.

Claim 9

The testing apparatus of claim 6 further comprising: a) a first power supply for powering said device under test board; b) a second power supply for powering circuitry on said zone board and said slot board.

Claim 10

The testing apparatus of claim 7 wherein said first power supply provides 300 volts, and said second power supply provides 15 volts and 5 volts.

Claim 11

The testing apparatus of claim 6 wherein said environmental chamber can be heated to burn-in devices on said DUT board.

Claim 12

The testing apparatus of claim 6 wherein said environmental chamber can be heated and cooled.

Claim 13

A modular semiconductor component testing apparatus, comprising: a) a direct current (DC) power supply for providing a power signal having a first voltage and a first amperage; b) a slot board having a connector for electrical connection with a device under test (DUT) board, said slot board receiving said power signal from said power supply; c) a DC to DC power converter for reducing said first voltage to a second voltage and increasing said first amperage to a second amperage; d) a DUT board for receiving a plurality of semiconductor components, said DUT board connected to said connector and receiving said second voltage and said second amperage from said DC to DC converter.

Claim 14

A modular semiconductor component testing apparatus, comprising: a) a direct current (DC) power supply for providing a power signal having a first voltage and a first amperage; b) a slot board having a connector for electrical connection with a device under test (DUT) board, said slot board receiving said power signal from said power supply; c) a DC to DC power converter for reducing said first voltage to a second voltage and increasing said first amperage to a second amperage; d) a DUT board for receiving a plurality of semiconductor components, said DUT board connected to said connector and receiving said second voltage and said second amperage from said DC to DC converter.

Claim 15

The apparatus of claim 11 wherein said slot board comprises said DC to DC converter.

Claim 16

The apparatus of claim 11 wherein said first voltage is 300 volts and said second voltage is 5 volts.

Claim 17

The apparatus of claim 11 wherein said power supply is a first power supply, further comprising a second power supply for powering circuitry on said slot board.

Claim 18

The apparatus of claim 14 wherein said first power supply provides a 300 volt signal and said second power supply provides a 5 volt signal.

Claim 19

A modular semiconductor component testing apparatus for testing integrated circuit devices, comprising: a) an environmental chamber; b) a circuitry chamber separated from said environmental chamber by an insulated wall; c) a power supply chamber; d) a first direct current (DC) power supply in said power supply chamber for supplying a 300 volt, low amperage power signal; e) a second DC power supply in said power supply chamber for supplying a 15 volt power signal and a volt power signal; f) a power bar connected to said first and second power supplies and receiving said 300, 15, and 5 volt power signals therefrom; g) a zone board having circuitry thereon, said zone board electrically connected to said first and second DC power supplies through said power bar and receiving said power signals from said power bar, said second power supply powering said circuitry on said zone board; h) a slot board having circuitry thereon housed in said circuitry chamber electrically connected to said zone board, said slot board receiving said power signals from said zone board, said second power supply powering said circuitry on said slot board; i) a DC to DC power converter on said slot board for converting said 300 volt, low amperage power signal from said first power supply to a 5 volt 20 amp signal; j) a device under test (DUT) board housed in said environmental chamber and connected through said insulated wall to said slot board and receiving said 5 volt 20 amp signal from said slot board.

Claim 20

A modular semiconductor component testing apparatus for testing integrated circuit devices, comprising: a) an environmental chamber; b) a circuitry chamber separated from said environmental chamber by an insulated wall; c) a power supply chamber; d) a first direct current (DC) power supply in said power supply chamber for supplying a 300 volt, low amperage power signal; e) a second DC power supply in said power supply chamber for supplying a 15 volt power signal and a volt power signal; f) a power bar connected to said first and second power supplies and receiving said 300, 15, and 5 volt power signals therefrom; g) a zone board having circuitry thereon, said zone board electrically connected to said first and second DC power supplies through said power bar and receiving said power signals from said power bar, said second power supply powering said circuitry on said zone board; h) a slot board having circuitry thereon housed in said circuitry chamber electrically connected to said zone board, said slot board receiving said power signals from said zone board, said second power supply powering said circuitry on said slot board; i) a DC to DC power converter on said slot board for converting said 300 volt, low amperage power signal from said first power supply to a 5 volt 20 amp signal; j) a device under test (DUT) board housed in said environmental chamber and connected through said insulated wall to said slot board and receiving said 5 volt 20 amp signal from said slot board.